Abstract: A pipelined Analog-to-Digital Converter (ADC) includes circuitry to characterize capacitors associated with a Multiplying-Digital-to-Analog Converter (MDAC) of a stage of said pipelined ADC, said capacitors contributing to a gain of said pipelined ADC, circuitry to connect a subset of said capacitors not currently being characterized to reference signals of said pipelined ADC such that a residue signal of said stage stays within an input range of an instrument measuring said residue signal, circuitry to calculate said gain of said pipelined ADC using said capacitor characterizations, and an output adjusting component to digitally change an output of said pipelined ADC to compensate for said calculated gain.

Abstract: A time-interleaved Analog-to-Digital Converter (ADC) includes a set of sub-ADC circuits. Each sub-ADC circuit comprises a sample-and-hold circuit. Each sample-and-hold circuit includes a bootstrap circuit for maintaining a constant voltage level between an input terminal of a switch and a gate terminal of the switch, the switch for switching between a sample mode and a hold mode. Each sample and hold circuit also includes a capacitor bank associated with the bootstrap circuit such that a setting of the capacitor bank affects an ON state intrinsic resistance of the switch by affecting the voltage level.

Abstract: A time-interleaved Analog-to-Digital Converter (ADC) includes a set of sub-ADC circuits. Each sub-ADC circuit comprises a sample-and-hold circuit. Each sample-and-hold circuit includes a bootstrap circuit for maintaining a constant voltage level between an input terminal of a switch and a gate terminal of the switch, the switch for switching between a sample mode and a hold mode. Each sample and hold circuit also includes a capacitor bank associated with the bootstrap circuit such that a setting of the capacitor bank affects an ON state intrinsic resistance of the switch by affecting the voltage level.

Abstract: A reference buffer amplifier within an integrated circuit includes a first output terminal connected to a first bond pad, the first bond pad being connected to a first external pin of the integrated circuit chip, the first external pin to allow an external capacitance to be connected to the output terminal. The reference buffer further includes a variable, settable resistance sub-circuit connected to a second bond pad, the second bond pad also being connected to the first external pin. The resistance sub-circuit is configured to be set to exhibit a resistance value to critically dampen a response of the reference buffer amplifier.

Abstract: A method for measuring electric current applied to a load includes: with a sensor element having an inaccuracy, measuring an electric current supplied to a load to produce a measurement of the electric current; with the sensor element, measuring the electric current with an added perturbation current; and using measurements of the electric current taken with and without the perturbation current to refine the measurement of the electric current.

Abstract: A time-interleaved sample-and-hold system includes a first sample-and-hold circuit and a second sample-and-hold circuit. The first sample-and-hold circuit and the second sample-and-hold circuit share a common sampling switch. A method of remediating a timing offset between a first sample-and-hold circuit and a second sample-and-hold circuit in a time-interleaved sample-and-hold system includes switching at least one shunt capacitor disposed between two logic gates in a timing circuit to adjust a delay between a timing signal for a common sampling switch electrically coupled to the first and second sample-and-hold circuits and a timing signal for at least one of the sample-and-hold circuits.

Abstract: A method for measuring electric current applied to a load includes: with a sensor element having an inaccuracy, measuring an electric current supplied to a load to produce a measurement of the electric current; with the sensor element, measuring the electric current with an added perturbation current; and using measurements of the electric current taken with and without the perturbation current to refine the measurement of the electric current.

Abstract: A current-mode analog-to-digital converter includes: a current input node; a current-mode sample and hold circuit configured to output a steady source of electrical current having an analog value proportional to a sampled analog value of an electrical current at the current input node; and at least one current comparator that compares the electrical current output by the current-mode sample and hold circuit to at least one reference current to produce a digital representation of the sampled analog value of the electrical current at the current input node.

Abstract: A current-mode analog-to-digital converter includes: a current input node; a current-mode sample and hold circuit configured to output a steady source of electrical current having an analog value proportional to a sampled analog value of an electrical current at the current input node; and at least one current comparator that compares the electrical current output by the current-mode sample and hold circuit to at least one reference current to produce a digital representation of the sampled analog value of the electrical current at the current input node.

Abstract: The present invention is related to digital to analog converter (DAC) input data encryption off-chip and decryption on-chip to suppress input data in-band harmonic leakage through package related parasitic capacitance. More specifically, the present invention relates to the method and apparatus of input data encryption off-chip by forming the logical exclusive-OR of the raw data and a random single bit data stream. The encrypted data is then read onto the DAC chip where the data is decrypted using identical circuitry and an identical random single bit data stream. The off-chip encryption isolates harmonic content within the input data, preventing leakage of input data harmonic content through IC package-related parasitic capacitance into DAC outputs. Any leakage appears as an increase in spectral noise rather than output distortion and as such, has a much smaller impact on DAC narrow band linearity.

