Patents by Inventor Yuichiro Ikeda

Yuichiro Ikeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200257993
    Abstract: An information processing system includes: a failure detector, a first failure handling unit and a second failure handling unit. The failure detector detects any of inference processing apparatuses in which a failure has occurred. The first failure handling unit causes another inference processing apparatus other than the inference processing apparatus in which the failure has occurred to execute an inference process of the inference processing apparatus in which the failure has occurred. The second failure handling unit inputs a result of an inference process at a preceding stage of the inference processing apparatus in which the failure has occurred to the another inference processing apparatus and outputs an inference result that the another inference processing apparatus generates based on the input inference result to an inference processing apparatus at a subsequent stage of the inference processing apparatus in which the failure has occurred.
    Type: Application
    Filed: January 23, 2020
    Publication date: August 13, 2020
    Applicant: FUJITSU CLIENT COMPUTING LIMITED
    Inventors: Yuichiro Ikeda, Masatoshi Kimura, Tomohiro Ishida, Kai Mihara
  • Publication number: 20200257994
    Abstract: An inference processing system includes inference processing devices and performs inference processing such that a succeeding inference processing device performs inference processing to a result of inference processing by a preceding inference processing device.
    Type: Application
    Filed: January 23, 2020
    Publication date: August 13, 2020
    Applicant: FUJITSU CLIENT COMPUTING LIMITED
    Inventors: Yuichiro Ikeda, Masatoshi Kimura, Tomohiro Ishida, Kai Mihara
  • Publication number: 20200210866
    Abstract: An information processing device includes: a main processor. The main processor receives resource information related to a processing status from each of N processors assuming that N is an integral number equal to or larger than 2, applies the received resource information of the N processors to a computational expression, and calculates processing times corresponding to a processing request from an application for the respective N processors, selects one processor from among the N processors based on the processing times of the N processors, and transmits the processing request to the one processor.
    Type: Application
    Filed: November 21, 2019
    Publication date: July 2, 2020
    Applicant: FUJITSU CLIENT COMPUTING LIMITED
    Inventors: Yuichiro Ikeda, Kai Mihara
  • Patent number: 10641790
    Abstract: Provided is a scanning probe microscope being able to shorten an observation time of a minute observation object. Main measurement is performed to acquire a surface image of a sample based on a detection signal in a measurement range of a plurality of lines by repeating, for each line, processing of scanning a cantilever at predetermined second intervals in a Y-direction after acquiring the detection signal at predetermined first intervals while scanning the cantilever on a line having a predetermined length along an X-direction. Preliminary measurement is performed to acquire a surface image of the sample by acquiring the detection signal at intervals wider than the first intervals or scanning the cantilever in the Y-direction at intervals wider than the second intervals before the main measurement, the surface image of the sample being coarser than the surface image in the main measurement.
    Type: Grant
    Filed: March 1, 2019
    Date of Patent: May 5, 2020
    Assignee: Shimadzu Corporation
    Inventors: Kazuma Watanabe, Keita Fujino, Eiji Iida, Masato Hirade, Kenji Yamasaki, Hideo Nakajima, Yuichiro Ikeda, Hiroshi Arai
  • Patent number: 10598691
    Abstract: A scanning probe microscope includes a light source, a detector, a housing, an opening and closing door, an opening and closing sensor, a control unit, and the like. The opening and closing door is provided in the housing. The control unit 16 also functions as the light intensity change processing unit 164. In the scanning probe microscope, when the opening and closing sensor detects opening and closing of the opening and closing door, the light intensity change processing unit automatically changes the intensity of light irradiated from the light source based on a detection result of the opening and closing sensor. Therefore, it is possible to omit light intensity adjustment work performed manually by the user. As a result, the workability of the user when using the scanning probe microscope 1 can be improved.
    Type: Grant
    Filed: March 1, 2019
    Date of Patent: March 24, 2020
    Assignee: Shimadzu Corporation
    Inventors: Kazuma Watanabe, Keita Fujino, Eiji Iida, Masato Hirade, Kenji Yamasaki, Hideo Nakajima, Yuichiro Ikeda, Hiroshi Arai
  • Patent number: 10546073
    Abstract: A communication simulating system includes: a communication recording device that records, into a vehicle condition database, a vehicle condition including a step, a place and a vehicle stringed together, vehicle state information that has been input as communication content between a vehicle electric equipment system and a vehicle communication apparatus in a step performed at a predetermined place; a vehicle state information acquiring device that acquires vehicle state information from the vehicle condition database in accordance with a selected vehicle condition; a storage unit that stores communication definition files specifying the respective ones of the same processes as the communication processes executed by a plurality of ECUs included in the vehicle electric equipment system; and a communication control device that communicates with a vehicle communication apparatus in accordance with the communication process and the vehicle state information.
