Abstract: A nonvolatile semiconductor memory employs sense amplifiers, circuits for providing stabilized source voltages, and circuits for realizing high-speed and reliable read and write operations. The semiconductor memory has a matrix of nonvolatile erasable memory cell transistors.

Abstract: An object of the present invention is to ease the dielectric strength requirements for transistors forming power supply circuits or the like. A nonvolatile semiconductor memory of the present invention includes a plurality of memory cells, each of which is composed of a floating gate, a control gate, a drain, and a source, and a negative voltage generating means whose generated negative voltage is applied to the control gate for drawing a charge stored in the floating gate into a channel or the source when stored data is erased electrically. The nonvolatile memory of the present invention further includes positive erasure voltage generating means, and a positive voltage higher than a conventional supply voltage generated by the positive erasure voltage generating means is applied to the channel or the source.

Abstract: An exclusive OR circuit includes a first series circuit in which a source of a first pMIS transistor is connected to a positive-voltage power supply line. A drain of the first pMIS transistor is connected to a drain of a first nMIS transistor via a second nMIS transistor. The source of the first nMIS transistor is connected to a low-voltage power supply line via a fourth nMIS transistor. A second series circuit has a drain of a third nMIS transistor connected to a high-voltage power supply line via a second pMIS transistor. The source of the third nMIS transistor is connected to the source of a third pMIS transistor. The drain of the third pMIS transistor is connected to the low-voltage power supply line via a fourth pMIS transistor. The gates of the first and third nMIS transistors and the first and third pMIS transistors are connected to one another and provided with a first input.

Abstract: A semiconductor memory having address buffer means, memory cell means, word line selection means, bit line selection means, an output buffer, first address generation means connected to the address buffer means, for providing and address for specifying a group of data pieces, and second address generation means for providing addresses for specifying the data pieces, respectively, the semiconductor memory comprising first reading means for selecting and reading a group of data pieces through one of the word line selection means and bit line selection means according to an address provided by the first address generation means, second reading means for selecting the data pieces, which have been selected and read according to the address provided by the first address generation means, through one of the bit line selection means and word line selection means according addresses provided by the second address generation means and providing them to the output buffer; and pre-reading means for reading another group

Abstract: An object of the present invention is to provided a semiconductor device that permits easy and efficient testing. A semiconductor device which is characterized in that the power supply for an output circuit is selectable between a normal power supply and an independent power supply provided independently of the normal supply.

Abstract: When a current flows through a selected memory cell transistor at the time of data reading, the gate voltage of an n-channel MOS transistor, which makes up the current flowing through the load, rises. Thus, when a current flows through a selected memory cell transistor at the time of data reading, the current through the load is increased so that the time required for data reading when the current flows through the selected memory cell transistor can be shortened and the data reading can be effected at a high speed.

Abstract: A nonvolatile semiconductor memory employs sense amplifiers, circuits for providing stabilized source voltages, and circuits for realizing high-speed and reliable read and write operations. The semiconductor memory has a matrix of nonvolatile erasable memory cell transistors.

Abstract: A nonvolatile semiconductor memory employs sense amplifiers, circuits for providing stabilized source voltages, and circuits for realizing high-speed and reliable read and write operations. The semiconductor memory has a matrix of nonvolatile erasable memory cell transistors.

Abstract: An object of the present invention is to provide a semiconductor device that permits easy and efficient testing. A nonvolatile semiconductor memory comprises word lines WLi and bit lines BLi, a memory cell matrix 17 consisting of nonvolatile memory cells Cij, a sense amplifier 15, a write/erase timing circuit 9 for performing timing control necessary for write and erase operations, and a status register 2 for storing the operating state of the memory at the completion of the operation of the circuit 9, wherein there are provided, outside the address of the memory cell matrix 17, two kinds of dummy cells, D1, D2, D3, . . . , whose values are fixed to different values that induce different outputs from the sense amplifier 15. A pass condition or a fail condition is generated by accessing the dummy cells.

Abstract: A semiconductor memory device has 2.sup.n word lines, a plurality of bit lines, a plurality of nonvolatile memory cells disposed at each intersection of the word lines and the bit lines, a write circuit for writing data to a memory cell located at an intersection of selected ones of the word lines and the bit lines, and a sense amplifier for reading data out of the memory cells. Further, the semiconductor memory device comprises a first unit for simultaneously selecting a block of 2.sup.m (n>m) word lines among the 2.sup.n word lines, and a second unit for not selecting a block of 2.sup.k (m>k) word lines among the 2.sup.m word lines. The second unit does not select the block of 2.sup.k word lines, and selects a block of 2.sup.k word lines prepared outside the 2.sup.n word lines when any one of the 2.sup.k word lines among the 2.sup.m word lines is defective.

