Abstract: Asynchronous behavior of a circuit is modeled by modifying latches in a netlist to add an extra port to the latches, e.g., a single-port latch is transformed into a dual-port latch. Each input port has an enable line and a data input. The data input in the added port is a feedback line from the latch output, and the enable line in the added port is the logical NOR of all of the original enable lines. By adding this extra latch port in the higher-level model, it becomes possible to introduce assertion logic to ensure that one and only one latch port for a given latch is ever active during the same simulation cycle. The model can then be tested earlier in the design methodology prior to the availability of the post-synthesis netlist. The model can also be used in both simulation and formal or semi-formal verification.

Abstract: In response to receiving HDL file(s) that specify a plurality of hierarchically arranged design entities defining a design to be simulated and that specify an instrumentation entity for monitoring simulated operation of the design, an instrumented simulation executable model of the design is built. Building the model includes compiling the HDL file(s) specifying the plurality of hierarchically arranged design entities defining the design and instantiating at least one instance of each of the plurality of hierarchically arranged design entities, and further includes instantiating an instance of the instrumentation entity within an instance of a particular design entity among the plurality of design entities and, based upon a reference in an instrumentation statement in the one or more HDL files, logically attaching an input of the instance of the instrumentation entity to an input source within the design that is outside the scope of the particular design entity.

Abstract: A method, system and computer program product for modeling variables in subprograms of a HDL program. A subprogram is provided with an initial value of a variable of an element being modeled and the subprogram is stored in memory of a data processing system. In response to a subprogram call, a copy of the stored subprogram is provided to the requesting HDL program. During execution, the initial value of the variable in the provided copy of the subprogram may be modified by the HDL program, but the value retains unchanged in the stored subprogram.

Abstract: One embodiment relates to an integrated circuit formed on a semiconductor body having interconnect between source/drain regions of a first and second transistor. The interconnect includes a metal body arranged underneath the surface of the semiconductor body. A contact element establishes electrical contact between the metal body and the source/drain regions of the first and second transistor. The contact element extends along a connecting path between the source/drain regions of the first and second transistors. Other methods, devices, and systems are also disclosed.

Abstract: An integrated circuit arrangement contains an insulating region, which is part of a planar insulating layer, and a capacitor which contains: near and far electrode regions near and remote from the insulating region and a dielectric region. The capacitor and an active component are on the same side of the insulating layer, and the near electrode region and an active region of the component are planar and parallel to the insulating layer. The near electrode region is monocrystalline and contains multiple webs.

Abstract: According to a method of simulation processing, an instrumented simulation executable model of a design is built by compiling one or more hardware description language (HDL) files specifying one or more design entities within the design and one or more instrumentation entities and instantiating instances of the one or more instrumentation entities within instances of the one or more design entities. Operation of the design is then simulated utilizing the instrumented simulation executable model. Simulating operation includes each of multiple instantiations of the one or more instrumentation entities generating a respective external phase signal representing an occurrence of a particular phase of operation and instrumentation combining logic generating from external phase signals of the multiple instantiations of the one or more instrumentation entities an aggregate phase signal representing an occurrence of the particular phase.

Abstract: A semiconductor memory device comprises a plurality of memory cells, each memory cell having a respective transistor. The transistor comprises a transistor body of a first conductivity type, a drain area and a source area each having a second conductivity type, wherein said drain area and source area are embedded in the transistor body on a first surface of said transistor body, a gate structure having a gate dielectric layer and a gate electrode. Said gate structure is arranged between said drain area and said source area. An emitter area of said first conductivity type is provided wherein said emitter area is arranged on top of said drain area.

Abstract: Methods, data processing systems, and program products supporting the insertion of clone latches within a digital design are disclosed. According to one method, a parent latch within the digital design is specified in an HDL statement in one of the HDL files representing a digital design. In addition, a clone latch is specified within the digital design utilizing an HDL clone latch declaration. An HDL attribute-value pair is associated with the HDL clone latch declaration to indicate a relationship between the clone latch and the parent latch according to which the clone latch is automatically set to a same value as the parent latch when the parent latch is set. Thereafter, when a configuration compiler receives one or more design intermediate files containing the clone latch declaration, the configuration compiler creates at least one data structure in a configuration database representing the clone latch and the relationship between the clone latch and the parent latch.

Abstract: In at least one hardware definition language (HDL) file, at least one design entity containing a functional portion of a digital system is specified. The design entity logically contains first and second latches each having a respective plurality of different possible latch values. With one or more statements, a first Dial instance is associated with the first latch and a second Dial instance is associated with the second latch. A setting of the first Dial instance thus controls which of the plurality of different possible values is loaded in the first latch, and a setting of the second Dial instance controls which of the plurality of different possible values is loaded in the second latch. With a statement, a Register instance is concurrently associated with both the first and the second latches, such that a setting of the Register instance controls the latch values loaded in both the first and second latches.

Abstract: According to a method of simulation processing, one or more HDL source files describing a digital design including a plurality of hierarchically arranged design entities are received. The one or more HDL source files include one or more statements instantiating a plurality of print events within the plurality of hierarchically arranged design entities, where each print event has an associated message and at least one associated signal in the digital design. The one or more HDL source files are processed to obtain a simulation executable model including a data structure describing the plurality of print events defined for the simulation executable model and associating each of the plurality of print events with its respective associated signal.

