Abstract: An illumination arrangement for a light sheet microscope, in which a sample is illuminated using an illumination light beam that is formed as a light sheet in a region of the sample, includes an illumination objective, a tube lens and astigmatic optics. The astigmatic optics are designed in such a way and arranged between the tube lens and the illumination objective in such a way that the illumination light beam exiting from the illumination objective is focused both in a sagittal plane and in a meridional plane.

Abstract: A method for examining a sample includes illuminating the sample in an illumination plane along an illumination strip by an illuminating light beam which propagates along the illumination strip. The illumination strip is projected into a detection plane by detection light originating from the illumination strip being focused in the detection plane. The detection light is detected by a detector. The detector is formed as a slit detector, and the direction of a slit width of the slit detector is oriented at an angle different from zero degrees with respect to the direction of a width of an image of the illumination strip projected into the detection plane.

Abstract: A microscopy arrangement includes a holding apparatus having an instrument platform, a holding element which is rigidly connected thereto and to a microscope and a support element configured to support the instrument platform on a main platform at a distance therefrom. In a vertical projection, the holding apparatus at least does not completely overlap with the microscope supported by the holding element. The support element has a changeable height such that the instrument platform is positionable at a changeable vertical distance from the main platform and/or a height-changeable microscope stage places an object plane that is defined by the microscope stage at a changeable vertical distance such that a vertical extent of an object region is changeable. The laser beams remain in a fixed relationship with one another in time and/or space, even in the case of a change in the vertical extent of the object region.

Abstract: A microscope system includes a light sheet microscopy functional unit and at least one further light microscopy functional unit. The light sheet microscopy functional unit has an illumination objective which is formed by a first objective and a detection objective which is formed by a separate second objective. The at least one further light microscopy functional unit comprises a detection objective that is formed by the second objective.

Abstract: A method for examining a sample includes illuminating the sample in an illumination plane along an illumination strip by an illuminating light beam which propagates along the illumination strip. The illumination strip is projected into a detection plane by detection light originating from the illumination strip being focused in the detection plane. The detection light is detected by a detector. The detector is formed as a slit detector, and the direction of a slit width of the slit detector is oriented at an angle different from zero degrees with respect to the direction of a longitudinal extent of an image of the illumination strip projected into the detection plane.

Abstract: A lightsheet microscope includes a detection objective for imaging a target region of a sample located in a focal plane, and an illumination objective for focusing an illumination light beam. The illumination objective and the detection objective define a sample chamber, in which a sample holder having a carrier surface is arranged. A light deflection device has a deflection surface arranged laterally offset in relation to the optical axis of the detection objective in the sample chamber which deflects the illumination light beam through the illumination objective in a direction perpendicular to the optical axis such that the deflected illumination light beam forms a lightsheet-type illumination light distribution. The light deflection device has a collision section facing toward the carrier surface. The carrier surface is inclined relative to the focal plane at a predetermined angle such that a part of the carrier surface is arranged in the focal plane.

Abstract: A method for single plane illumination microscopy (SPIM) analysis of a sample includes simultaneously illuminating multiple sample layers by a single sheet of light. Detection light emanating from the individual sample layers is detected at different times and/or at different positions in a detection beam path. The detection beam path is branched using beam splitters and an effective refractive power of the individual beam splitters is zero.

Abstract: The invention relates to a method for microscopic investigation of a plurality of samples.

Abstract: The invention relates to a method for examining a sample. The method is distinguished by the fact that the sample is illuminated with an illumination light beam in each case simultaneously in a plurality of mutually different sample planes in each case along an illumination line, and wherein each sample region illuminated along an illumination line is scanned in each case with a dedicated detection PSF and the detection light emanating from the illuminated sample regions is detected simultaneously and spatially separately from one another. The invention additionally relates to a microscope, in particular for performing such a method.

Abstract: The invention relates to a method for tomographic investigation of a sample, in which method a sample is illuminated with an illuminating light bundle and in which a transmitted light bundle that contains the light of the illuminating light bundle transmitted through the sample is detected with a transmission detector. The invention further relates to an apparatus for tomographic investigation of a sample. Provision is made that the illuminating light bundle and the transmitted light bundle pass in opposite propagation directions through the same objective.

Abstract: An illumination apparatus for a microscope, for producing a de-excitation or switching light distribution, includes a light source configured to produce a primary illumination light beam and a beam splitter configured to divide the primary illumination light beam into two partial illumination light beams. An illumination objective is configured to focus the partial illumination light beams onto and/or into a sample such that the partial illumination light beams extend, spatially separated from one another, through an entry pupil of the illumination objective and are spatially superposed on and/or in the sample after passing through the illumination objective. A phase influencer is configured to cause a relative phase offset of the partial illumination light beams with respect to one another in such a way that the partial illumination light beams in the entry pupil of the illumination objective have a phase offset of ?.

