Abstract: A semiconductor device includes a latch circuit including a first inverter configured to output a first signal based on an input signal, a second inverter configured to output a first clock signal based on a first strobe signal, a third inverter configured to output a second clock signal based on a second strobe signal, a first clock generation circuit configured to generate a third clock signal having transitions that are delayed with respect to the first clock signal, a second clock generation circuit configured to generate a fourth clock signal having transitions that are delayed with respect to the second clock signal, a fourth inverter configured to output an inversion signal of the first signal in accordance with the third and fourth clock signals, and a data latch circuit configured to latch an output signal of the fourth inverter.

Abstract: A correction circuit includes a first detection unit, a second detection unit, a delay unit, and a waveform shaping unit. The first detection unit is configured to measure a first period of a high level of a first clock. The second detection unit is configured to measure a second period of a high level of a second clock that is complementary to the first clock. The delay unit is configured to generate a first delay clock and a second delay clock according to a difference between the first period and the second period. The waveform shaping unit is configured to generate a third clock having a logic level which is switched based on an edge of the first delay clock and an edge of the second delay clock.

Abstract: A semiconductor device comprises an input circuit that includes a first comparator configured to output a first output signal and a second output signal having a phase opposite to that of the first output signal, based on a comparison result of a first input signal and a second input signal which is a complementary signal of the first input signal. A duty ratio of the first output signal and a duty ratio of the second output signal are different from a duty ratio of the first input signal and a duty ratio of the second input signal, respectively.

Abstract: A semiconductor memory device includes a plurality of memory chips that are stacked above one another and connected to each other through a through via, an interface chip that is connected to the plurality of memory chips, and a plurality of first terminals for connection with an external device. The interface chip includes a plurality of second terminals that are connected to the plurality of first terminals, and is capable of receiving a signal that is supplied from the external device through the first and second terminals, and stores configuration information according to which a set number of the second terminals are designated for receiving control signals for the plurality of memory chips.

Abstract: A semiconductor memory device includes a first transistor including a first end connected to a first pad and a second end connected to a first node, a second transistor including a first end connected to a second pad and a second end connected to the first node, a third transistor including a first end connected to the second pad, a second end connected to the first node, and a gate connected to a second node and having a size different from that of the second transistor, a fourth transistor including a first end connected to the first pad, a second end connected to the second node, and a gate connected to the first node, and a fifth transistor including a first end connected to the second pad, a second end connected to the second node, and a gate connected to the first node.

Abstract: A semiconductor device includes a latch circuit including a first inverter configured to output a first signal based on an input signal, a second inverter configured to output a first clock signal based on a first strobe signal, a third inverter configured to output a second clock signal based on a second strobe signal, a first clock generation circuit configured to generate a third clock signal having transitions that are delayed with respect to the first clock signal, a second clock generation circuit configured to generate a fourth clock signal having transitions that are delayed with respect to the second clock signal, a fourth inverter configured to output an inversion signal of the first signal in accordance with the third and fourth clock signals, and a data latch circuit configured to latch an output signal of the fourth inverter.

Abstract: A semiconductor memory device includes a plurality of memory chips that are stacked above one another and connected to each other through a through via, an interface chip that is connected to the plurality of memory chips, and a plurality of first terminals for connection with an external device. The interface chip includes a plurality of second terminals that are connected to the plurality of first terminals, and is capable of receiving a signal that is supplied from the external device through the first and second terminals, and stores configuration information according to which a set number of the second terminals are designated for receiving control signals for the plurality of memory chips.

Abstract: A memory device includes a nonvolatile semiconductor memory cell array, a plurality of terminals through which control signals are received to control the memory device, an on-die termination circuit connected to at least one of the terminals and having a variable resistor, and a control circuit. The control circuit is configured to enable the on-die termination circuit in response to an enabling signal to enable the on-die termination circuit, with a resistance of the variable registor at different values depending on whether a control signal is asserted or deasserted when the enabling signal is received.

Abstract: According to one embodiment, an amplifier includes a first inverter which inverts and delays a first signal to generate a second signal. A second inverter inverts and delays a third signal to generate a fourth signal. A first transistor includes a gate electrode supplied with the second signal. A second transistor includes a gate electrode supplied with the fourth signal. An output terminal is coupled to one terminal of the second transistor and outputs a fifth signal. A third inverter inverts and delays the fifth signal to generate a sixth signal. A first discharge circuit discharges one terminal of the first transistor and the one terminal of the second transistor based on the first, sixth, or fourth signal, and includes one terminal coupled to the other terminal of each of the first and second transistors.

Abstract: A memory device includes a nonvolatile semiconductor memory cell array, a plurality of terminals through which control signals are received to control the memory device, an on-die termination circuit connected to at least one of the terminals and having a variable resistor, and a control circuit. The control circuit is configured to enable the on-die termination circuit in response to an enabling signal to enable the on-die termination circuit, with a resistance of the variable resister at different values depending on whether a control signal is asserted or deasserted when the enabling signal is received.

Abstract: According to one embodiment, an amplifier includes a first inverter which inverts and delays a first signal to generate a second signal. A second inverter inverts and delays a third signal to generate a fourth signal. A first transistor includes a gate electrode supplied with the second signal. A second transistor includes a gate electrode supplied with the fourth signal. An output terminal is coupled to one terminal of the second transistor and outputs a fifth signal. A third inverter inverts and delays the fifth signal to generate a sixth signal. A first discharge circuit discharges one terminal of the first transistor and the one terminal of the second transistor based on the first, sixth, or fourth signal, and includes one terminal coupled to the other terminal of each of the first and second transistors.

Abstract: According to one embodiment, there is provided an output circuit including a driver transistor and a pre-driver circuit. The driver transistor is connected to an output terminal. The pre-driver circuit is configured to turn ON/OFF the driver transistor. The pre-driver circuit includes a first transistor, a second transistor, a third transistor. The first transistor is configured to control ON speed of the driver transistor. The second transistor is connected in parallel with the first transistor. The second transistor is configured to control ON speed of the driver transistor. The third transistor is connected in parallel with the first transistor and in series with the second transistor. The third transistor is configured to activate or deactivate the second transistor.

Abstract: According to one embodiment, there is provided an output circuit including a driver transistor and a pre-driver circuit. The driver transistor is connected to an output terminal. The pre-driver circuit is configured to turn ON/OFF the driver transistor. The pre-driver circuit includes a first transistor, a second transistor, a third transistor. The first transistor is configured to control ON speed of the driver transistor. The second transistor is connected in parallel with the first transistor. The second transistor is configured to control ON speed of the driver transistor. The third transistor is connected in parallel with the first transistor and in series with the second transistor. The third transistor is configured to activate or deactivate the second transistor.

Abstract: The receiving apparatus according to the present invention includes a multi-phase clock generating circuit, a latch component, an error check component, and a selector circuit. The multi-phase clock generating circuit generates a plurality of clocks, phases of which are different from each other. The latch component receives an external data divided into two or more and the plurality of the clocks, and concurrently obtains a plurality of data, clock-timing of which is different from each other, by latching the external data by different clocks. The error check component detects an error of the respective data. The selector circuit selects data judged as no-error data from the plurality of the data, and outputs the selected data as received data. According to the circuit configuration like this, it is possible to precisely receive the data.