Abstract: A field plate causes excessive gate capacitance that interferes with high-speed transistor switching. To suppress the excessive gate capacitance, an aperture includes a first side wall positioned on the side of a drain electrode, and a second side wall positioned on the side of a source electrode. A gate electrode at the same time includes a first side surface facing opposite the drain electrode as seen from a plan view. The first side surface of the gate electrode is positioned on the inner side of the first side wall and the second side wall as seen from a flat view. Moreover, a portion of a first field plate is embedded between the first side surface and the first side wall. The gate electrode and the first field plate are electrically insulated by a first insulation member.

Abstract: An object of the present invention is to suppress an error in the value detected by a pressure sensor, which may be caused when environmental temperature varies. A semiconductor substrate has a first conductivity type. A semiconductor layer is formed over a first surface of the semiconductor substrate. Each of resistance parts has a second conductivity type, and is formed in the semiconductor layer. The resistance parts are spaced apart from each other. A separation region is a region of the first conductivity type formed in the semiconductor layer, and electrically separates the resistance parts from each other. A depressed portion is formed in a second surface of the semiconductor substrate, and overlaps the resistance parts, when viewed planarly. The semiconductor layer is an epitaxial layer.

Abstract: A buried layer of a second conductivity type and a lower layer of a second conductivity type are formed in a drift layer. A boundary insulating film is formed in the boundary between the lateral portion of the buried layer of a second conductivity type and the drift layer. The lower layer of a second conductivity type is in contact with the lower end of the buried layer of a second conductivity type and the lower end of the boundary insulating film. The buried layer of a second conductivity type is electrically connected to a source electrode. A high-concentration layer of a second conductivity type is formed in the surface layer of the buried layer of a second conductivity type.

Abstract: A semiconductor chip includes a first circuit and a second circuit having different reference potentials. A first potential which is a reference potential of the first circuit is applied to the semiconductor chip through any of plural lead terminals, and a second potential which is a reference potential of the second circuit is applied to the semiconductor chip through any of plural lead terminals. A substrate of the semiconductor chip has a structure in which a buried insulating layer and a semiconductor layer of a first conductivity type are laminated on a semiconductor substrate such as a SOI substrate. A fixed potential is applied to the semiconductor substrate through a die pad and a lead terminal for a substrate potential. The fixed potential is applied to the semiconductor chip through a different route from the reference potential of the first circuit and the reference potential of the second circuit.

Abstract: According to an aspect of the invention, a semiconductor device includes a substrate having an opening area, a first semiconductor chip, and a second semiconductor chip. The first semiconductor chip has a first electrode for high-speed communication and that is disposed around the opening area on the substrate. The second semiconductor chip has a second electrode and third electrode for power and low-speed communication and that is disposed on the first semiconductor chip so that the first electrode is coupled with the second electrode by electrostatic coupling and dielectric coupling, the third electrode facing the opening area.

Abstract: In a memory/logic conjugate system, a plurality of cluster memory chips each including a plurality of cluster memories (20) including basic cells (10) arranged in a cluster, the basic cell including a memory circuit, and a controller chip that controls the plurality of cluster memories are three-dimensionally stacked, the plurality of cluster memories located along the stacking direction of the plurality of cluster memory chips and the controller chip are electrically coupled to the controller chip via a multibus (11) including a through-via, an arbitrary one of the basic cells is directly accessed through the multibus from the controller chip so that truth value data is written therein, and whereby the arbitrary basic cell is switched to a logic circuit as conjugate.

Abstract: A printed circuit board includes a ground layer, a power source layer, a signal wiring layer, an insulating layer and an electromagnetic radiation suppressing member. The power source layer is provided to be opposed to the ground layer. The signal wiring layer transmits a signal in a predetermined frequency domain. The insulating layer insulates the ground layer, the power source layer and the signal wiring layer from one another. The electromagnetic radiation suppressing member is provided to cover a circumferential edge of the insulating layer. The electromagnetic radiation suppressing member has a negative dielectric constant and a positive magnetic permeability in a frequency domain including the predetermined frequency domain.

Abstract: A bandwidth bottleneck occurs because a crossbar switch is used to cope with an increase in scale. A memory/logic conjugate system according to the present invention, a plurality of cluster memory chips each including a plurality of cluster memories 20 including basic cells 10 arranged in a cluster, the basic cell 10 including a memory circuit, and a controller chip that controls the plurality of cluster memories are three-dimensionally stacked, the plurality of cluster memories 20 located along the stacking direction of the plurality of cluster memory chips and the controller chip are electrically coupled to the controller chip via a multibus 11 including a through-via, an arbitrary one of the basic cells 10 is directly accessed through the multibus 11 from the controller chip so that truth value data is written therein, and whereby the arbitrary basic cell 10 is switched to a logic circuit as conjugate.

Abstract: To provide a semiconductor device in which an interval between first wells can be shortened by improving a separation breakdown voltage between the first wells and a method for manufacturing the same.

Abstract: There is a problem that a bandwidth bottleneck occurs because a crossbar switch is used to cope with an increase in scale. In an example of a memory/logic conjugate system according to the present invention, a plurality of cluster memory chips each including a plurality of cluster memories 20 including basic cells 10 arranged in a cluster, the basic cell 10 including a memory circuit, and a controller chip that controls the plurality of cluster memories are three-dimensionally stacked, the plurality of cluster memories 20 located along the stacking direction of the plurality of cluster memory chips and the controller chip are electrically coupled to the controller chip via a multibus 11 including a through-via, an arbitrary one of the basic cells 10 is directly accessed through the multibus 11 from the controller chip so that truth value data is written therein, and whereby the arbitrary basic cell 10 is switched to a logic circuit as conjugate.

