Patents by Inventor Yun-Sung Na
Yun-Sung Na has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20100097089Abstract: When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.Type: ApplicationFiled: December 10, 2009Publication date: April 22, 2010Applicant: TECHWING CO. LTD.Inventors: Jae-Gyun SHIM, Yun-Sung NA, In-Gu JEON, Tae-Hung KU, Hyun-Jun YOO
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Patent number: 7696745Abstract: Operation methods of test handler are disclosed. The pick-and-place apparatus picks up semiconductor devices from first loading compartments arrayed in a matrix on a first loading element, moves, and places onto second loading compartments arrayed in a matrix on a second loading element. Pickers of the pick-and-place apparatus pick up the semiconductor devices from the first loading compartments and place them selectively onto a plurality of adjacent odd rows or a plurality of adjacent even rows of the second loading compartments during one operation. The pick-and-place apparatus includes a relatively large number of the pickers, preferably arrayed in a matrix, and thus performs loading and unloading of semiconductor devices at a relatively high speed.Type: GrantFiled: March 20, 2008Date of Patent: April 13, 2010Assignee: TechWing Co., Ltd.Inventors: Yun Sung Na, In Gu Jeon, Dong Hyun Yo, Hyun Song
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Patent number: 7667453Abstract: The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.Type: GrantFiled: July 10, 2008Date of Patent: February 23, 2010Assignee: Techwing Co., Ltd.Inventors: Jae Gyun Shim, Yun Sung Na, In Gu Jeon, Tae Hung Ku, Hyun Jun Yoo
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Patent number: 7656150Abstract: When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.Type: GrantFiled: January 25, 2007Date of Patent: February 2, 2010Assignee: TechWing Co., Ltd.Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Hyun-Jun Yoo
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Patent number: 7656152Abstract: A pusher for a match plate of a test handler is disclosed which assists a tester to test the produced semiconductor devices. The pusher includes: a body part installed to an installation plate; and a pushing part that extends forward from a front side of the body part, for pushing a semiconductor device placed on an insert of a test tray. The pusher forms: an air through hole that extends through from a rear side of the body part to the front side of the pushing part, for guiding air of a certain temperature, supplied to the rear side of the body part from a duct, to be supplied to the semiconductor device; and at least one or more air outflow holes that extend through from at least one side of the pushing part and communicate with the air through hole, for allowing part of the air supplied from the duct through the air through hole to flow out to a test site. The pusher can reduce the temperature deviation of semiconductor devices at the test site.Type: GrantFiled: March 7, 2008Date of Patent: February 2, 2010Assignee: TechWing Co. LtdInventors: Yun Sung Na, In Gu Jeon, Dong Han Kim, Jae woo Jang
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Publication number: 20100019790Abstract: A test handler (122) of the present invention includes a main body, a window (142) formed on a surface of the main body and having a size corresponding to a Hi-Fix board of M×N array (where M and N represent an integer greater than a value of =), a cover (170) detachably fixed to the main body t close a part of the window and convert the window into the test site having a size corresponding to a [M?A)×(n?B)] Hi-Fix board (where A is an integer equal to or greater than 0 but smaller than M, and B is an integer having a value other than 0). In the test handler, the size of window is easily modified to adapt that of the Hi-Fix board of M×N array by closing or opening a part of the window using the cover. Therefore, the test handler is capable of applying Hi-Fix boards having different sizes.Type: ApplicationFiled: October 6, 2009Publication date: January 28, 2010Inventors: JAE GYUN SHIM, Yun Sung Na, In Gu Jeon
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Publication number: 20100001753Abstract: A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.Type: ApplicationFiled: April 20, 2009Publication date: January 7, 2010Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Dong-Han Kim
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Publication number: 20100001739Abstract: A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.Type: ApplicationFiled: October 22, 2007Publication date: January 7, 2010Applicant: TechWing., CO. LTDInventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Jung-Woo Hwang
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Publication number: 20090297301Abstract: A pick-and-place apparatus is disclosed, which transfers and loads semiconductor devices between first and second loading elements. The semiconductor devices are loadable and arrangeable at a first row interval in the first loading element, and alternatively arrangeable at second and third row intervals in the second loading element. The pick-and-place apparatus includes a multiplicity of picking unit modules, each of which has at least one or more picking units; and an interval regulation apparatus for regulating intervals between the picking unit modules at the first to third modes. The first to third row interval values are different from each other. The intervals between the picking unit modules are all regulated to be identical to the first row interval at the first mode. The intervals between the picking unit modules are alternately regulated to the second row interval and the third row interval in turn at the second mode.Type: ApplicationFiled: June 26, 2007Publication date: December 3, 2009Applicant: TECHWING., CO. LTDInventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Dong Hyun Yo
