Abstract: A selective/single plane illumination microscopy (SPIM) arrangement having an illumination device (1) for generating a light sheet (3) illuminating a sample (2); and a detection device (5), comprising a detector (4), for detected light proceeding from the sample (2), is configured and refined in the interest of efficient and low-impact sample investigation with physically simple means in such a way that the detection device (5) comprises a device (6) for allocating different focal planes of the light sheet (3) to different regions (7) of the detector (4).

Abstract: A method for examining a sample in light sheet fluorescence microscopy includes generating an illumination light beam using a light source. The illumination light beam is spatially split into at least two partial illumination light beams using a splitter. The partial illumination light beams are guided through an illumination objective shared by the partial illumination light beams. After the partial illumination light beams have passed through the illumination objective, at least one of the partial illumination light beams is deflected using at least one deflector such that the partial illumination light beams interfere with one another in an illumination plane so as to generate an illumination pattern in the illumination plane. An image of a sample region illuminated by the illumination pattern is produced, wherein detection light that emanates from the sample region reaches a position-sensitive detector through a detection objective.

Abstract: An illumination arrangement for a light sheet microscope, in which a sample is illuminated using an illumination light beam that is formed as a light sheet in a region of the sample, includes an illumination objective, a tube lens and astigmatic optics. The astigmatic optics are designed in such a way and arranged between the tube lens and the illumination objective in such a way that the illumination light beam exiting from the illumination objective is focused both in a sagittal plane and in a meridional plane.

Abstract: A light sheet microscope for simultaneous imaging of several object planes illuminated by a light sheet includes a camera and a detection optic defining a detection light beam between the light sheet and the camera. The object planes are arranged around the focal plane of the detection optic. The detection optic can include a microlens array.

Abstract: A method, in which a sample is manipulated with manipulation light, includes imaging the sample using a single plane illumination microscopy SPIM technique under illumination with illumination light being an illumination light sheet of fluorescent excitation light. Both the manipulation light and the illumination light are focused by an objective brought to an objective working position. Either the manipulation light or the illumination light are diverted after passing through the objective by use of a diverting device to propagate the manipulation light or the illumination light at an angle different from zero degrees with respect to an optical axis of the objective.

Abstract: A method for analyzing a microscopic sample with a microscope includes illuminating at least a sub-region of the microscopic sample by illumination light. Detection light emanating from the microscopic sample is guided on a detection beam path, which includes at least one focusing optical element and which has a plurality of detection beam path branches, each with at least one detector element. The detector elements are parts of the same surface detector. By art adjusting element in at least a first one of the detection beam path branches, an optical path length of the first detection beam path branch is adjusted in such a way that the portion of the detection light guided on the first detection beam path branch is focused on the detector element of the first detection beam path branch.

Abstract: A method for single plane illumination microscopy (SPIM) analysis of a sample includes simultaneously illuminating multiple sample layers by a single sheet of light. Detection light emanating from the individual sample layers is detected at different times and/or at different positions in a detection beam path. The detection beam path is branched using beam splitters and an effective refractive power of the individual beam splitters is zero.

Abstract: A method for examining a sample includes illuminating the sample in an illumination plane along an illumination strip by an illuminating light beam which propagates along the illumination strip. The illumination strip is projected into a detection plane by detection light originating from the illumination strip being focused in the detection plane. The detection light is detected by a detector. The detector is formed as a slit detector, and the direction of a slit width of the slit detector is oriented at an angle different from zero degrees with respect to the direction of a longitudinal extent of an image of the illumination strip projected into the detection plane.

Abstract: An arrangement for use in illuminating a sample in SPIM microscopy includes an illumination objective configured to receive and focus a light strip or a quasi-light strip. The quasi-light strip is made up of a light bundle continuously moved back and forth in a light-strip plane. A deflection apparatus is configured to deflect the light strip or the quasi-light strip, after the light strip or the quasi-light strip has passed through the illumination objective, in such a way that the light strip or the quasi-light strip propagates at an angle different from zero degrees with respect to an optical axis of the illumination objective. The illumination objective and the deflection apparatus are arranged movably relative to one another.