Abstract: An image sensor array is provided with: first and second CCD image sensors that output a plurality of first and second signal voltages from first and second output terminals, respectively; a switch circuit selectively connecting one of the first and second output terminals to a signal voltage output terminal; and a timing generator circuit responsive to a basic clock generating first and second control signals and switch control signals. First and second control signals control generation of the first and second signal voltages, respectively. The switch control signals are used for controlling the switch circuit. The timing generator circuit controls the first and second CCD image sensors so that the first and second CCD image sensors alternately output the first and second signal voltages. The timing generator circuit controls the switch circuit to alternately output from the signal voltage output terminal one of the first and second signal voltages.

Abstract: A signal transmission circuit includes a transmitting circuit for outputting a transmitting signal to a transmission line, a parallel circuit including a capacitor and a first resistance connected between an output terminal of the transmitting circuit and the transmission line, and a series circuit including an inductor and a second resistance connected between an output side of the parallel circuit and a ground.

Abstract: Disclosed is a paired low-characteristic impedance power line and ground line structure in which loop inductance is substantially 0. The paired low-characteristic impedance power line and ground line structure includes a laminated sheet in which a metal wiring layer having a power line and a ground line is provided on the surface of an insulating sheet, an insulating thin-film layer provided so as to cover the power line and the ground line, and a resistive layer provided on the surface of the insulating thin-film layer.

Abstract: A semiconductor integrated circuit package, a printed circuit board, a semiconductor apparatus, and a power supply wiring structure that allow attainment of stable power source and ground wiring without causing resonance even in a high-frequency bandwidth are provided. In an interior portion of the package, a power source wiring and a ground wiring constitute a pair wiring structure in which the power source wiring and the ground wiring are juxtaposed at a predetermined interval so as to establish electromagnetic coupling therebetween. A plurality of pair wiring structures are combined in such a manner that, when viewed in a section perpendicular to a wiring extending direction, the pair wiring assembly assumes a staggered (checkered) configuration. It is preferable that, each of the silicon chip and the printed circuit board, like the package, has pair wiring structures disposed inside.

Abstract: A wire (a twisted pair cable) that transmits a gigahertz band signal and that is provided with a pair of core wires that are twisted with each other, a first insulation coating material, a second insulation coating material, and a shield material that shields evanescent waves emitted from the pair of core wires. The pair of core wires have a twisting pitch, a diameter, and a spacing so that the wire has a characteristic impedance of 100 to 200? and the phases of the TEM (Transverse Electro-Magnetic) wave and the evanescent wave that are emitted from the pair of core wires are matched.

Abstract: An antenna apparatus utilizing an aperture of transmission line, which is connected to a first transmission line having a predetermined characteristic impedance, includes a tapered line portion, and an aperture portion. The tapered line portion is connected to one end of the transmission line, and the tapered line portion includes a second transmission line including a pair of line conductors. The tapered line portion keeps a predetermined characteristic impedance constant and expands at least one of a width of the transmission line and an interval in a tapered shape at a predetermined taper angle. The aperture portion has a radiation aperture connected to one end of the tapered line portion. A size of one side of the aperture end plane of the aperture portion is set to be equal to or higher than a quarter wavelength of the minimum operating frequency of the antenna apparatus.

Abstract: According to an aspect of the invention, a semiconductor device includes a substrate having an opening area, a first semiconductor chip, and a second semiconductor chip. The first semiconductor chip has a first electrode for high-speed communication and that is disposed around the opening area on the substrate. The second semiconductor chip has a second electrode and third electrode for power and low-speed communication and that is disposed on the first semiconductor chip so that the first electrode is coupled with the second electrode by electrostatic coupling and dielectric coupling, the third electrode facing the opening area.

Abstract: The object of the invention is to provide a semiconductor device including signal-transmission interconnections preferable for transmitting high frequency signal and capability to adjust characteristics of the above signal-transmission interconnections. A semiconductor device according to the present invention consists of a signal-transmission interconnection 20 for transmission of signals, a MOS capacitance element 10 having a gate electrode connected to the signal-transmission interconnection 20, a first voltage-applying interconnection 30 connected to a source and a drain of the MOS capacitance element 10 and applying a voltage to the source and the drain of the MOS capacitance element 10, a second voltage-applying interconnection 40 connected to a well of the MOS capacitance element 10, and applying a voltage to the well of said first MOS capacitance element 10.

Abstract: Disclosed is an electrostatic discharge protection circuit capable of realizing speeding up of differential signals by reducing a capacitance of the circuit. Transmission lines are connected to an IN terminal and an IN Bar terminal and differential signals are input to the terminals. The ESD protection circuit is connected to the transmission lines and protects an internal circuit from a surge voltage applied to the IN terminal and the IN Bar terminal. A pair of transistors of the ESD protection circuit is formed in the same well. Thereby, when differential signals transit, charges in drains of the pair of transistors holding a state before a transition transfer in the same well. As a result, the capacitances in the drains of the pair of transistors are reduced with respect to the transition of differential signals so that the speeding up of differential signals can be realized.

Abstract: To provide a semiconductor device in which an interval between first wells can be shortened by improving a separation breakdown voltage between the first wells and a method for manufacturing the same.