Abstract: A controller of an information processing device changes a current state among standby states including a first standby state, a second standby state, and a third standby state, in which power consumption decreases in this order. When the non-operation duration runs for a first period, the controller changes the current state from the first standby state to the second standby state. When the non-operation duration subsequently runs for a second period, the controller changes the current state from the second standby state to the third standby state. When the sensor detects a detection target in the second standby state or the third standby state, the controller changes the current state to the first standby state. When the non-operation duration runs for a third period starting from state change, the controller changes the current state from the first standby state to the previous standby state.

Abstract: An image forming apparatus operates in a normal mode in a first electric power state and in a power saving mode in which more electric power is saved than in the first electric power state. The image forming apparatus includes a motion sensor, an operation section, and a controller. The controller executes a first timer process in response to receipt of the detection signal and executes a second timer process in response to receipt of the operation signal. At a time when a first period elapses indicating that the first timer process times out, the controller transitions from the normal mode to the power saving mode. At a time when a second period elapses indicating that the second timer process times out, the controller transitions from the normal mode to the power saving mode. The first period is shorter than the second period.

Abstract: An image forming apparatus includes a sensor, an operation section, a controller, and a communication section. The sensor detects a sensor target. The operation section receives an operation instruction. The controller adjusts a sensitivity level of the sensor. The communication section transmits an instruction signal and a reception signal to an external device and receives an adjustment instruction from the external device. The instruction signal indicates an instruction for sensitivity level adjustment for the sensor. The adjustment instruction is an instruction as to whether or not to adjust the sensitivity level based on the instruction signal and the reception signal. The reception signal includes first information indicating time of detection signal reception by the controller receives the detection signal within a specific time period and second information indicating whether the operation section receives the operation instruction.

Abstract: An image forming apparatus includes a sensor, an operation section, and a controller. The sensor detects a sensor target. The operation section receives an operation instruction. The controller executes a setting process for controlling the sensor. The setting process is a process to adjust a sensitivity of the sensor according to detection precision. The detection precision is a relationship in a first unit period between the number of times the sensor detects the sensor target and the number of times of the operation section receives the operation instruction.

Abstract: A controller of an information processing device changes a current state among standby states including a first standby state, a second standby state, and a third standby state, in which power consumption decreases in this order. When the non-operation duration runs for a first period, the controller changes the current state from the first standby state to the second standby state. When the non-operation duration subsequently runs for a second period, the controller changes the current state from the second standby state to the third standby state. When the sensor detects a detection target in the second standby state or the third standby state, the controller changes the current state to the first standby state. When the non-operation duration runs for a third period starting from state change, the controller changes the current state from the first standby state to the previous standby state.

Abstract: An image forming apparatus includes a sensor, an operation section, a controller, and a communication section. The sensor detects a sensor target. The operation section receives an operation instruction. The controller adjusts a sensitivity level of the sensor. The communication section transmits an instruction signal and a reception signal to an external device and receives an adjustment instruction from the external device. The instruction signal indicates an instruction for sensitivity level adjustment for the sensor. The adjustment instruction is an instruction as to whether or not to adjust the sensitivity level based on the instruction signal and the reception signal. The reception signal includes first information indicating time of detection signal reception by the controller receives the detection signal within a specific time period and second information indicating whether the operation section receives the operation instruction.

Abstract: A method for manufacturing a fuel cell separator that ensures an improved corrosion resistance under usage environment of a fuel cell and restraining an increase of a contact resistance with a power generation unit by enhancing a sticking force of a conductive carbon film formed on a surface in contact with the power generation unit on a surface of a titanium substrate is provided. It is a method for manufacturing a fuel cell separator. The fuel cell separator includes a contact portion that is in contact with a power generation unit so as to partition the power generation units including electrodes of the fuel cell, and includes a conductive carbon film formed on the contact portion. First, a titanium substrate that has a plurality of projecting portions formed corresponding to a shape of the contact portion and recessed portions for gas flow channels formed between the projecting portions are prepared as a substrate of the separator.