Abstract: A light sheet microscope or a confocal microscope includes illumination optics configured to transmit light of at least two wavelengths from at least one light source, along respective wavelength-dependent beam paths, from an illumination side of the illumination optics to a specimen side of the illumination optics. A lateral chromatic correction system comprising at least one optical lateral chromatic correction element is configured such that the beam paths of the at least two different wavelengths have, at a specimen-side output of the lateral chromatic correction element, an offset parallel to each other and/or are inclined relative to each other in relation to the illumination side, which, on the specimen side of the illumination optics, results in an offset of the foci of the at least two wavelengths transverse to an optical axis of the illumination optics.

Abstract: A SPIM-microscope (Selective Plane Imaging Microscopy) and a method of operating the same having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. An electronic zoom is provided that is adapted to change the scanning length in the x-direction independently of a focal length of the illumination light beam and a size of the light sheet in the y-direction and in the z-direction, wherein the number of image pixels in x-direction is maintained unchanged by the electronic zoom independently of the scanning length in x-direction that has been selected.

Abstract: A method for the examination of a sample includes illuminating the sample in a sample plane along a sample line with an illuminating light beam. The sample is acted upon by a depletion or switching light beam, which overlaps in the sample plane in an overlap region with the illuminating light beam. Part of fluorescent light emanating from the sample plane is detected as detection light originating from a first subregion of the overlap region, in which the probability of an interaction of the sample molecules with the depletion or switching light beam is greater than 90%, and/or originating from a second subregion which is at least partially surrounded by the first sub-region and/or in which the depletion or switching light beam has a zero point, while at the same time the fluorescent light originating from outside the first subregion and the second subregion is suppressed and not detected.

Abstract: A method for analyzing a microscopic sample with a microscope includes illuminating at least a sub-region of the microscopic sample by illumination light. Detection light emanating from the microscopic sample is guided on a detection beam path, which includes at least one focusing optical element and which has a plurality of detection beam path branches, each with at least one detector element. The detector elements are parts of the same surface detector. By art adjusting element in at least a first one of the detection beam path branches, an optical path length of the first detection beam path branch is adjusted in such a way that the portion of the detection light guided on the first detection beam path branch is focused on the detector element of the first detection beam path branch.

Abstract: A SPIM-microscope (Selective Plane Imaging Microscopy) having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. By an illumination optics having a zoom optics that is provided in the beam path of the illumination light beam the focal length of the illumination light beam can be varied.

Abstract: A method for microscopic examination of a specimen includes bringing the specimen into contact with an optically transparent medium that has a higher refractive index than the specimen. An illumination light bundle is generated and directed through an illumination objective that focuses the illumination light bundle. The illumination light bundle that has passed through the illumination objective in the direction of the specimen that is to be examined is deflected using a deflector arranged on a detection objective in such a way that the illumination light bundle strikes a boundary surface between the optically transparent medium and the specimen, where the illumination light bundle is totally reflected for purposes of evanescently illuminating the specimen. Fluorescent light that is emitted by the specimen and that passes through the detection objective is detected.

Abstract: A microscope for imaging a sample includes an illumination unit for emitting illumination light to the sample; a detector for capturing a detection light originating from the sample; an optical system for focusing the illumination light onto the sample and focusing the detection light onto the detector; and a scanning unit for scanning the sample using the illumination light. The illumination unit emits the illumination light as separate illumination light beams which can be focused on spatially mutually separated, strip-like sample regions simultaneously. The detector captures the detection light in the form of separate detection light beams originating from the sample regions simultaneously and in a spatially mutually separated manner. The sample regions are in sample planes, and the detector having sub-detectors, which are each assigned to a sample plane and capture a detection light beam that originates from a respective sample plane.

Abstract: The invention relates to a method for examining a sample. The method is distinguished by the fact that the sample is illuminated with an illumination light beam in each case simultaneously in a plurality of mutually different sample planes in each case along an illumination line, and wherein each sample region illuminated along an illumination line is scanned in each case with a dedicated detection PSF and the detection light emanating from the illuminated sample regions is detected simultaneously and spatially separately from one another. The invention additionally relates to a microscope, in particular for performing such a method.

Abstract: A method for examining a sample by light sheet microscopy includes illuminating a sample surface located in an illumination plane by a light sheet propagating in the illumination plane. A position of a light sheet focal point of the light sheet in the illumination plane is moved by changing an optical length of a light path of illumination light forming the light sheet. Detection light emanating from the illumination plane is detected.