Abstract: A method is disclosed of associating a mapping function with a configuration construct of a digital design defined by one or more hardware description language (HDL) files. According to the method, in the HDL files, a configuration latch is specified within a design entity forming at least a portion of the digital design. In addition, a Dial is specified that defines a relationship between each of a plurality of input values and a respective one of a plurality of different output values. The HDL files also include a statement that instantiates an instance of the Dial in association with the configuration latch such that a one-to-one correspondence exists between a value contained within the configuration latch and an input value of the instance of the Dial. The HDL files further include a statement associating the Dial with a mapping function that applies a selected transformation to values read from or written to the instance of the Dial.

Abstract: Mechanisms for accurately modeling an asynchronous interface using expanded logic elements are provided. With these mechanisms, the logic of an asynchronous interface is reduced to primitive logic elements. These primitive logic elements are expanded by the mechanisms of the present invention to take into consideration whether or not the primitive logic elements themselves may be experiencing a switching or glitch hazard and whether or not the inputs to the primitive logic elements may be based on a switching or glitch hazard from another primitive logic element in the asynchronous interface logic. These expanded logic elements are used in an integrated circuit design to replace the original primitive logic elements in the design. The asynchronous interface may then be simulated with the expanded logic elements providing outputs indicative of whether the actual data output of the expanded logic elements is deterministic or not.

Abstract: An integrated circuit including a vertical transistor and method of manufacturing. In one embodiment a vertical transistor is formed in a pillar of a semiconductor substrate. A buried conductive line is separated from the semiconductor substrate by a first insulating layer in a first portion and is electrically coupled to a buried source/drain region of the vertical transistor through a contact structure. A second insulating layer is arranged above and adjacent to the contact structure. At least one of the first and second insulating layers includes a dopant. A doped region is formed in the semiconductor substrate at an interface to the at least one insulating layer. The doped region has a dopant concentration higher than a substrate dopant concentration.

Abstract: According to a method of simulation processing, a collection of files including one or more HDL source files describing design entities collectively representing a digital design to be simulated is received. The HDL source file(s) include a statement specifying inclusion of an instrumentation entity not forming a portion of the digital design but enabling observation of its operation during simulation. The instrumentation entity includes sequential logic containing at least one storage element, where the instrumentation entity has an output signal indicative of occurrence of a simulation event. The collection of files is processed to obtain an instrumented simulation executable model. The processing includes instantiating at least one instance of each of the plurality of design entities and instantiating the instrumentation entity. The processing further includes instantiating external instrumentation logic, logically coupled to each instance of the instrumentation entity, to record occurrences of the event.

Abstract: An integrated circuit including a gate electrode is disclosed. One embodiment provides a transistor including a first source/drain electrode and a second source/drain electrode. A channel is arranged between the first and the second source/drain electrode in a semiconductor substrate. A gate electrode is arranged adjacent the channel layer and is electrically insulated from the channel layer. A semiconductor substrate electrode is provided on a rear side. The gate electrode encloses the channel layer at least two opposite sides.

Abstract: An integrated circuit arrangement contains an insulating region, which is part of a planar insulating layer, and a capacitor which contains: near and far electrode regions near and remote from the insulating region and a dielectric region. The capacitor and an active component are on the same side of the insulating layer, and the near electrode region and an active region of the component are planar and parallel to the insulating layer. The near electrode region is monocrystalline and contains multiple webs. Alternately, a FET is present in which: a channel region is the active region, the FET contains a web with opposing control electrodes connected by a connecting region that is isolated from the channel region by a thick insulating region. The thick insulating region is thicker than control electrode insulation regions. The control electrodes contain the same material as the far electrode region.

Abstract: Within a display device, a respective one of a plurality of design graphical representations is displayed for each of a plurality of hierarchically arranged design entity instances within a simulated system. The design entity instances include a particular design entity instance containing a latch that is represented by a particular design graphical representation. A configuration entity instance associated with the particular design entity is identified within a configuration database associated with the simulated system. The configuration entity instance has a plurality of different settings that each reflects a value of the latch. Within the display device, a configuration graphical representation of the configuration entity instance is presented in association with the particular design graphical representation corresponding to the particular design entity instance.

Abstract: In a method of data processing, a database defines a Dial entity and at least one instance of the Dial entity. Each instance of the Dial entity has an input having a plurality of different possible input values and one or more outputs, and each of the plurality of different possible input values has a different associated output value set for the one or more outputs. Each instance of the Dial entity determines a value of at least one of a plurality of configuration latches in a digital system separate from the database. The database also associates with the Dial entity at least one set of biasing weights that, when applied, determines a probability of each instance of the Dial entity having particular ones of the plurality of different possible input values.

Abstract: In at least one hardware definition language (HDL) file, at least one design entity containing a functional portion of a digital system is specified. The design entity logically contains a latch having a respective plurality of different possible latch values. With one or more statements in one or more files, a configuration entity is associated with the latch. The configuration entity has a plurality of different settings and each setting reflects which of the plurality of different possible values is loaded in the associated latch. A controlling value set for at least one instance of the configuration entity is also defined in one or more files. The controlling value set indicates at least one controlling value for which presentation of a current setting of the configuration entity instance is restricted.

Abstract: A system and computer program product for providing centralized access to count event information from testing of a hardware simulation model within a batch simulation farm which includes simulation clients and an instrumentation server. Count event data for said hardware simulation model is received by the instrumentation server from one or more simulation clients. A first and a second counter report are generated for the hardware simulation model, in which the first and second counter reports are derived from the count event data received by the instrumentation server. The first counter report is compared to the second counter report, and responsive to this comparison, a counter difference report is generated within the instrumentation server that conveys count event trends associated with the simulation model under different simulation testcases.