Abstract: A temperature detection circuit (1) includes a first transistor (Q1) of a bipolar type, and a second transistor (Q2) of a bipolar type, wherein the first transistor (Q1) and the second transistor (Q2) form a current mirror circuit (10), and the temperature of the amplifier circuit (30) is detected based on a temperature change of the first transistor (Q1) and the second transistor (Q2).

Abstract: The present disclosure provides a monitoring system including an edge processing apparatus including a space distinct ID management database, a space distinct ID control unit, a storage unit, an analysis unit, and an abnormality determination unit, and a controller, a transmitter, and a camera with sensor that are installed in a location to be monitored, in which the space distinct ID management database stores a space distinct ID and a transmission time of the space distinct ID in association with the location to be monitored, the space distinct ID control unit acquires the space distinct ID associated with the location to be monitored from the space distinct ID management database and transmits the space distinct ID that is acquired to the controller in the associated location to be monitored, the controller transmits the space distinct ID acquired from the space distinct ID control unit to the transmitter, the transmitter generates a signal based on the space distinct ID acquired from the controller and di

Abstract: A thinning amount managing apparatus in an embodiment for managing an amount of thinning of a first-stage rotor blade of a steam turbine caused by solid particles contained in working steam for working the steam turbine. The thinning amount managing apparatus includes a display information generation section configured to generate display information for displaying: past thinning amount related information indicating information on a past thinning amount of the first-stage rotor blade from the past to the present calculated based on measured information; and future thinning amount related information indicating information on a future thinning amount of the first-stage rotor blade calculated based on a future operating condition input via a user interface screen and the past thinning amount related information.

Abstract: An electrolyzer stores of electrolytic cells, in which a pressing force applied to the stack is maintained by automatically adjusting the position of a locking mechanism of a safety device. The electrolyzer includes a stack obtained by stacking a plurality of electrolytic cells with membranes interposed therebetween, a pressing plate arranged on one end side in a stacking direction of the stack, an actuator which generates a pressing force along the stacking direction by moving the pressing plate, a safety device which is configured to maintain the pressing force by allowing the locking mechanism to come into contact with the contact plate to prevent the retraction of the pressing plate, when the actuator is not operated, and a control device which adjusts a distance between the locking mechanism and the contact plate within a specific range so as to maintain the pressing force which acts on the stack.

Abstract: A light source device includes: a fiber laser including an excitation light source and configured to output pulsed light generated according to excitation light from the excitation light source; a fiber amplifier configured to receive the pulsed light output from the fiber laser, amplify the pulsed light, and output the amplified pulsed light, a wavelength shift fiber configured to receive the pulsed light output from the fiber amplifier, shift a wavelength of the pulsed light, and output the pulsed light; an output fiber configured to receive the pulsed light output from the wavelength shift fiber, and output the pulsed light to an outside; a light detection element configured to detect, in the output fiber, the pulsed light having passed through at least the wavelength shift fiber; and a control unit configured to control a drive current of the excitation light source.

Abstract: To solve the above problem, an object of the present invention is to provide a communication control device, a communication control method, a communication system, and a program that do not require addition of a function to facility equipment, for communication resource allocation corresponding to a physical location of a terminal indoors. The communication system includes a location metadata source (26, 27) in an arbitrary area 5 and a communication control device 35. The communication control device 35 includes: a reception unit 31 that receives information of the location metadata source (26, 27) from a communication terminal 10 in the arbitrary area 5; and a controller 30 that calculates a location of the communication terminal 10 in the arbitrary area 5 on the basis of the information of the location metadata source (26, 27) and allocates a communication resource depending on the location of the communication terminal 10.

Abstract: An object of the present disclosure is to reduce traffic required for transmission of beacon information from a sensor apparatus to an access point and reduce power consumption without affecting position estimation processing in a high-order cloud or server.

Abstract: An object of the present disclosure is to provide a data collection system capable of collecting various pieces of metadata other than sensing data and instrument information by existing communication protocols and associating the sensing data, the instrument information, and the metadata with each other without errors.

Abstract: An object of the present disclosure is to collectively collect sensing data and metadata regarding normality of equipment by utilizing light communication protocol. The present disclosure is a system that collects sensing data from a sensor terminal in a data collection unit using a data collection network, the sensor terminal including a detection unit configured to detect metadata regarding internal information of the sensor terminal other than a sensor device that detects sensing data and equipment information and transmitting the metadata detected by the detection unit using an extended area or an optional area defined in communication protocol for transmitting the sensing data or the equipment information in a frame defined in the communication protocol, and the data collection unit associating the sensing data, the equipment information, and the metadata on the basis of information for identifying the sensor terminal described in the frame.

Abstract: An object of the present invention is to provide a sensor terminal, a data collection unit, a data collection system, a data collection method, and a program capable of handling highly real-time sensing data while eliminating the need to generate a highly reliable timestamp. In a data collection system 302, a sensor terminal 11 receives broadcast time information (step S01), the sensor terminal 11 transmits related time information related to the time information and sensing data as a set (step S02), a data collection unit 12 receives the set (step S03), and the data collection unit 12 organizes the related time information and the sensing data included in the set in a database 12d on the basis of information for identifying the sensor terminal 11 (step S04).

Abstract: An inspecting device includes a stage configured to support a wafer in which a plurality of rows of modified regions are formed in a semiconductor substrate, a light source configured to output light, an objective lens configured to pass light propagated through the semiconductor substrate, a light detection part configured to detect light passing through the objective lens, and an inspection part configured to inspect whether or not there is a tip of a fracture in an inspection region between a front surface and the modified region closest to the front surface of the semiconductor substrate. The objective lens positions a virtual focus symmetrical with a focus with respect to the front surface in the inspection region. The light detection part detects light propagating from the back surface side of the semiconductor substrate to the back surface side via the front surface.

