Abstract: Methods of predicting perceptual characteristics may include: (a) receiving an optical signal from a sample of a grape product or a wine; (b) extracting features from the optical signal by transforming information in the optical signal to a latent space; and (c) providing the features to a machine learning model that outputs (i) chemical composition information in the grape product or the wine, and/or (ii) the one or more perceptual characteristics of a finished wine produced from the grape product or of the wine. The chemical composition information and/or the perceptual characteristics may pertain to smoke taint.

Abstract: A lighting assembly comprises a first lighting arrangement with a first lighting unit board and a first switched mode driving unit and a second lighting arrangement with a second lighting unit board and a second switched mode driving unit. A parasitic capacitance is present between the first and second lighting unit boards. The switched mode driving units switches voltages on the lighting arrangements and said voltages generates a differential voltage across the parasitic capacitance and leads to a leakage current. A blocking arrangement is in a path between the first and second lighting arrangements and it blocks the leakage current flowing at least from one of the first and second lighting arrangements to the other of the first and second lighting arrangements via the parasitic capacitance due to the differential voltage between the driving units.

Abstract: A traveling rail jointing device for a pivot-type suspended monorail multi-way turnout beam includes: a jointing plate, a rotating support seat, a lever and a push-pull assembly. The jointing plate is disposed with a rotation shaft thereon along an extension direction of a plate surface thereof. The rotation shaft is rotatably embedded on the rotating support seat. A first end of the lever is fixed on the jointing plate, and a second end of the lever is connected to the push-pull assembly. The technical solution of the disclosure can realize reliable jointing for pivot-type suspended monorail multi-way turnout beams through a simple structure.

Abstract: An aerial transfer carriage and a control method therefor. The aerial transfer carriage includes: a carriage frame, a spreader, a lifting device and an anti-sway device. The anti-sway device includes two correction winch mechanisms and two correction ropes. The lifting device drives an end of each of the two correction ropes to be reel and unreel. The two correction winch mechanisms respectively drive another end of each of the two correction ropes to be reel and unreel. When it is required to correct a deflection of the spreader, the two opposite ends of the correction rope are wound or unwound respectively, and with the two correction ropes disposed crosswise, the correction rope adjusts a lateral position and a longitudinal position of the spreader during reel and unreel.

Abstract: An auxiliary switching device of pivot-type suspended monorail multi-way turnout system includes: a first driving member, a bracket, a slide block, a slide rail, a second driving member and a switching push head. An action end of the first driving member is connected to the bracket to drive the bracket to move back and forth along a first axial direction. The slide block is disposed on the bracket, and the slide block is slidably connected onto the slide rail. The second driving member is disposed on the bracket. The switching push head is connected to an action end of the second driving member.

Abstract: There exists a need for improvements to curling iron technology, such that different methods of design and rotation can provide better reliability and function. The present disclosure discloses a rotating curling iron which comprises a handle, a connecting seat, an electric control device and a rotating curling iron rod. The technical solution of the present disclosure may improve the reliability of the electrical connection between the handle and the rotating curling iron rod.

Abstract: A machine learning model may employ in situ chemical composition information, as an input, to characterize processes in real time, and optionally assist in process control. Chemical composition information may be obtained from an in situ emission spectrometer such an optical emission spectrometer.

Abstract: The disclosure provides a three-dimensional (3D) image classification method and apparatus, a device, and a storage medium. The method includes: obtaining a 3D image, the 3D image including first-dimensional image information, second-dimensional image information, and third-dimensional image information; extracting a first image feature corresponding to planar image information from the 3D image; extracting a second image feature corresponding to the third-dimensional image information from the 3D image; fusing the first image feature and the second image feature, to obtain a fused image feature corresponding to the 3D image; and determining a classification result corresponding to the 3D image according to the fused image feature corresponding to the 3D image.

Abstract: In some examples, a wafer bow measurement system comprises a measurement unit including: a wafer support assembly to impart rotational movement to a measured wafer supported in the measurement unit; an optical sensor; a calibration standard to calibrate the optical sensor; a linear stage actuator to impart linear direction of movement to the optical sensor; a wafer centering sensor to determine a centering of the measured wafer supported in the measurement unit; and a wafer alignment sensor to determine an alignment of the measured wafer supported in the measurement unit.

Abstract: Methods and systems for using a time-series of spectra to identify endpoint of a multi-step semiconductor fabrication processes such as multi-step deposition and multi-step etch processes. One method includes accessing a virtual carpet (e.g., a machine learning model) that is formed from a time-series of spectra for the multi-step processes collected during a training operation. During production, in-situ time-series of spectra are compared to the virtual carpet as part of end pointing of multi-step fabrication processes.