    Type: Grant
    Filed: March 8, 2013
    Date of Patent: January 28, 2020
    Assignee: HONDA MOTOR CO., LTD.
    Inventors: Yosuke Morita, Katsunori Miyazawa, Yuki Harada, Yuichiro Ikeda, Akiei Satani
  • Patent number: 10476613
    Abstract: An inspection terminal measures a wireless quality of a host machine during inspection of an object to be inspected, and acquires performance measurement data indicative of the wireless quality. An environment measuring device measures a radio wave intensity in the vicinity of the host machine during inspection of the object to be inspected, and acquires environment measurement data indicative of the radio wave intensity. A movable body (vehicle) which is the object to be inspected, or a movable body that transports the object to be inspected, moves together with the inspection terminal and the environment measuring device, through execution points of a plurality of inspection processes performed within an inspection area. A LET server associates the performance measurement data and the environment measurement data with measurement times and/or the inspection processes.
    Type: Grant
    Filed: August 27, 2018
    Date of Patent: November 12, 2019
    Assignee: HONDA MOTOR CO., LTD.
    Inventors: Yuichiro Ikeda, Kanata Yamashita, Masaaki Kawamata
  • Publication number: 20190331711
    Abstract: A scanning probe microscope includes a light source, a detector, a housing, an opening and closing door, an opening and closing sensor, a control unit, and the like. The opening and closing door is provided in the housing. The control unit 16 also functions as the light intensity change processing unit 164. In the scanning probe microscope, when the opening and closing sensor detects opening and closing of the opening and closing door, the light intensity change processing unit automatically changes the intensity of light irradiated from the light source based on a detection result of the opening and closing sensor. Therefore, it is possible to omit light intensity adjustment work performed manually by the user. As a result, the workability of the user when using the scanning probe microscope 1 can be improved.
    Type: Application
    Filed: March 1, 2019
    Publication date: October 31, 2019
    Inventors: Kazuma WATANABE, Keita FUJINO, Eiji IIDA, Masato HIRADE, Kenji YAMASAKI, Hideo NAKAJIMA, Yuichiro IKEDA, Hiroshi ARAI
  • Publication number: 20190324053
    Abstract: Provided is a scanning probe microscope being able to shorten an observation time of a minute observation object. Main measurement is performed to acquire a surface image of a sample based on a detection signal in a measurement range of a plurality of lines by repeating, for each line, processing of scanning a cantilever at predetermined second intervals in a Y-direction after acquiring the detection signal at predetermined first intervals while scanning the cantilever on a line having a predetermined length along an X-direction. Preliminary measurement is performed to acquire a surface image of the sample by acquiring the detection signal at intervals wider than the first intervals or scanning the cantilever in the Y-direction at intervals wider than the second intervals before the main measurement, the surface image of the sample being coarser than the surface image in the main measurement.
    Type: Application
    Filed: March 1, 2019
    Publication date: October 24, 2019
    Inventors: Kazuma WATANABE, Keita FUJINO, Eiji IIDA, Masato HIRADE, Kenji YAMASAKI, Hideo NAKAJIMA, Yuichiro IKEDA, Hiroshi ARAI
  • Publication number: 20190068299
    Abstract: An inspection terminal measures a wireless quality of a host machine during inspection of an object to be inspected, and acquires performance measurement data indicative of the wireless quality. An environment measuring device measures a radio wave intensity in the vicinity of the host machine during inspection of the object to be inspected, and acquires environment measurement data indicative of the radio wave intensity. A movable body (vehicle) which is the object to be inspected, or a movable body that transports the object to be inspected, moves together with the inspection terminal and the environment measuring device, through execution points of a plurality of inspection processes performed within an inspection area. A LET server associates the performance measurement data and the environment measurement data with measurement times and/or the inspection processes.
    Type: Application
    Filed: August 27, 2018
    Publication date: February 28, 2019
    Inventors: Yuichiro Ikeda, Kanata Yamashita, Masaaki Kawamata
  • Publication number: 20190051583
    Abstract: A semiconductor device PKG includes a semiconductor chip CP, a lead LD3, a wire BW5 electrically connecting a pad electrode PD2 of the semiconductor chip CP to the lead LD3, a wire BW3 electrically connecting a pad electrode PD3 of the semiconductor chip CP to the lead LD3, and a sealing body sealing them with a resin. The semiconductor chip CP includes internal circuits 5b and 5c, and a switch circuit unit SW. Signal transmission is possible between the internal circuit 5c and the pad electrode PD3. The switch circuit unit SW is a circuit capable of being set in a first state in which signal transmission is possible between the internal circuit 5b and the pad electrode PD2, and in a second state in which signal transmission is not possible between the internal circuit 5b and the pad electrode PD2. The switch circuit unit SW is fixed to the second state during operation of the semiconductor device PKG.