Abstract: The present invention is related to digital to analog converter (DAC) input data encryption off-chip and decryption on-chip to suppress input data in-band harmonic leakage through package related parasitic capacitance. More specifically, the present invention relates to the method and apparatus of input data encryption off-chip by forming the logical exclusive-OR of the raw data and a random single bit data stream. The encrypted data is then read onto the DAC chip where the data is decrypted using identical circuitry and an identical random single bit data stream. The off-chip encryption isolates harmonic content within the input data, preventing leakage of input data harmonic content through IC package-related parasitic capacitance into DAC outputs. Any leakage appears as an increase in spectral noise rather than output distortion and as such, has a much smaller impact on DAC narrow band linearity.

Abstract: A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system. The technique employs test circuits associated with each row driver of the detector. The test circuits are enabled by a test enable signal, and the row driver sequentially enables the rows of the detector, along with the individual test circuits. In a test sequence, output signals from the row test circuits are monitored to identify whether a defect, such as a short circuit, is likely to exist in the row or row driver. The test circuitry adds only minimal area and complexity to the row driver function, providing a high degree of test coverage at a low cost, with minimal likelihood of test circuitry-induced failures.

Abstract: An integrated circuit may include matched cells each having an active transconductor, wherein the matched cells are coupled together through respective active transconductor circuits to average the effect of comparator input-referred offsets. Each cell of the matched cells may have a first differential gain stage coupled to a second differential gain stage that is coupled to an output buffer stage, and an associated active transconductor circuit. The active transconductor of each cell is coupled to the gain stage of other cells to average the effect of cell mismatches.

Abstract: A power level sense circuit which is substantially immune to variations in integrated circuit processing and operating temperature. The sense circuit uses a diode biased to a predetermined average conduction level as the primary element in an envelope detector to detect the envelope of the RF transmit signal. While the DC offset of the diode will vary with temperature and integrated circuit processing, the DC offset is eliminated by an auto zeroing procedure before each power sensing cycle.

Abstract: A logic signal level translation method and apparatus having very low dropout with respect to the powering rails and having a tri-state mode of operation allowing the output terminal to be driven to voltages beyond the highest supply voltage coupled thereto without significant power dissipation within the circuit. The output circuit includes well or body snatching devices which are controlled to assure that the wells of the output devices are able to follow extremes in voltage of the output terminal without biasing to conduction a PN junction of one or more of the output devices. A preferred embodiment is disclosed.

Abstract: The invention relates to a self-biasing, programmable, universal active filter having an input section which includes an operational amplifier. The amplifier has one output and two input terminals. A first capacitor has one of its terminals coupled to a first of the input terminals of the amplifier and the other terminal serving as an input node to the filter. The second capacitor is coupled between the same input terminal and the output terminal. The filter has a bandpass section having an output and an input coupled to the output terminal of the amplifier. The filter has a low pass section having an output and an input coupled to the output of the bandpass section. The filter has a third capacitor coupled between the first input terminal of the amplifier and the output of the bandpass section.

Abstract: A unique frequency doubler circuit is utilized which requires only a handful of standard components such as operational amplifier, logic gates, resistors, capacitors and switches. In contrast to certain prior art frequency doublers, frequency doublers constructed in accordance with the teachings of this invention do not require the use of a phase lock loop, thereby resulting in a substantial simplification of circuit construction. Furthermore, frequency doublers constructed in accordance with this invention utilize a feedback technique which assures that the duty cycle of the output signal will be 50%, or any other predefined value.

Abstract: A phase locked loop circuit (16) includes means to eliminate harmonic frequency locking. The phase locked loop includes a voltage controlled oscillator (1) which provides an output signal (V.sub.out) which is compared with the input signal (V.sub.in) by a phase detector (4). The output signal from the phase detector is integrated and the output signal of the integrator (7) is placed on the control input lead of the voltage controlled oscillator. The output signal of the voltage controlled oscillator is provided to a frequency detector (14, 17) which determines if the output frequency is within a predefined range. If the output frequency is above the predetermined range, a limiter circuit (15) provides a low voltage output signal to the control input lead of the VCO in order to pull the input voltage of the VCO to a voltage which corresponds with the appropriate operating range of the phase locked loop.

Abstract: A single-shot circuit is fabricated as an integrated circuit except for a single capacitor requiring a single pin to connect to the on-chip circuitry. The single-shot is rendered independent of process variations and operating conditions by incorporating an analog feedback loop. The output of the single shot is detected by an analog circuit which includes a positive and negative voltage generator the ratio of whose voltages is a function of the desired duty cycle. The generators are actuated, respectively, when a pulse exists and when there is no pulse. The analog feedback circuit also includes an integrator for receiving and integrating the positive and negative voltages from the generators. The integrated and amplified voltages are fed back to the last stage of the single-shot circuit. When the duty cycle is high, the voltage that is fed back drives the single shot circuit to reduce the pulse width.

Abstract: A carrier detection circuit includes a rectification stage, an integrator, a comparator, and a digital counter. By utilizing a digital counter, long time constants are provided without the use of external components. If desired, a mark detect circuit is used when a mark must be present to signify the presence of carrier. Hysteresis is provided by the comparator to insure that slight fluctuations in the carrier level do not affect the comparison.