Patents by Inventor Zheng Yang
Zheng Yang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12329535Abstract: A measuring system for measuring an object, the measuring system comprising a capture device comprising a set of illumination elements for illuminating the object and a set of cameras for capturing an image of the object, and a controlling and processing unit. The controlling and processing unit comprises at least a data acquisition functionality which is configured to provide surface data by activating at least a part of the set of illumination elements for illuminating the object with measuring light and capturing at least one image by detecting measuring light reflected at the object by means of at least a part of the set of cameras.Type: GrantFiled: August 4, 2023Date of Patent: June 17, 2025Assignee: HEXAGON TECHNOLOGY CENTER GMBHInventors: Gemma Taverni, Hakki Karaman, Stefan Geissbühler, Simon Mark, Zheng Yang, Burkhard Böckem, Lukas Buchmann, Sandra Tobler, Jan Glückert, Markus Wettstein
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Patent number: 12332431Abstract: The invention relates to a lens objective system comprising a lens objective comprising a set of optical elements, the optical properties of the optical elements induce optical aberrations of the lens objective. The system comprises an optical compensation element configured to manipulate a propagation path of light transmitting the optical compensation element, wherein the optical compensation element is configured and arranged relative to the lens objective so that the lateral offset caused by pupil aberration is reduced.Type: GrantFiled: December 3, 2021Date of Patent: June 17, 2025Assignee: HEXAGON TECHNOLOGY CENTER GMBHInventor: Zheng Yang
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Publication number: 20250164235Abstract: A measuring device for imaging an object, including a light emitting unit configured to emit polarised measuring light, a light receiving unit configured to receive and detect reflected measuring light, and a support structure which comprises a retro-reflective layer and a polarisation state manipulation layer. The support structure provides retro-reflecting of the measuring light and changing a polarisation state of the measuring light such that the polarisation state of incident measuring light is different relative to the polarisation state of retro-reflected measuring light. The measuring device comprises a polarisation selecting unit configured to provide selecting either reflected measuring light with a first polarisation state or with a second polarisation state.Type: ApplicationFiled: November 21, 2024Publication date: May 22, 2025Applicant: HEXAGON TECHNOLOGY CENTER GMBHInventors: Danick BRÜHLMANN, Thomas JENSEN, Zheng YANG, Frank PRZYGODDA, Johan STIGWALL
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Patent number: 12289526Abstract: A metrology system comprising a target object, a metrology instrument and a control unit configured for controlling an alignment of the targeting unit and for deriving an orientation of the target object. The metrology instrument comprises a zoom objective, an illumination unit and a time-of-flight sensor comprising an array of pixels and capable of providing range data for each pixel of the array as point cloud data, the time-of-flight sensor provides the distance measuring device. The control unit comprises an object determination functionality which provides receiving the point cloud data provided by the time-of-flight sensor, deriving a digital representation of the target object by processing the point cloud data, comparing the digital representation of the target object with a reference pattern of the target object, and determining the orientation of the target object based on the comparison of the digital representation of the target object with the reference pattern.Type: GrantFiled: December 9, 2022Date of Patent: April 29, 2025Assignee: HEXAGON TECHNOLOGY CENTER GMBHInventors: Johan Stigwall, Zheng Yang, Thomas Jensen
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Patent number: 12266573Abstract: In an embodiment, a device includes: an isolation region on a substrate; a first semiconductor fin protruding above the isolation region; a second semiconductor fin protruding above the isolation region; and a dielectric fin between the first semiconductor fin and the second semiconductor fin, the dielectric fin protruding above the isolation region, the dielectric fin including: a first layer including a first dielectric material having a first carbon concentration; and a second layer on the first layer, the second layer including a second dielectric material having a second carbon concentration, the second carbon concentration greater than the first carbon concentration.Type: GrantFiled: September 23, 2021Date of Patent: April 1, 2025Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Yi Chen Ho, Yiting Chang, Chi-Hsun Lin, Zheng-Yang Pan
