Semiconductor device and method of manufacturing semiconductor device
A semiconductor device includes a semiconductor substrate; a first gate insulation film formed on the semiconductor substrate; a second gate insulation film formed on the semiconductor substrate; a first gate electrode formed on the first gate insulation film and fully silicided; and a second gate electrode formed on the second gate insulation film and fully silicided, a gate length or a gate width of the second gate electrode being larger than that of the first gate electrode, and a thickness of the second gate electrode being smaller than that of the first gate electrode.
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This application is based upon and claims the benefit of priority from the prior Japanese Patent Applications No. 2005-19293, filed on Jan. 27, 2005, the entire contents of which are incorporated herein by reference.
BACKGROUND OF THE INVENTION1. Field of the Invention
The present invention relates to a semiconductor device and a method of manufacturing the semiconductor device.
2. Background Art
In order to obtain a high-performance CMIS device, micropatterning of devices advances. With the micropatterning of devices, gate oxide films are reduced in thickness. when a gate electrode consists of polysilicon, a reduction in thickness of the gate oxide film disadvantageously depletes a gate electrode in switching of a gate electrode. When the thickness of the gate oxide film is lower than 1 nm, a percentage of a depletion capacity of the gate electrode to the capacity of the gate oxide film reaches 30%.
In order to cope with this problem, a technique used in a gate electrode consisting of a metal is proposed in place of a gate electrode consisting of polysilicon. For example, an FUSI (Fully-Silicide Gate) technique that completely suicides a gate electrode is known (see M. Kakumu et al., VLSI Tech. Dig. (1984), p. 30).
However, it is known that, when gate electrodes having various gate lengths or gate widths are formed on the same semiconductor substrate, all the gate electrodes cannot be easily fully silicided (see J. Kedzierski et al., IEDM Tech. Dig. (2003)). A gate electrode having a small gate length or a small gate width can be easily fully silicided due to a reverse thin-line effect. However, in contrast to this, a gate electrode having a large gate length and a large gate width tends to be silicided. In particular, since nickel has a large diffusion coefficient on an interface between the gate electrode and a side wall, the reverse thin-line effect becomes conspicuous. When a gate electrode, which is fully silicided, and a gate electrode, which is not fully silicided, are arranged on the same chip, the operation of the semiconductor device disadvantageously fluctuates.
The gate electrodes having different gate lengths or gate widths can be fully silicided by silicidation steps adapted to gate electrodes are repeated. However, such a method makes manufacturing processes cumbersome and elongates a manufacturing period. As a result, the cost of the semiconductor increases.
Therefore, a semiconductor device obtained by fully siliciding gate electrodes having different gate lengths or different gate widths to solve the above problem is desired. Further, a semiconductor device manufacturing method fully siliciding gate electrodes independent of the gate lengths or different gate widths.
SUMMARY OF THE INVENTIONAn advantage of an aspect of the present invention is to provide a semiconductor device obtained by fully siliciding gate electrodes having different gate lengths or different gate widths to solve the above problem, and to provide a semiconductor device manufacturing method fully siliciding gate electrodes independent of the gate lengths or different gate widths.
A semiconductor device according to an embodiment of the present invention comprises a semiconductor substrate; a first gate insulation film formed on the semiconductor substrate; a second gate insulation film formed on the semiconductor substrate; a first gate electrode formed on the first gate insulation film and fully silicided; and a second gate electrode formed on the second gate insulation film and fully silicided, a gate length or a gate width of the second gate electrode being larger than that of the first gate electrode, and a thickness of the second gate electrode being smaller than that of the first gate electrode.
A semiconductor device according to an embodiment of the present invention comprises a semiconductor substrate; a first gate insulation film formed on the semiconductor substrate; a second gate insulation film formed on the semiconductor substrate; a first gate electrode formed on the first gate insulation film and fully silicided; and a second gate electrode including a plurality of sub-gate electrodes formed on the second gate insulation film, the second gate electrode having a gate length or a gate width larger than that of the first gate electrode, wherein the plurality of sub-gate electrodes are fully silicided.