Abstract: An inspecting device includes a stage configured to support a wafer in which a plurality of rows of modified regions are formed in a semiconductor substrate, a light source configured to output light, an objective lens configured to pass light propagated through the semiconductor substrate, a light detection part configured to detect light passing through the objective lens, and an inspection part configured to inspect whether or not there is a tip of a fracture in an inspection region between a first modified region closest to a front surface of the semiconductor substrate and a second modified region closest to the first modified region. The objective lens aligns a focus from the back surface side in an inspection region. The light detection part detects light propagating in the semiconductor substrate from the front surface side to the back surface side.

Abstract: An elevator according to an aspect of the present invention includes a car speed detection device that measures car speed, an emergency braking device that comes into press contact with a guiderail and emergently stops a car when the car speed exceeds a threshold, an electric actuating unit that electrically actuates the emergency braking device, a battery that supplies electric power when commercial power supply is interrupted, and a safety control unit that monitors abnormality of the elevator and controls operation of the electric actuating unit. The safety control unit measures remaining power of the battery when the electric power is supplied from the battery, determines operation propriety of the emergency braking device at commercial power supply restoration time based on transition of battery remaining power, and controls operation of the electric actuating unit at the commercial power supply restoration time based on content of the determination.

Abstract: An inspecting device includes a stage configured to support a wafer in which a plurality of rows of modified regions are formed in a semiconductor substrate, a light source configured to output light, an objective lens configured to pass light propagated through the semiconductor substrate, a light detection part configured to detect light passing through the objective lens, and an inspection part configured to inspect whether or not there is a tip of a fracture in an inspection region between a front surface and the modified region closest to the front surface of the semiconductor substrate. The objective lens positions a virtual focus symmetrical with a focus with respect to the front surface in the inspection region. The light detection part detects light propagating from the back surface side of the semiconductor substrate to the back surface side via the front surface.

Abstract: An inspecting device includes a stage configured to support a wafer in which a plurality of rows of modified regions are formed in a semiconductor substrate, a light source configured to output, an objective lens configured to pass light propagated through the semiconductor substrate, a light detection part configured to detect light passing through the objective lens, and an inspection part configured to inspect a tip position of a fracture in an inspection region between a back surface and the modified region closest to the back surface of the semiconductor substrate. The objective lens aligns a focus from the back surface side in an inspection region. The light detection part detects light propagating from the front surface side of the semiconductor substrate to the back surface side.

Abstract: A highly reliable semiconductor device capable of retaining data for a long period is provided. The transistor includes a first gate electrode, a first gate insulator over the first gate electrode, a first oxide and a second oxide over the first gate insulator, a first conductor over the first oxide, a second conductor over the second oxide, a third oxide covering the first gate insulator, the first oxide, the first conductor, the second oxide, and the second conductor, a second gate insulator over the third oxide, and a second gate electrode over the second gate insulator. An end portion of the second gate electrode is positioned between an end portion of the first conductor and an end portion of the second conductor in a channel length direction.

Abstract: The invention provides a hot press machine which reduces the cooling time of a superposed member and enhances the productivity. A hot press machine of the invention includes a first die, a second die disposed on the first die, a first refrigerant flow passage for guiding a refrigerant into the first die or the second die, a plurality of grooves formed in a press forming surface of the first die or the second die, and a second refrigerant flow passage for guiding a refrigerant into the grooves. The hot press machine performs press forming and quenching by pressing a superposed member between the first die and the second die, the superposed member comprising a first steel sheet and a second steel sheet superposed and joined on the first steel sheet.

Abstract: The present invention relates to an organic charge transport layer having a low refractive index, and to an organic EL device, an organic semiconductor device, and an organic photoelectric device which are provided with the organic charge transport layer. An object of the present invention is to provide an organic semiconductor thin film having a dramatically reduced refractive index without impairing conductivity, by mixing a predetermined amount of an electret material into an organic semiconductor material. The organic charge transport layer according to the present invention is characterized by containing an organic semiconductor material and an electret material. It is preferable that the organic semiconductor material is a hole transport material and the electret material has a refractive index of 1.5 or lower.

Abstract: To improve the electrical characteristics of a semiconductor device including an oxide semiconductor, and to provide a highly reliable semiconductor device with a small variation in electrical characteristics. The semiconductor device includes a first insulating film, a first barrier film over the first insulating film, a second insulating film over the first barrier film, and a first transistor including a first oxide semiconductor film over the second insulating film. The amount of hydrogen molecules released from the first insulating film at a given temperature higher than or equal to 400° C., which is measured by thermal desorption spectroscopy, is less than or equal to 130% of the amount of released hydrogen molecules at 300° C. The second insulating film includes a region containing oxygen at a higher proportion than oxygen in the stoichiometric composition.

Abstract: The invention provides manufacturing a partially reinforced press formed product with high corrosion resistance and weldability. First and second steel plates having aluminum-based plating films are heated to an austenite range temperature by first and second furnaces, respectively, to transform the bodies of the first and second steel plates into austenite and form Fe—Al alloy layers on the surfaces of the first and second steel plates. Hot press forming is then performed to the first and second steel plates formed with the Fe—Al alloy layers, the first and second steel plates being superposed. The first and second steel plates, which are hot press formed, are then welded.