Patents by Inventor Yu-Min Chang

Yu-Min Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060245664
    Abstract: The present invention describes a method for image enlargement with the following steps. An image is divided into several sampling regions. A reference value of each sampling regions is determined. Then, the reference value is compared with a threshold for having a result. Finally, according to the result, at least one inserted pixel value is computed.
    Type: Application
    Filed: April 27, 2006
    Publication date: November 2, 2006
    Inventors: Yu-Min Chang, Hsiang-Chun Lin
  • Patent number: 7092169
    Abstract: A zoom lens system, in sequence from an object side to an image side, includes a first lens group having positive refractive power and fixed for gathering incoming light; a second lens group having negative refractive power for changing a focal length of the zoom lens system; a third lens group having positive refractive power and made stationary; a fourth lens group having positive refractive power and movable for compensating for a fluctuation of an image plane position; and a fifth lens group having positive refractive power and movable for focusing purpose. During zooming from a wide-angle end to a telephoto end, the second and fourth lens groups are moved independently toward the third lens group in such a manner that spacing between the first lens group and the second lens group increases and spacing between the third lens group and the fourth lens group decreases.
    Type: Grant
    Filed: September 22, 2005
    Date of Patent: August 15, 2006
    Assignee: Asia Optical Co., Inc.
    Inventor: Yu-Min Chang
  • Patent number: 6953608
    Abstract: A HDP CVD process for depositing a USG liner followed by a FSG dielectric layer on a metal line pattern is described. The substrate is heated in a chamber with a plasma comprised of Ar and O2. A USG liner is deposited in two steps wherein the first step is without an RF bias and the second step is with a moderate RF bias that does not damage the metal lines or an anti-reflective coating on the metal. The moderate RF bias is critical in forming a sputtering component that redeposits USG to form more uniform sidewalls and better coverage at top corners of metal lines. The USG deposition process has a good gap filling capability and significantly reduces device failure rate by preventing corrosion of metal lines during subsequent thermal process cycles. The method also includes a PECVD deposited FSG layer that is planarized to complete an IMD layer.
    Type: Grant
    Filed: April 23, 2003
    Date of Patent: October 11, 2005
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Pong-Hsiung Leu, Yu-Min Chang, Fang-Wen Tsai, Jo-Wei Chen, Wan-Cheng Yang, Chyi-Tsong Ni
  • Publication number: 20050080499
    Abstract: A digital audio system has a register for storing data bits of digital audio signals, a multiplexer having a plurality of input ends connected to the register for selecting outputting data bits of the digital audio signals stored in the register, a shift controller connected to a selection end of the multiplexer for outputting corresponding bits according to the right-shifted number of bits of the data bits, and a digital to analog converter connected to an output end of the multiplexer for converting the digital audio signals into analog audio signals.
    Type: Application
    Filed: February 4, 2004
    Publication date: April 14, 2005
    Inventor: Yu-Min Chang
  • Publication number: 20040213921
    Abstract: A HDP CVD process for depositing a USG liner followed by a FSG dielectric layer on a metal line pattern is described. The substrate is heated in a chamber with a plasma comprised of Ar and O2. A USG liner is deposited in two steps wherein the first step is without an RF bias and the second step is with a moderate RF bias that does not damage the metal lines or an anti-reflective coating on the metal. The moderate RF bias is critical in forming a sputtering component that redeposits USG to form more uniform sidewalls and better coverage at top corners of metal lines. The USG deposition process has a good gap filling capability and significantly reduces device failure rate by preventing corrosion of metal lines during subsequent thermal process cycles. The method also includes a PECVD deposited FSG layer that is planarized to complete an IMD layer.
    Type: Application
    Filed: April 23, 2003
    Publication date: October 28, 2004
    Applicant: Taiwan Semiconductor Manufacturing Co.
    Inventors: Pong-Hsiung Leu, Yu-Min Chang, Fang-Wen Tsai, Jo-Wei Chen, Wan-Cheng Yang, Chyi-Tsong Ni