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Publication number: 20250102503Abstract: Systems and methods for detecting an analyte include test wands configured to employ immunochromatographic assay with new fluorescent labeling technology, a reading device that can specifically identify signals from wands and sync information to the mobile devices. The systems may quantitatively detect progesterone metabolites and hormones in urine to track the level changes, confirm ovulation, and/or evaluate menstruation status. The systems and methods assess and track an individual's ovulation cycle by monitoring a hormone pattern of that specific individual and establishing a dynamic threshold as a baseline for changes in the specific subject's hormones. The systems and methods further include enhancing the accuracy and reliability of lateral flow immunoassays through generation of signal curves plotting signal intensity versus time and comparative analysis of signal intensity over time to assess flowability within an assay and improve overall assay performance.Type: ApplicationFiled: September 20, 2024Publication date: March 27, 2025Inventors: Sara Marska-Maj, Sylvia M. Kang, Zheng Yang, Chang-Yi Huang
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Publication number: 20250098259Abstract: Embodiments of the present disclosure provide semiconductor device structures and methods of forming the same. The method includes forming a first fin structure and a second fin structure from a substrate, depositing a first conformal layer over the first and second fin structures and between the first and second fin structures, depositing a second conformal layer on the first conformal layer, depositing a third conformal layer on the second conformal layer, depositing a fourth conformal layer on the third conformal layer, depositing a first insulating material on the fourth conformal layer between the first and second fin structures, and depositing a second insulating material on the first insulating material. The first and second fin structures are embedded by the second insulating material. The method further includes removing portions of the second insulating material and the first, second, third, and fourth conformal layers to expose the first and second fin structures.Type: ApplicationFiled: September 14, 2023Publication date: March 20, 2025Inventors: Ya-Wen CHIU, Yi-Hua CHENG, Szu-Ying CHEN, Zheng-Yang PAN
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Patent number: 12247957Abstract: The present invention discloses a pin-on-disk type in-situ current-carrying friction testing system, and belongs to the technical field of friction performance testing. The friction testing system includes a pin-on-disk type friction pair, a current loading mechanism, and a magnetic field generating mechanism. The current loading mechanism includes a conductive terminal abutting against an annular sidewall of a disk specimen and used to guide a current in the disk specimen to flow along a horizontal direction, and the magnetic field generating mechanism is used to generate a magnetic field. When a pin specimen and a disk specimen rotate relatively, the pin specimen, the conductive terminal, and the magnetic field generating mechanism are relatively stationary, and an Ampere force generated by the current in the disk specimen flowing in the horizontal direction under the action of the magnetic field faces a support platform.Type: GrantFiled: November 15, 2024Date of Patent: March 11, 2025Assignee: JILIN UNIVERSITYInventors: Zhichao Ma, Chaofan Li, Jiakai Li, Zheng Yang, Wei Zhang, Hongcai Xie, Yicheng Li, Shuai Tong, Junming Xiong, Zixin Guo, Guoxiang Shen, Hongwei Zhao, Luquan Ren
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Publication number: 20250081549Abstract: Various embodiments of the present disclosure provide a semiconductor device structure. In one embodiment, the semiconductor device structure includes a plurality of semiconductor layers vertically stacked, a plurality of inner spacers, each being disposed between two adjacent semiconductor layers. The structure also includes a source/drain feature in contact with each of the inner spacers, a gate electrode layer surrounding a portion of each of the plurality of the semiconductor layers, and a cap layer disposed between the source/drain feature and each of the plurality of the semiconductor layers.Type: ApplicationFiled: August 30, 2023Publication date: March 6, 2025Inventors: Yu-Yu Chen, Zheng-Yang Pan, Ya-Wen Chiu
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Publication number: 20250056870Abstract: Embodiments of the present disclosure provide a method for selectively forming a seed layer over semiconductor fins. Some embodiments provide forming the selective seed layer using a mono-silane at an increased temperature. Some embodiments provide depositing a hetero-crystalline silicon cap layer over the bottom-up gap layer to improve gap filling and tune profiles of fin structures.Type: ApplicationFiled: August 11, 2023Publication date: February 13, 2025Inventors: Ya-Wen Chiu, De Jhong Liao, Yu-Yu Chen, Szu-Ying Chen, Zheng-Yang Pan
