Abstract: A memory including a plurality of memory cells, a sensing load, a reference load, a control circuit and a comparator. Each of the memory cells can store a bit data and provide a driving current according to the bit data. The sensing load is driven by the driving current and a driving voltage to generate a sensing voltage, and the reference load is driven by the driving voltage to generate a reference voltage. The control circuit can control the driving voltage to drive the sensing load or the reference load such that the sensing voltage or the reference voltage is kept constant while the driving current changes. The comparator is for comparing the sensing voltage with the reference voltage and therefore determining the bit data stored in the memory cell that provides the driving current.

Abstract: A design method for full chip element on the memory, the method splits the elements in the Hard macro into the elements with transistor level for the automation design. In the situation when there are more than 2 high voltage circuits, the method provides multiple bypass circuits as the V SS and V DD, wherein the V SS and V DD are two powers that can be recognized by the software. The multiple high voltage circuits are used as the signal circuits for routing, so that the objective of running the auto-routing on all elements in the Hard macro can be achieved. The schematic design in the Hard macro is subsequently integrated into the other part to accomplish the full chip auto placement and routing.

Abstract: A non-volatile memory unit includes memory units for providing a data current corresponding to stored data; a first load unit having a first end; a second load unit having a second end; and a sensing unit. The first load unit and the second load unit can receive current input to build voltages respectively at the first end and the second end. When the memory unit provides the data current, the second load unit is enabled such that the data current inputs into the first load unit and the second load unit; then the second load is disabled after a predetermined time such that the data current inputs into the first load unit only, and the sensing unit generates a data signal for data-acquisition according to a voltage difference between the voltage at the first end and a reference voltage.

Abstract: A word line driver includes an address decoder having a first circuit and a second circuit for selecting the word line, and a control end disposed between the first circuit and the second circuit. In addition, the word line driver has a level shift circuit for shifting a voltage level of the word line, and the level shift circuit has an input end connected to the second circuit of the address decoder. A method of driving a word line includes shifting a voltage level of the control end while turning on the second circuit so as to shift a voltage level of the input end of the level shift circuit, and shifting a voltage level of at least one of the first and second power supplies and using the second circuit to isolate the voltage level of the control end from the voltage level of the word line.

Abstract: A page mode flash memory or floating gate memory device, including a page buffer based upon low current bit latches, and additional capabilities for parallel read and parallel program verify operations. The present device includes bit latch circuitry and/or method steps that facilitate such parallel operations and avoid data conflicts. Circuitry for separate read signals can serve to isolate the operations. Additionally, circuitry tied to the data verification signal can also be used. A diode type device can be used to isolate signal conditions that might indicate the cell does not need to be programmed. Bit-by-bit precharging of the bit lines can also be employed in order to save precharging power. Additionally, the large capacitance of the dataline might be used to delay discharging a particular dataline, and thereby allow a latch enabling signal to go high, thus eliminating the need for further isolation circuitry, or the like.

Abstract: A circuit and a method are disclosed for a Schmitt trigger stage which converts transistor-transistor logic (TTL) into metal oxide semiconductor (MOS) logic signal levels using all MOS devices. The circuit reduces the standby current of the n-channel transistor of the input section of the Schmitt trigger stage by adding a MOS diode to the bottom the input section. When higher than normal supply voltages are used, the standby current of the p-channel transistor of the input section can be reduced by adding a MOS diode to the top of the input section. In addition, a small MOS transistor, connected across the output Schmitt trigger inverter, eliminates leakage currents in that inverter.