Abstract: An object of the present invention is to ease the dielectric strength requirements for transistors forming power supply circuits or the like. A nonvolatile semiconductor memory of the present invention includes a plurality of memory cells, each of which is composed of a floating gate, a control gate, a drain, and a source, and a negative voltage generating means whose generated negative voltage is applied to the control gate for drawing a charge stored in the floating gate into a channel or the source when stored data is erased electrically. The nonvolatile memory of the present invention further includes positive erasure voltage generating means, and a positive voltage higher than a conventional supply voltage generated by the positive erasure voltage generating means is applied to the channel or the source.

Abstract: An object of the present invention is to provide a semiconductor device that permits easy and efficient testing. A nonvolatile semiconductor memory including word lines WLi and bit lines BLi, a memory cell matrix 17 including nonvolatile memory cells Cij, a sense amplifier 15, a write/erase timing circuit 9 for performing timing control necessary for write and erase operations, and a status register 2 for storing the operating state of the memory at the completion of the operation of the circuit 9, wherein there are provided, outside the address of the memory cell matrix 17, two kinds of dummy cells, D1, D2, D3, . . . , whose values are fixed to different values that induce different outputs from the sense amplifier 15. A pass condition or a fail condition is generated by accessing the dummy cells.

Abstract: A sense amplifier circuit for use in a ROM comprises, an excess charge detecting circuit for producing a detection output when a potential of a bit line exceeds a normal value, and an excess charge discharging circuit which operates in response to said excess charge detecting circuit for discharging a bit line charge and for returning the bit line potential to the normal value.The excess charge detecting circuit and the excess charge discharge circuit can be realized by a diode connected transistor connected between the bit line and an inverter of the sense amplifier. When the bit line potential is about to exceed the predetermined value, the transistor turns on to prevent the bit line potential from exceeding the predetermined value.

Abstract: A semiconductor memory device with a mask ROM and a PROM whose program characteristics are different is provided with a switching means. The switching operation is performed so that the content of the mask ROM becomes effective when the mask ROM is programmed and so that the content of the PROM becomes effective when the RPOM is programmed. Thereby, both mask ROM and PROM become programmable, making the semiconductor memory device with mask ROM and PROM effectively operative.

Abstract: This invention configures a semiconductor memory device in the following manner. The semiconductor contains a first memory part and more than one redundant circuit that is used when the first memory part is faulty, and each redundant circuit memorizes in its status memory part whether a second memory part which becomes a spare cell is in a not-in-use status, in an in-use status or in an out-of-use status, which means that a failure exists in the second memory part. If a second memory part is in the out-of-use status, its access is prohibited, and the other second memory part without a failure is accessed. With this configuration, when a spare cell is confirmed to have a failure after the spare cell is programmed, the spare cell is put in the out-of-use status, thereby preventing the spare cell from being accessed. Consequently, the yield of the semiconductor device is increased.

Abstract: A semiconductor memory device comprises a first memory comprising memory cells for prestoring fixed data, a decoder for decoding an input address and for reading out a fixed data from the first memory based on a decoded input address, a second memory for storing a data identical to that prestored in a defective memory cell of the first memory, where the second memory comprising programmable non-volatile memory cells, a discriminating part including a third memory for storing a redundant address of each defective memory cell of the first memory for discriminating whether or not the input address coincides with the redundant address and for outputting a discrimination signal when the input address coincides with the redundant address, and a selecting part supplied with data read out from the first and second memories for normally outputting the data read out from the first memory and selectively outputting the data from the second memory when the discrimination signal is received from the discriminating part.

Abstract: A read only memory in which a portion of an address area thereof is allotted to that of another memory. The read only memory comprises at least one address decoding output circuit with a read only memory portion. The address decoding output circuit is formed to be programmable at the same time as the read only memory portion. Thus, an apparatus having this read only memory can be miniaturized and have a low power consumption, and the process of producing a system including this read only memory is simplified.

Abstract: A signal transition detection circuit comprises a decoder circuit (1) for decoding a plurality of signals, a delay circuit (2) having a rise delay time period (T.sub.r) and a fall time period (T.sub.f) which are different from each other, and a logic circuit (3). The logic circuit performs a logic operation upon the outputs of the delay circuit to generate a pulse signal (ATD) for indicating at least one transition of the signals.