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Patent number: 12207061Abstract: A signal processing method and device of a MEMS microphone and a MEMS microphone are disclosed. The method comprises: acquiring a first electrical signal obtained by converting a received optical signal by an optical sensor disposed near a sound hole of the MEMS microphone; acquiring a second electrical signal output by the MEMS microphone; and judging that the second electrical signal is an interference signal when within a substantially overlapping time range, the first electrical signal acquired reaches a preset first threshold value and the second electrical signal acquired meets a preset condition.Type: GrantFiled: December 16, 2020Date of Patent: January 21, 2025Assignee: GOERTEK INC.Inventors: Dingyun Li, Kang An, Jie Wu, Kaifa Shu, Zheng Yang, Zongxia Zhu, Feifei Han
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Publication number: 20250009846Abstract: Provided is a recombinant protein, which contains a nerve growth factor (NGF) protein variant and a heterologous signal peptide linked to the NGF protein variant. Further provided are a combination containing an mRNA encoding the recombinant protein and a delivery vector, and the use thereof in the treatment of toxic/hereditary/metabolic peripheral neuropathy, nerve regeneration repair, and/or central nervous system degenerative diseases.Type: ApplicationFiled: August 24, 2022Publication date: January 9, 2025Inventors: Yingjie XU, Xiang YU, Wei XU, Wen YANG, Zheng YANG, Yu ZHANG
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Publication number: 20250006414Abstract: The present disclosure relates to a soft magnetic composite with a two-dimensional magnetic moment and a high working frequency band, and a preparation method therefor. According to an embodiment, the soft magnetic composite with a two-dimensional magnetic moment may comprise: an insulating matrix; and two-dimensional magnetic moment micropowder dispersed in the insulating matrix, wherein inside the two-dimensional magnetic moment micropowder, a magnetic moment is distributed in a specific two-dimensional plane. The soft magnetic composite with a two-dimensional magnetic moment of the present disclosure has a higher cut-off frequency than existing materials, and therefore can be widely applied in the field of high frequency microwave application.Type: ApplicationFiled: August 13, 2024Publication date: January 2, 2025Applicants: GUANGZHOU NEWLIFE NEW MATERIAL CO., LTD., LANZHOU UNIVERSITYInventors: Xiaoming WANG, Zheng YANG, Fashen LI, Chunsheng GUO, Liang QIAO, Tao WANG
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Patent number: 12184956Abstract: An imaging device includes a pixel array including a 4×4 grouping of pixel circuits. The 4×4 grouping of pixel circuits includes four rows and four columns of the pixel array. A plurality of bitlines includes a first bitline, a second bitline, a third bitline, and a fourth bitline. Each one of the first, second, third, and fourth bitlines is coupled to a respective four pixel circuits in the 4×4 grouping of pixel circuits. Each one of the first, second, third, and fourth bitlines is coupled to all four of the rows and to all four of the columns of the 4×4 grouping of pixel circuits.Type: GrantFiled: July 29, 2021Date of Patent: December 31, 2024Assignee: OMNIVISION TECHNOLOGIES, INC.Inventor: Zheng Yang
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Publication number: 20240420318Abstract: A measuring system for measuring an object, the measuring system comprising a capture device comprising a set of illumination elements for illuminating the object and a set of cameras for capturing an image of the object, and a controlling and processing unit. The controlling and processing unit comprises at least a data acquisition functionality which is configured to provide surface data by activating at least a part of the set of illumination elements for illuminating the object with measuring light and capturing at least one image by detecting measuring light reflected at the object by means of at least a part of the set of cameras.Type: ApplicationFiled: August 4, 2023Publication date: December 19, 2024Applicant: HEXAGON TECHNOLOGY CENTER GMBHInventors: Gemma TAVERNI, Hakki KARAMAN, Stefan GEISSBÜHLER, Simon MARK, Zheng YANG, Burkhard BÖCKEM, Lukas BUCHMANN, Sandra TOBLER, Jan GLÜCKERT, Markus WETTSTEIN