    Type: Application
    Filed: October 16, 2018
    Publication date: February 14, 2019
    Applicant: Renesas Electronics Corporation
    Inventors: Yuichiro IKEDA, Satoshi KOTANI
  • Patent number: 10128172
    Abstract: A semiconductor device PKG includes a semiconductor chip CP, a lead LD3, a wire BW5 electrically connecting a pad electrode PD2 of the semiconductor chip CP to the lead LD3, a wire BW3 electrically connecting a pad electrode PD3 of the semiconductor chip CP to the lead LD3, and a sealing body sealing them with a resin. The semiconductor chip CP includes internal circuits 5b and 5c, and a switch circuit unit SW. Signal transmission is possible between the internal circuit 5c and the pad electrode PD3. The switch circuit unit SW is a circuit capable of being set in a first state in which signal transmission is possible between the internal circuit 5b and the pad electrode PD2, and in a second state in which signal transmission is not possible between the internal circuit 5b and the pad electrode PD2. The switch circuit unit SW is fixed to the second state during operation of the semiconductor device PKG.
    Type: Grant
    Filed: January 31, 2018
    Date of Patent: November 13, 2018
    Assignee: Renesas Electronics Corporation
    Inventors: Yuichiro Ikeda, Satoshi Kotani
  • Publication number: 20180204788
    Abstract: A semiconductor device PKG includes a semiconductor chip CP, a lead LD3, a wire BW5 electrically connecting a pad electrode PD2 of the semiconductor chip CP to the lead LD3, a wire BW3 electrically connecting a pad electrode PD3 of the semiconductor chip CP to the lead LD3, and a sealing body sealing them with a resin. The semiconductor chip CP includes internal circuits 5b and 5c, and a switch circuit unit SW. Signal transmission is possible between the internal circuit 5c and the pad electrode PD3. The switch circuit unit SW is a circuit capable of being set in a first state in which signal transmission is possible between the internal circuit 5b and the pad electrode PD2, and in a second state in which signal transmission is not possible between the internal circuit 5b and the pad electrode PD2. The switch circuit unit SW is fixed to the second state during operation of the semiconductor device PKG.
    Type: Application
    Filed: January 31, 2018
    Publication date: July 19, 2018
    Applicant: Renesas Electronics Corporation
    Inventors: Yuichiro Ikeda, Satoshi Kotani
  • Patent number: 9917037
    Abstract: A semiconductor device PKG includes a semiconductor chip CP, a lead LD3, a wire BW5 electrically connecting a pad electrode PD2 of the semiconductor chip CP to the lead LD3, a wire BW3 electrically connecting a pad electrode PD3 of the semiconductor chip CP to the lead LD3, and a sealing body sealing them with a resin. The semiconductor chip CP includes internal circuits 5b and 5c, and a switch circuit unit SW. Signal transmission is possible between the internal circuit 5c and the pad electrode PD3. The switch circuit unit SW is a circuit capable of being set in a first state in which signal transmission is possible between the internal circuit 5b and the pad electrode PD2, and in a second state in which signal transmission is not possible between the internal circuit 5b and the pad electrode PD2. The switch circuit unit SW is fixed to the second state during operation of the semiconductor device PKG.
    Type: Grant
    Filed: January 22, 2015
    Date of Patent: March 13, 2018
    Assignee: Renesas Electronics Corporation
    Inventors: Yuichiro Ikeda, Satoshi Kotani
  • Publication number: 20170350920
    Abstract: The invention provides a scanning probe microscope capable of eliminating the influence of vibration noise and obtaining, accurately and with high resolution, surface information of a sample S. A scanning probe microscope 1 includes: a main body unit 10; a control unit 30; and a wireless stand 60 that is connected to the control unit 30 through a power supply signal cable 42 and includes a power supplying coil 63 and a transmission and reception unit 64. The main body unit 10 includes: a cantilever 21 with a probe 21a; a sensor 23 for detecting displacement of the cantilever 21; an XYZ drive mechanism 25 that is controlled by the control unit 30 to move the cantilever 21 or the sample S; a vibration isolation mechanism 12; a power receiving coil 13; and a transmission and reception unit 14 for communicating with the transmission and reception unit 64.