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Publication number: 20090245982Abstract: A unit for opening an insert of a test tray which comprises an accommodating space for accommodating a semiconductor device and a support for supporting the semiconductor device accommodated in the accommodating space, the unit includes a body, a pair of opening devices provided in the body to open the insert, and a positioning guide unit protruding to be inserted into an accommodating space for a semiconductor device when opening the insert and supporting the semiconductor device that is transferred into the accommodating space to be spaced upward apart from a support provided in the accommodating space.Type: ApplicationFiled: March 19, 2009Publication date: October 1, 2009Applicant: TECHWING CO., LTD.Inventors: Yun Sung NA, Tae Hung KU, Jung Woo HWANG
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Publication number: 20090230201Abstract: A system to support the testing of electronic devices and a temperature control unit for the system are disclosed. A temperature controlling method for a chamber of the system is also disclosed. Low or high temperature air is supplied to the inside of the chamber when the electronic devices are tested at low or high temperature. External air is supplied to the inside of the chamber when the electronic devices are tested at room temperature.Type: ApplicationFiled: March 9, 2009Publication date: September 17, 2009Applicant: TECHWING CO., LTD.Inventors: Yun-Sung NA, Tae-Hung KU, Cheul-Gyu BOO
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Publication number: 20090199395Abstract: In a side-docking type test handler, a descending mechanism lowers a horizontally postured test tray, which has been transferred into a soak chamber, down to a descent finish position and a vertical posture changing mechanism changes the posture of the test tray, which has been lowered to the descent finish position, from the horizontal state to a vertical state, to transfer the test tray into a test chamber. Further, a horizontal posture changing mechanism changes the posture of the test tray in the test chamber from the vertical state to the horizontal state while transferring the test tray to an ascent start position in a desoak chamber.Type: ApplicationFiled: March 31, 2009Publication date: August 13, 2009Applicant: TECHWING CO., LTD.Inventors: Jae Gyun Shim, Yun Sung Na, In Gu Jeon, Dong-Hyun Yo, Bong-Soo Kim, Choung-Min Joung
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Publication number: 20090196719Abstract: An insert for a carrier board of a test handler is disclosed. The insert pocket having hooks is detachably coupled to the insert body. The insert body can be reused. The latch apparatus is installed to the insert pocket, so that the damaged latch apparatus can be easily replaced. The insert has a plurality of holes in the bottom of the loading part thereof, to expose the leads of the semiconductor devices through the holes in the lower direction. Thus, the insert can load semiconductor devices regardless of the sizes of the semiconductor devices.Type: ApplicationFiled: January 29, 2009Publication date: August 6, 2009Applicant: TECHWING CO., LTD.Inventors: Yun-Sung Na, Dong-Han Kim, Young-Yong Kim
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Patent number: 7557564Abstract: A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.Type: GrantFiled: March 28, 2007Date of Patent: July 7, 2009Assignee: TechWing Co., Ltd.Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Jae-Sung Park, Su-Myung Lee
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Publication number: 20090153178Abstract: The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.Type: ApplicationFiled: February 20, 2009Publication date: June 18, 2009Applicant: TECHWING CO., LTD.Inventors: Jae Gyun SHIM, Yun Sung NA, In Gu JEON, Tae Hung KU, Dong Han KIM
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Publication number: 20090148257Abstract: A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.Type: ApplicationFiled: February 10, 2009Publication date: June 11, 2009Applicant: TECHWING CO. LTDInventors: Jae-Gyun SHIM, Yun-Sung NA, In-Gu JEON, Tae-Hung KU, Jae-Sung PARK, Su-myung LEE
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Patent number: 7538542Abstract: A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.Type: GrantFiled: December 15, 2006Date of Patent: May 26, 2009Assignee: TechWing., Co. Ltd.Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Dong-Han Kim
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Publication number: 20080298946Abstract: A test handler is disclosed, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time. Also, the present invention can be easily applied to various types of testers.Type: ApplicationFiled: February 9, 2007Publication date: December 4, 2008Applicant: TECHWING CO., LTD.Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Dong-Han Kim
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Publication number: 20080284186Abstract: A pick and place apparatus includes a 1st to an nth device holding element arranged in a lengthwise direction, every one of the 1st to the nth device holding element being connected to its neighboring one(s) of the 1st to the nth device holding element by means of at least one pitch setting ring; a belt having a first coupling part at an upper part thereof for being coupled to the 1st device holding element and a second coupling part at a lower part thereof for being coupled to the nth device holding element; and a driven pulley and a differential pulley. The driven and the differential pulley are rotated by being engaged with the belt to move the 1st and the nth device holding element such that the 1st device holding element moves in a direction opposite to the nth device holding element.Type: ApplicationFiled: November 15, 2006Publication date: November 20, 2008Applicant: TECHWING CO., LTD.Inventors: Jae Gyun Shim, Yun Sung Na, In Gu Jeon, Tae Hung Ku, Dong Hyun Yo
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Publication number: 20080272764Abstract: The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.Type: ApplicationFiled: July 10, 2008Publication date: November 6, 2008Applicant: TECHWING CO., LTD.Inventors: Jae Gyun Shim, Yun Sung Na, In Gu Jeon, Tae Hung Ku, Hyun Jun Yoo