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Publication number: 20240418836Abstract: A time-of-flight pixel array includes first transistors to transfer a first phase portion of charge from photodiodes responsive to reflected modulated light during a first subframe, and a second phase portion of the charge during a second subframe. The second phase is an inverted first phase. Second transistors transfer the second phase portion of the charge during the first subframe, and the first phase portion of the charge during the second subframe. Third transistors transfer a third phase portion of the charge during the first subframe, and a fourth phase portion of the charge during the second subframe. The fourth phase is an inverted third phase. The third phase is ninety degrees out of phase with the first phase. Fourth transistors transfer the fourth phase portion of the charge during the first subframe, and the third phase portion of the charge during the second subframe.Type: ApplicationFiled: October 28, 2021Publication date: December 19, 2024Inventors: Zheng Yang, Andreas Suess
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Publication number: 20240415444Abstract: A method for identifying a surface property of the skin of a person, the method comprises acquiring surface data of the skin of the person by activating illumination elements for illuminating the skin of the person with measuring light and capturing at least one image by detecting measuring light reflected by the skin of the person by means of a camera, and providing a 3D model of the skin of the person by processing the surface data. The 3D model is provided in a virtual space and a virtual light source is provided in the virtual space to virtually illuminate the 3D model with illumination light, wherein illumination parameters of the virtual light source are variable.Type: ApplicationFiled: August 4, 2023Publication date: December 19, 2024Applicant: HEXAGON TECHNOLOGY CENTER GMBHInventors: Gemma TAVERNI, Hakki KARAMAN, Stefan GEISSBÜHLER, Simon MARK, Zheng YANG, Burkhard BÖCKEM, Lukas BUCHMANN, Sandra TOBLER, Jan GLÜCKERT, Markus WETTSTEIN
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Publication number: 20240420317Abstract: A measuring system for measuring an object, the measuring system comprising a capture device comprising a set of illumination elements for illuminating the object and a set of cameras for capturing an image of the object, and a controlling and processing unit. The controlling and processing unit comprises at least a data acquisition functionality which is configured to provide surface data by activating at least a part of the set of illumination elements for illuminating the object with measuring light and capturing at least one image by detecting measuring light reflected at the object by means of at least a part of the set of cameras and a 3D-modelling functionality which is configured to provide a 3D model of the object by processing the surface data.Type: ApplicationFiled: August 4, 2023Publication date: December 19, 2024Applicant: HEXAGON TECHNOLOGY CENTER GMBHInventors: Gemma TAVERNI, Hakki KARAMAN, Stefan GEISSBÜHLER, Simon MARK, Zheng YANG, Burkhard BÖCKEM, Lukas BUCHMANN, Sandra TOBLER, Jan GLÜCKERT, Markus WETTSTEIN
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Publication number: 20240395631Abstract: Some implementations described herein provide a method that includes forming a set of fins of a device, where the set of fins comprises an isolation fin disposed between a first fin and a second fin of the set of fins. The method also includes forming an isolation structure on at least one side of the isolation fin, with the isolation fin providing electrical isolation between the first fin and the second fin of the set of fins. Additionally, or alternatively, some implementations described herein provide a method that includes forming a funnel-shaped isolation structure between a first set of fins and a second set of fins. Additionally, or alternatively, some implementations described herein provide a method that includes forming, after forming a first gate structure and a second gate structure, an isolation structure between the first gate structure and the second gate structure.Type: ApplicationFiled: July 30, 2024Publication date: November 28, 2024Inventors: Yi Chen HO, Yu-Chuan CHEN, Chieh CHENG, Chi-Hsun LIN, Zheng-Yang PAN, Shahaji B. MORE
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Publication number: 20240379450Abstract: In an embodiment, a device includes: an isolation region on a substrate; a first semiconductor fin protruding above the isolation region; a second semiconductor fin protruding above the isolation region; and a dielectric fin between the first semiconductor fin and the second semiconductor fin, the dielectric fin protruding above the isolation region, the dielectric fin including: a first layer including a first dielectric material having a first carbon concentration; and a second layer on the first layer, the second layer including a second dielectric material having a second carbon concentration, the second carbon concentration greater than the first carbon concentration.Type: ApplicationFiled: July 22, 2024Publication date: November 14, 2024Inventors: Yi Chen Ho, Yiting Chang, Chi-Hsun Lin, Zheng-Yang Pan