A semiconductor device according to an embodiment of the present invention comprises a semiconductor substrate; a first gate insulation film formed on the semiconductor substrate; a second gate insulation film formed on the semiconductor substrate; a first gate electrode formed on the first gate insulation film and fully silicided; a second gate electrode including particles and provided on the second gate insulation film and fully silicided, the area of the semiconductor substrate occupied by the second gate electrode being larger than that of the first gate electrode.
A method of manufacturing a semiconductor device according to an embodiment of the present invention comprises preparing a semiconductor substrate having a first surface region and a second surface region; epitaxially growing a semiconductor region on the second surface region; forming a first gate insulation film on the first surface region and forming a second gate insulation film on the semiconductor region; forming a first gate electrode on the first gate insulation film, and forming a second gate electrode on the second gate insulation film, the second gate electrode having a height equal to that of the first gate electrode and having a width larger than that of the first gate electrode; depositing a metal film on the first gate electrode and on the second gate electrode; and fully siliciding the first gate electrode and the second gate electrode.
A method of manufacturing a semiconductor device according to an embodiment of the present invention comprises preparing a semiconductor substrate having a first surface region and a second surface region; etching the semiconductor substrate of the first surface region; forming a first gate electrode on the first gate insulation film, and forming a second gate electrode on the second gate insulation film; forming a first gate electrode on the first gate insulation film, and forming a second gate electrode on the second gate insulation film, the second gate electrode having a height equal to that of the first gate electrode and having a width larger than that of the first gate electrode; covering source and drain diffusion layers or suicide electrodes with an interlayer insulation film, the source and drain diffusion layers or the silicide electrodes being formed on both sides of the first gate electrode and on both sides of the second gate electrode; polishing the interlayer insulation film to expose the upper surface of the first gate electrode and the upper surface of the second gate electrode; depositing a metal film on the first gate electrode and on the second gate electrode; and fully siliciding the first gate electrode and the second gate electrode.
A method of manufacturing a semiconductor device according to an embodiment of the present invention comprises preparing a semiconductor substrate having a first surface region and a second surface region; forming a first gate insulation film on the first surface region and forming a second gate insulation film on the second surface region; depositing a gate electrode material on the first and second gate insulation films; etching the gate electrode material on the first gate insulation film to form a first gate electrode and etching the gate electrode material on the second gate insulation film to form a second gate electrode which includes a plurality of sub-gate electrodes arranged on the second gate insulation film and which occupies an area larger than an area occupied by the first gate electrode on the semiconductor substrate; depositing a metal film on the first gate electrode and the second gate electrode; and fully siliciding the first gate electrode and the second gate electrode.
A method of manufacturing a semiconductor device according to an embodiment of the present invention comprises preparing a semiconductor substrate having a first surface region and a second surface region; forming a first gate insulation film on the first surface region and forming a second gate insulation film on the second surface region; depositing a gate electrode material on the first and second gate insulation films; implanting oxygen into the gate electrode material on the second gate insulation film; annealing the gate electrode material to form particles in the gate electrode material on the second gate insulation film; forming a first gate electrode on the first gate insulation film, and forming a second gate electrode on the second gate insulation film, the second gate electrode having a width larger than that of the first gate electrode; depositing a metal film on the first gate electrode and the second gate electrode; and fully siliciding the first gate electrode and the second gate electrode.
BRIEF DESCRIPTION OF THE DRAWINGS
Embodiments according to the present invention will be described below with reference to the accompanying drawings. The embodiments do not limit the present invention. In the following embodiments, constituent elements consisting of p-type semiconductor may be replaced with elements consisting of n-type semiconductor, constituent elements consisting of n-type semiconductor may be replaced with elements consisting of p-type semiconductor.