Abstract: A metrology system may include an optical metrology tool configured to produce an optical metrology output for one or more features on a processed substrate, and a metrology machine learning model that has been trained using a training set of (i) profiles, critical dimensions, and/or contours for a plurality of features, and (ii) optical metrology outputs for the plurality of features. The metrology machine learning model may be configured to: receive the optical metrology output from the optical metrology tool; and output the profile, critical dimension, and/or contour of the one or more features on the processed substrate.

Abstract: A rotating curling iron is disclosed according to the present disclosure, which includes a handle, a connecting seat, and a rotating curling iron rod. The handle includes a housing, an electric control device and a driving motor. The driving motor is electrically connected to the electric control device, and the housing has an opening end. The connecting seat is rotatably mounted in the housing and connected to the driving motor. The connecting seat has a connecting end exposed from the opening end, and a sealing structure is provided between the connecting seat and an inner wall of the opening end. The rotating curling iron rod includes a heating rod and a fixing seat connected to one end of the heating rod. The fixing seat is detachably connected with the connecting end. The technical scheme of the present disclosure can improve the waterproof effect of the rotating curling iron.

Abstract: There exists a need for improvements to curling iron technology, such that different methods of design and rotation can provide better reliability and function. The present disclosure discloses a rotating curling iron which comprises a handle, a connecting seat, an electric control device and a rotating curling iron rod. The technical solution of the present disclosure may improve the reliability of the electrical connection between the handle and the rotating curling iron rod.

Abstract: Various embodiments herein relate to systems and methods for adaptive model training. In some embodiments, a computer program product for adaptive model training is provided, the computer program product comprising a non-transitory computer readable medium on which is provided computer-executable instructions for: receiving, from a plurality of process chambers, ex situ data associated with wafers fabricated using the process chambers and in situ measurements, wherein a first machine learning model is used to predict the ex situ data using the in situ measurements; calculating a metric indicating an error associated with the first machine learning model; determining whether to update the first machine learning model; and generating a second machine learning model using the ex situ data and the in situ measurements.

Abstract: In some examples, a wafer bow measurement system comprises a measurement unit including: a wafer support assembly to impart rotational movement to a measured wafer supported in the measurement unit; an optical sensor; a calibration standard to calibrate the optical sensor; a linear stage actuator to impart linear direction of movement to the optical sensor; a wafer centering sensor to determine a centering of the measured wafer supported in the measurement unit; and a wafer alignment sensor to determine an alignment of the measured wafer supported in the measurement unit.

Abstract: The disclosure relates to an aerial transportation vehicle including a vehicle frame.

Abstract: Provided herein are methods for the clinical treatment of tumors (e.g., advanced solid tumors) in patients having certain levels of serum IL-8 using an anti-IL-8 antibody in combination with an anti-PD-1 antibody.

Abstract: An image segmentation method, apparatus, and a storage medium are provided. The method includes: selecting a current image frame in a video according to a time sequence of the video; determining a reference image frame before the current image frame in the time sequence; obtaining first location information of a target object key point in the reference image frame; performing an affine transformation on the current image frame with reference to an affine transformation relationship between the first location information and a target object key point template to obtain a target object diagram; performing a key point detection on the target object diagram to obtain second location information of the target object key point; segmenting a target object from the target object diagram to obtain segmentation information; and obtaining the target object from the current image frame according to the segmentation information and the second location information.

Abstract: The disclosure relates to a lifting vehicle frame and an aerial transportation vehicle. The aerial transportation vehicle includes a lifting vehicle frame, which includes an upper vehicle frame (1), a lower vehicle frame (2), a lifting assembly (a) and a locking device (b), wherein the upper vehicle frame (1) and the lower vehicle frame (2) are connected through the lifting assembly (a); at least two lifting assemblies (a) are provided opposite to each other in a first direction; the lower vehicle frame (2) and the upper vehicle frame (1) can move close to or apart from each other by operating the at least two lifting assemblies (a); the locking device (b) is disposed on the lower vehicle frame (2); when the lower vehicle frame (2) and the upper vehicle frame (1) move close to each other, the lower vehicle frame (2) and the upper vehicle frame (1) are locked together by operating the locking device (b).

Abstract: Computer-implemented methods of optimizing a process simulation model that predicts a result of a semiconductor device fabrication operation to process parameter values characterizing the semiconductor device fabrication operation are disclosed. The methods involve generating cost values using a computationally predicted result of the semiconductor device fabrication operation and a metrology result produced, at least in part, by performing the semiconductor device fabrication operation in a reaction chamber operating under a set of fixed process parameter values. The determination of the parameters of the process simulation model may employ pre-process profiles, via optimization of the resultant post-process profiles of the parameters against profile metrology results. Cost values for, e.g., optical scatterometry, scanning electron microscopy and transmission electron microscopy may be used to guide optimization.