Abstract: The conventional white-light interferometer, confocal microscope, and ellipsometer are integrated as one device set in a functional sense, and the geometrical parameters conventionally measured may be deduced on the integrated device. Thus, the advantages and efficacies of equipment cost saving, on-line measuring, rapid monitoring, reduced manufacturing time, and reduced possibility of object damage during the manufacturing process may be secured, compared with the prior art.

Abstract: There is provided an optical accelerometer including a first substrate, a second substrate, a spacer and a processing unit. The first substrate includes a frame, a movable member and at least one elastic member. Periodic slots are formed on the movable member along at least one direction to be served as a diffraction grating. The elastic member is connected between the frame and the movable member. The second substrate includes at least one sensing unit configured to detect a diffraction pattern formed by the diffraction grating. The spacer is disposed between the first substrate and the second substrate to define a predetermined height. The processing unit is coupled to the sensing unit and configured to calculate a 3D acceleration according to the diffraction pattern.

Abstract: A connector of connecting a light sensor and a substrate is utilized for rotating the light sensor so that the light-receiving direction of the light sensor is parallel with the substrate. When the connector is utilized in an optical touch system, the light sensor can be disposed on the substrate of the optical touch system by means of general manufacturing facilities of flat display panels. Meanwhile, the light-receiving direction of the light sensor is parallel with the substrate of the optical touch system.

Abstract: The present invention provides a multi-axial acceleration sensor and a method of manufacturing the multi-axial acceleration sensor. The method includes: providing a substrate having a lead plane; disposing a first sensor chip onto the lead plane, wherein a wire bonding plane of the first sensor chip is perpendicular to the lead plane; and disposing a second sensor chip onto the lead plane, wherein a wire bonding plane of the second sensor chip is in parallel with the lead plane.

Abstract: An image correlation for images having speckle pattern is evaluated. Modulation transfer function (MTF) curves of speckle-pattern images captured at different times are figured out. Whether a correlation value between the MTF curves meets a threshold is checked. If the correlation value is smaller than the threshold, speckle-pattern images are re-selected for re-figuring out the MTF curves and the correlation value. Thus, error of strain and displacement for digital image correlation owing to blurring images of the on-moving target object is figured out; calculation time of the digital image correlation is reduced; and accuracy on measuring physical parameters of the target object before and after movement is improved for digital image correlation.

Abstract: A device for real-time thickness inspection is provided. An optical interferometric technique is used. Measurement requirements in rapid online thickness inspection can be satisfied. An object is measured in a non-contact and non-destructive way. For measuring, an optical spherical wavefront is radiated on the object in an oblique angle. The interference fringe pattern (IFP) thus imaged on a screen is directly related to the thickness distribution of the object. The phase difference on the same horizontal cross section in the IFP monotonically decreases from the light source side to the other side. Accordingly, phase unwrapping can be effectively performed without using phase shift. The present invention achieves rapid on-line thickness inspection through the optical path of interference without using optical lens groups and special optical elements.

Abstract: A system of computing surface reconstruction, in-plane and out-of-plane displacements and strain distribution utilizes the optical switching element to switch the reference beam to analyze the images of the test object before and after deformation, to measure the topography, in-plane and out-of-plane displacements and surface two-dimensional strain distribution on the test surface of the test object, and thus to increase the measurement range on the test surface of the test object with the use of image registration. Thereby, the complexity and error of scanning the test object can be reduced. Such a system need not to move the image capturing device or test object to generate relative displacement for reaching the measurement effect of the test surface of the test object in three-dimensional coordinates.

Abstract: An image correlation for images having speckle pattern is evaluated. Modulation transfer function (MTF) curves of speckle-pattern images captured at different times are figured out. Whether a correlation value between the MTF curves meets a threshold is checked. If the correlation value is smaller than the threshold, speckle-pattern images are re-selected for re-figuring out the MTF curves and the correlation value. Thus, error of strain and displacement for digital image correlation owing to blurring images of the on-moving target object is figured out; calculation time of the digital image correlation is reduced; and accuracy on measuring physical parameters of the target object before and after movement is improved for digital image correlation.

Abstract: A connector of connecting a light sensor and a substrate is utilized for rotating the light sensor so that the light-receiving direction of the light sensor is parallel with the substrate. When the connector is utilized in an optical touch system, the light sensor can be disposed on the substrate of the optical touch system by means of general manufacturing facilities of flat display panels. Meanwhile, the light-receiving direction of the light sensor is parallel with the substrate of the optical touch system.

Abstract: The present invention is directed to a system and method for on-line real-time measuring the surface topography and out-of-plane deformation by using phase-shifting shadow moiré method. Digital Phase-Shifting Shadow Moiré Method is applied to a system, which receives the reflected images from the surface of transparent or non-transparent plate projected under a light beam passing through a grating. Next, by image correction program, the skewed interference fringe pattern is recovered to the image as if the image acquisition equipment is placed normal to the surface. Furthermore, the received images are processed with Phase-Shifting to show the surface topography of the plate.