Abstract: A semiconductor device includes a semiconductor substrate having a first surface and a second surface, first to eighth regions, a first thyristor, and a second thyristor. The seventh region with the impurity concentration higher than that of the first region is formed in the first region while being apart from the sixth region electrically connected to the gate electrode, and being electrically connected to the first electrode. The eighth region with the impurity concentration higher than that of the third region is formed in contact with the second surface side of the third region and the fourth region, and with the second surface, while being electrically connected to the fourth region by the second electrode. The seventh region has the impurity concentration higher than that of the first region. The eighth region has the impurity concentration higher than that of the third region.

Abstract: In a defect inspection device that irradiates a surface of a sample or a surface of a pattern chip with an illumination light shaped to extend in a first direction, and detects a scattered light generated from the surface of the sample or the surface of the pattern chip by the illumination light to detect a defect on the surface of the sample, the pattern chip has a dot pattern area in which multiple dots are arrayed in multiple rows and multiple columns, a minimum interval between the dots corresponding to the lines aligned in the first direction among the multiple dots arrayed in the dot pattern area in a second direction orthogonal to the first direction is smaller than a width of the illumination light, and a minimum interval between the multiple dots arrayed in the dot pattern area is larger than a resolution of the detection optical system.

Abstract: To keep up with achievement of the TEC value and suppressing the wear-out of hardware. An image forming apparatus of the present disclosure, which is configured to transit, after an elapse of a sleep-transition time, to enter a power-saving state in which power supply destinations are limited when compared to a normal state, includes a power amount prediction unit and an extension control unit. The power amount prediction unit acquires, whenever a state-transition is made, a power-consumption amount during an immediate preceding power-saving state to calculate a predicted power-consumption amount in a specific period based on the power-consumption amount. The extension control unit gives priority to the sleep-transition to enter the power-saving state if the predicted power-consumption amount exceeds the TEC value corresponding to the specific period, while extends the sleep-transition time if the predicted power-consumption amount fails to exceed the TEC value corresponding to the specific period.

Abstract: A semiconductor device includes a semiconductor substrate having a first surface and a second surface, first to eighth regions, a first thyristor, and a second thyristor. The seventh region with the impurity concentration higher than that of the first region is formed in the first region while being apart from the sixth region electrically connected to the gate electrode, and being electrically connected to the first electrode. The eighth region with the impurity concentration higher than that of the third region is formed in contact with the second surface side of the third region and the fourth region, and with the second surface, while being electrically connected to the fourth region by the second electrode. The seventh region has the impurity concentration higher than that of the first region. The eighth region has the impurity concentration higher than that of the third region.

Abstract: To increase the illumination efficiency by facilitating the change of the incident angle of illumination light with a narrow illumination width according to an inspection object and enabling an illumination region to be effectively irradiated with light, provided is a defect inspection method for obliquely irradiating a sample mounted on a table that is moving continuously in one direction with illumination light, collecting scattered light from the sample obliquely irradiated with the illumination light, detecting an image of the surface of the sample formed by the scattered light, processing a signal obtained by detecting the image formed by the scattered light, and extracting a defect candidate, wherein the oblique irradiation of the light is implemented by linearly collecting light emitted from a light source, and obliquely projecting the collected light onto the surface of the sample, thereby illuminating a linear region on the surface of the sample.

Abstract: To provide an information processing device that facilitates an audience to transmit information thereto. This information processing device is configured to include a memory part having an audience area and to be connected with first (presenter side) and second (audience side) terminals. The audience area records a various kinds of information including a presentation material of plural page numbers. The device operates to (1) read out only a character string added with a page number selected by the second terminal from the memory part and causes the second terminal to output the resulting string, (2) record additionally an information combination on an audience writing area which is formed of a character string entered from the second terminal, the selected page number, and a terminal ID, and (3) cause the first terminal to read out the information combination added with the selected page number and to output the resulting information combination.

Abstract: An image forming apparatus has an image forming unit, a punch mechanism, a display unit, a hole formation request receiving unit, a demand input receiving unit, a region designating unit, an extraction unit, a selection unit, and a punch mechanism control unit. The demand input receiving unit receives an input of a demand about punch hole formation from a user. The region designating unit designates a region in which a punch hole is to be formed by the punch mechanism through the display unit. The extraction unit extracts punch hole formation portion candidates having a printing rate lower than a predetermined value in the designated region. The selection unit causes a user to select the hole formation portion satisfying the demand. The punch mechanism control unit performs control so that the punch hole formation by the punch mechanism is carried out in the selected hole formation portion.