    Type: Application
    Filed: October 24, 2014
    Publication date: December 7, 2017
    Applicant: SHIMADZU CORPORATION
    Inventor: Yuichiro IKEDA
  • Publication number: 20170309551
    Abstract: A semiconductor device PKG includes a semiconductor chip CP, a lead LD3, a wire BW5 electrically connecting a pad electrode PD2 of the semiconductor chip CP to the lead LD3, a wire BW3 electrically connecting a pad electrode PD3 of the semiconductor chip CP to the lead LD3, and a sealing body sealing them with a resin. The semiconductor chip CP includes internal circuits 5b and 5c, and a switch circuit unit SW. Signal transmission is possible between the internal circuit 5c and the pad electrode PD3. The switch circuit unit SW is a circuit capable of being set in a first state in which signal transmission is possible between the internal circuit 5b and the pad electrode PD2, and in a second state in which signal transmission is not possible between the internal circuit 5b and the pad electrode PD2. The switch circuit unit SW is fixed to the second state during operation of the semiconductor device PKG.
    Type: Application
    Filed: January 22, 2015
    Publication date: October 26, 2017
    Applicant: Renesas Electronics Corporation
    Inventors: Yuichiro IKEDA, Satoshi KOTANI
  • Patent number: 9251896
    Abstract: In a method for writing into a variable resistance nonvolatile memory device according to one aspect of the present disclosure, a verify write operation of newly applying a voltage pulse for changing a resistance state is performed on a variable resistance element which does not satisfy a determination condition for verifying that the resistance state has been changed despite application of a voltage pulse for changing the resistance state, and the determination condition in the verify write operation is relaxed when an average number of times of verify write operation, having already been performed on all or part of a plurality of variable resistance elements that are targets for write operation, exceeds a predetermined number of times.
    Type: Grant
    Filed: April 21, 2014
    Date of Patent: February 2, 2016
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Yuichiro Ikeda, Kazuhiko Shimakawa, Yoshikazu Katoh, Ken Kawai
  • Patent number: 9114489
    Abstract: This disclosure provides a method of adjusting capacities of combustion chambers of a multi-cylinder engine having a cylinder head with recessed parts that partially form the combustion chambers and a mating surface for mating with a cylinder block, which includes casting a cylinder head material having flat reference surfaces on top of the recessed parts of the cylinder head, machining the cylinder head material to form the mating surface, measuring distances in a height direction from the mating surface to the reference surfaces, respectively, and adjusting machining margins of machining portions of the reference surfaces of the recessed parts based on the measured height direction distances.
    Type: Grant
    Filed: May 3, 2011
    Date of Patent: August 25, 2015
    Assignee: Mazda Motor Corporation
    Inventors: Tsuyoshi Yamamoto, Yasushi Nakahara, Takayuki Yamada, Kazuya Hayashi, Yuichiro Ikeda
  • Patent number: 9105332
    Abstract: Provided is a variable resistance element (Rij) the resistance state of which is reversibly changed by applying electrical signals of different polarities; and a current steering element (Dij) in which a first current is larger than a second current, the first current being a current which flows when a voltage of the first polarity having a first value is applied, the first value being less than a predetermined voltage value and having an absolute value greater than zero, the second current being a current which flows when a voltage of the second polarity having an absolute value which is the first value is applied, the second polarity being different from the first polarity, in which Rij and Dij are connected in series such that the polarity of a voltage to be applied to Dij is the second polarity when the resistance state of Rij is changed to high resistance state.
    Type: Grant
    Filed: March 7, 2013
    Date of Patent: August 11, 2015
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Yuichiro Ikeda, Kazuhiko Shimakawa, Koji Katayama, Takumi Mikawa, Kiyotaka Tsuji
  • Patent number: 9001557
    Abstract: Provided is a method of writing to a variable resistance nonvolatile memory element which is capable of both improving retention characteristics and enlarging a window of operation. In the method of writing, to write “1” data (LR), first a weak HR writing process is performed in which a weak HR writing voltage pulse set for changing the variable resistance nonvolatile memory element to an intermediate resistance state is applied and, subsequently, a LR writing process is performed in which a LR writing voltage pulse set for changing the variable resistance nonvolatile memory element from the intermediate resistance state to a LR state is applied.
    Type: Grant
    Filed: November 21, 2012
    Date of Patent: April 7, 2015
    Assignee: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Ken Kawai, Kazuhiko Shimakawa, Yoshikazu Katoh, Yuichiro Ikeda