Abstract: A connector of connecting a light sensor and a substrate is utilized for rotating the light sensor so that the light-receiving direction of the light sensor is parallel with the substrate. When the connector is utilized in an optical touch system, the light sensor can be disposed on the substrate of the optical touch system by means of general manufacturing facilities of flat display panels. Meanwhile, the light-receiving direction of the light sensor is parallel with the substrate of the optical touch system.

Abstract: An image sensor module is installed in a sensing device, and is used to detect a reflected light of an object. The image sensor module includes a carrier, a light sensing element, and a package body. The light sensing element is disposed on a substrate. The carrier is disposed on the substrate in the sensing device. The light sensing element is installed in the carrier, and is electrically connected with the substrate via multiple solder balls. The package body is installed on the carrier, and has a reflecting and diverting element, which is located between the light sensing element and the object and is used for reflecting reflected light of the object and diverting the reflected light towards a receiving direction of the light sensing element. The light sensing element receives the reflected light and generates a corresponding sensing signal.

Abstract: The present invention provides a multi-axial acceleration sensor and a method of manufacturing the multi-axial acceleration sensor. The method includes: providing a substrate having a lead plane; disposing a first sensor chip onto the lead plane, wherein a wire bonding plane of the first sensor chip is perpendicular to the lead plane; and disposing a second sensor chip onto the lead plane, wherein a wire bonding plane of the second sensor chip is in parallel with the lead plane.

Abstract: The present disclosure uses at least three cameras to monitor even a large-scale area. Displacement and strain are measured in a fast, convenient and effective way. The present disclosure has advantages on whole field, far distance and convenience.

Abstract: An apparatus for quantifying unknown stress and residual stress of a material to be tested, the material being a birefringent or temporary birefringent material, which includes a light source, a polarizer in front of the light source for converting a light beam from the light source into a beam with linear polarization, a first quarter-wave plate in front of the polarizer for generating circular polarization, a standard material, a second quarter-wave plate, an analyzer, a loading unit, a spectrometer for obtaining transmissivity spectrum of the standard material under the wavelength of the light source and a detecting module connected to the spectrometer to have the transmissivity spectrum of the material to be tested and consequently a stress quantifying formula for the standard material.

Abstract: A multi-image capture device capturing images by means of circular motion controls the shift movement, along a semi-circular measuring rod, of a moving mechanism by a location control device. Furthermore, a rotary control device is used to control the positioning and image-capturing angle of a second image capture device fixed on the rotary mechanism. Thereby, a first image capture device and the second image capture device are of a co-circle configuration where the optical axis of the first image capture device and the second image capture device overlap to form a center of the co-circle. Such a configuration can broaden the visual range of the image capture device, and allows quick calibration of the image capture device according to positioning of shift movement and image-capturing angles.

Abstract: A system of computing surface reconstruction, in-plane and out-of-plane displacements and strain distribution utilizes the optical switching element to switch the reference beam to analyze the images of the test object before and after deformation, to measure the topography, in-plane and out-of-plane displacements and surface two-dimensional strain distribution on the test surface of the test object, and thus to increase the measurement range on the test surface of the test object with the use of image registration. Thereby, the complexity and error of scanning the test object can be reduced. Such a system need not to move the image capturing device or test object to generate relative displacement for reaching the measurement effect of the test surface of the test object in three-dimensional coordinates.

Abstract: There is provided an optical accelerometer including a first substrate, a second substrate, a spacer and a processing unit. The first substrate includes a frame, a movable member and at least one elastic member. Periodic slots are formed on the movable member along at least one direction to be served as a diffraction grating. The elastic member is connected between the frame and the movable member. The second substrate includes at least one sensing unit configured to detect a diffraction pattern formed by the diffraction grating. The spacer is disposed between the first substrate and the second substrate to define a predetermined height. The processing unit is coupled to the sensing unit and configured to calculate a 3D acceleration according to the diffraction pattern.

Abstract: A power supply mode switching circuit and method switch between power supply modes of a power supply device dynamically based on an operating current required for operation of an electronic product, such that the power supply device supplies a supplying current corresponding to the operating current. The circuit comprises a sampling unit, an amplifying unit, a comparing unit. The circuit is disposed between the power supply device and the electronic product, samples the supplying current from the power supply device with the sampling unit, and converts the supplying current into a sampling voltage. The amplifying unit converts the sampling voltage into an amplifying voltage by voltage amplification and outputs the amplifying voltage to the comparing unit. After comparing the voltage level of a reference voltage and that of the amplifying voltage, the comparing unit generates a control signal for switching the power supple modes of the power supply device.

Abstract: An apparatus for quantifying residual stress of a birefringent material comprises a light source generating light; a vertical polarizer converting a beam of light into a beam with vertical polarization; a standard material being mounted in front of the vertical polarizer; a horizontal polarizer converting a beam of light into a beam with horizontal polarization; an applied force unit applying different forces to the standard material; a spectrometer being mounted in front of the horizontal polarizer and recording intensity of light passing through the horizontal polarizer and transmittance of the standard material and a processing module being connected to the spectrometer, deriving a stress formula from the applied forces and transmittances of the standard material and obtaining a stress distribution of the birefringent material. A method for quantifying residual stress of a birefringent material is also disclosed.