Abstract: To increase the illumination efficiency by facilitating the change of the incident angle of illumination light with a narrow illumination width according to an inspection object and enabling an illumination region to be effectively irradiated with light, provided is a defect inspection method for obliquely irradiating a sample mounted on a table that is moving continuously in one direction with illumination light, collecting scattered light from the sample obliquely irradiated with the illumination light, detecting an image of the surface of the sample formed by the scattered light, processing a signal obtained by detecting the image formed by the scattered light, and extracting a defect candidate, wherein the oblique irradiation of the light is implemented by linearly collecting light emitted from a light source, and obliquely projecting the collected light onto the surface of the sample, thereby illuminating a linear region on the surface of the sample.

Abstract: A defect inspection device inspecting a sample includes a movable table on which the sample as an inspection object and a pattern chip are mounted, an illumination light irradiation unit which irradiates a surface of the sample or a surface of the pattern chip with linearly-formed illumination light, a detection optical system section where a plurality of detection optical systems are disposed at a plurality of positions above the table and which detect images of scattered light generated from the sample, and a signal processing unit which processes detected signals to detect a defect of the sample surface, and a plurality of repeating patterns for generating the scattered light according to positions of the objective lenses of the plurality of detection optical systems of the detection optical system section when the linearly-formed illumination light is irradiated by the illumination light irradiation unit are periodically formed in the pattern chip.

Abstract: An image forming apparatus has an image forming unit, a punch mechanism, a display unit, a hole formation request receiving unit, a demand input receiving unit, a region designating unit, an extraction unit, a selection unit, and a punch mechanism control unit. The demand input receiving unit receives an input of a demand about punch hole formation from a user. The region designating unit designates a region in which a punch hole is to be formed by the punch mechanism through the display unit. The extraction unit extracts punch hole formation portion candidates having a printing rate lower than a predetermined value in the designated region. The selection unit causes a user to select the hole formation portion satisfying the demand. The punch mechanism control unit performs control so that the punch hole formation by the punch mechanism is carried out in the selected hole formation portion.

Abstract: A defect-inspection device includes an irradiation unit having an objective-pupil-optical unit that allows illumination light linearly condensed by a first light-condensing unit to pass through, and an objective lens that allows the illumination light having passed through the objective-pupil-optical unit to pass through; an irradiation-position-control unit that controls a passing position of the illumination light in the objective-pupil-optical unit disposed at a pupil surface of the objective lens; a detection unit having a second light-condensing unit that condenses light irradiated by the irradiation unit and generated from a sample, a specular-reflection light-blocking unit that blocks specular-reflection light from the sample and light components generated near the pupil surface among the light beams condensed by the second light-condensing unit, and an image-forming unit that images the light that is condensed by the second light-condensing unit and is not blocked by the specular-reflection light-bloc

Abstract: To increase the illumination efficiency by facilitating the change of the incident angle of illumination light with a narrow illumination width according to an inspection object and enabling an illumination region to be effectively irradiated with light, provided is a defect inspection method for obliquely irradiating a sample mounted on a table that is moving continuously in one direction with illumination light, collecting scattered light from the sample obliquely irradiated with the illumination light, detecting an image of the surface of the sample formed by the scattered light, processing a signal obtained by detecting the image formed by the scattered light, and extracting a defect candidate, wherein the oblique irradiation of the light is implemented by linearly collecting light emitted from a light source, and obliquely projecting the collected light onto the surface of the sample, thereby illuminating a linear region on the surface of the sample.

Abstract: A defect inspection device inspecting a sample includes a movable table on which the sample as an inspection object and a pattern chip are mounted, an illumination light irradiation unit which irradiates a surface of the sample or a surface of the pattern chip with linearly-formed illumination light, a detection optical system section where a plurality of detection optical systems are disposed at a plurality of positions above the table and which detect images of scattered light generated from the sample, and a signal processing unit which processes detected signals to detect a defect of the sample surface, and a plurality of repeating patterns for generating the scattered light according to positions of the objective lenses of the plurality of detection optical systems of the detection optical system section when the linearly-formed illumination light is irradiated by the illumination light irradiation unit are periodically formed in the pattern chip.