Abstract: A method for microscopic examination of a specimen includes bringing the specimen into contact with an optically transparent medium that has a higher refractive index than the specimen. An illumination light bundle is generated and directed through an illumination objective that focuses the illumination light bundle. The illumination light bundle that has passed through the illumination objective in the direction of the specimen that is to be examined is deflected using a deflector arranged on a detection objective in such a way that the illumination light bundle strikes a boundary surface between the optically transparent medium and the specimen, where the illumination light bundle is totally reflected for purposes of evanescently illuminating the specimen. Fluorescent light that is emitted by the specimen and that passes through the detection objective is detected.

Abstract: The invention relates to a method for tomographic investigation of a sample (9), in which method a sample (9) is illuminated with an illuminating light bundle (3) and in which a transmitted light bundle (10) that contains the light of the illuminating light bundle (3) transmitted through the sample (9) is detected with a transmission detector (13). The invention further relates to an apparatus for tomographic investigation of a sample (9). Provision is made that the illuminating light bundle (3) and the transmitted light bundle (10) pass in opposite propagation directions through the same objective (7).

Abstract: The invention relates to a method for microscopic investigation of a plurality of samples.

Abstract: A selective/single plane illumination microscopy (SPIM) arrangement having an illumination device (1) for generating a light sheet (3) illuminating a sample (2); and a detection device (5), comprising a detector (4), for detected light proceeding from the sample (2), is configured and refined in the interest of efficient and low-impact sample investigation with physically simple means in such a way that the detection device (5) comprises a device (6) for allocating different focal planes of the light sheet (3) to different regions (7) of the detector (4).

Abstract: The invention relates to a method in which a sample is manipulated with manipulation light, and in which the sample is imaged by means of the SPIM technique under illumination with illumination light, in particular excitation light for fluorescence excitation, in the form of an illumination light sheet. The method is notable for the fact that both the manipulation light and the illumination light are focused by the same objective that is arranged in an objective working position, or by different objectives that are brought successively into an objective working position; and that the manipulation light and/or the illumination light, after passing through the objective, is diverted by means of a diverting device in such a way that it propagates at an angle different from zero degrees with respect to the optical axis of the objective.

Abstract: A SPIM-microscope (Selective Plane Imaging Microscopy) having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. By an illumination optics having a zoom optics that is provided in the beam path of the illumination light beam the focal length of the illumination light beam can be varied.

Abstract: A STED-SPIM-microscope (Selective Plane Imaging Microscopy) having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. By optionally turning on a STED deactivation light beam the light sheet can optionally be made thinner and therefore the optical resolution can be increased.

Abstract: A method for illuminating at least one sample in SPIM microscopy includes generating a light beam and forming a light strip from the light beam using an optical device that interacts with the light beam. The light strip is passed strip through at least one objective having optics configured to deliver detection light emanating from the sample directly or indirectly to a detector, with the objective optics interacting with the light strip. The light strip is deflected using a light-redirecting device downstream of the objective optics so as to propagate the light strip, after deflection, at an angle other than zero degrees with respect to an optical axis of the objective in order to illuminate the sample.

Abstract: A SPIM-microscope (Selective Plane Imaging Microscopy) having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. By an illumination optics having a zoom optics that is provided in the beam path of the illumination light beam the focal length of the illumination light beam can be varied.

Abstract: A scanning microscope is described, having an illumination unit for emitting an illumination light beam, an objective for generating an elongated illumination focus in a specimen to be imaged, and a scanning apparatus for moving the illumination focus over a target region of the specimen to be illuminated by modifying the direction of incidence in which the illumination light beam is incident into an entrance pupil of the objective. The scanning apparatus directs the illumination light beam onto a sub-region of the entrance pupil offset from the pupil center in order to incline the illumination focus relative to the optical axis of the objective, and modifies the direction of incidence of the illumination light beam within that sub-region in order to move the illumination focus over the target region to be illuminated.

Abstract: An arrangement for use in illuminating a sample in SPIM microscopy includes an illumination objective configured to receive and focus a light strip or a quasi-light strip. The quasi-light strip is made up of a light bundle continuously moved back and forth in a light-strip plane. A deflection apparatus is configured to deflect the light strip or the quasi-light strip, after the light strip or the quasi-light strip has passed through the illumination objective, in such a way that the light strip or the quasi-light strip propagates at an angle different from zero degrees with respect to an optical axis of the illumination objective. The illumination objective and the deflection apparatus are arranged movably relative to one another.