First Embodiment
The semiconductor device 100 includes a semiconductor substrate 5, a source-drain silicide layer 10, an STI (Shallow Trench Isolation) 20, a side wall 30, a source-drain diffusion layer 40, a first gate insulation film 51, a second gate insulation film 52, a first gate electrode 11, and a second gate electrode 12.
The STI 20 performs device isolation between the MIS transistors 101 and 102. The first gate insulation film 51 and the second gate insulation film 52 are formed on the surface of the semiconductor substrate 5. The first gate electrode 11 is formed on the first gate insulation film 51. The second gate electrode 12 is formed on the second gate insulation film 52.
The gate length of the second gate electrode 12 is larger than the gate length of the first gate electrode 11, and the gate width of the second gate electrode 12 is equal to the gate width of the first gate electrode 11. Therefore, when viewed from above the surface of the semiconductor substrate 5, the surface area of the second gate electrode 12 is larger than the surface area of the first gate electrode 11. In other words, an area of the semiconductor substrate 5 occupied by the second gate electrode 12 is larger than that of the first gate electrode 11.
The thickness of the first gate electrode 11 is larger than that of the second gate electrode 12. This is because the resistance of the first gate electrode 11 is prevented from being considerably higher than that of the resistance of the second gate electrode 12.
The semiconductor substrate 5 is, e.g., a p-type silicon substrate. The thicknesses of the first and second gate insulation films 51 and 52 are preferably 2 nm or less, for example. The first and second gate insulation films 51 and 52 may be silicon oxide films, for example. The first and second gate insulation films 51 and 52 may be high-dielectric-constant insulation films having dielectric constants higher than that of a silicon oxide film. The first and second gate insulation films 51 and 52 may consist of Si3N4, Al2O3, Ta2O5, TiO2, La2O5, CeO2, ZrO2, HfO2, SrTiO3, Pr2O3, or the like. The first and second gate insulation films 51 and 52 may consist of materials such as Zr silicate or Hf silicate obtained by mixing metal ions in silicon oxides and may consist of a material obtained by mixing these materials (e.g. Zr silicate and Hf silicate). The first and second gate insulation films 51 and 52 may consist of a material such as HfSiON obtained by mixing nitrogen in a high-dielectric-constant insulation film. When nitrogen is mixed in the high-dielectric-constant insulation film, the heat resistance of the gate insulation film is improved. Therefore, a gate electrode structure can be easily manufactured.
The gate electrodes 11 and 12 consist of nickel silicide, for example. The gate length of the first gate electrode 11 is about 30 nm, and the gate length of the second gate electrode 12 is about 100 nm. The thickness (height) of the first gate electrode 11 is about 50 nm, and the thickness (height) of the second gate electrode 12 is about 20 nm.
It is reported that the reverse thin-line effect occurs when a gate length is 50 nm or less. Therefore, the gate length of the first gate electrode is shorter than 50 nm, and the gate length of the second gate electrode is longer than 50 nm.
The source-drain layer 40 is formed to sandwich the first and second gate electrodes 11 and 12. The source-drain layer 40 consists of a high-concentration n-type semiconductor, for example. The nickel silicide layer 10 is formed on the upper portion of the source-drain layer 40. The nickel silicide layer 10 consists of nickel silicide and connects the source-drain layer 40 to a source-drain electrode (not shown) with a low resistance.
The side walls 30 are adjacently formed on the side walls of the first gate electrode 11 and the second gate electrode 12, respectively. The side wall 30 is constituted by a silicon oxide film or a silicon nitride film, for example.
In this manner, the semiconductor device 100 according to the embodiment has gate lengths different from each other and includes a plurality of gate electrodes which are fully silicided.
FIGS. 2 to 5 are sectional flow diagrams showing a flow of a manufacturing method of the semiconductor device 100 according to the first embodiment. The manufacturing method of the semiconductor device 100 will be described below with reference to FIGS. 2 to 5.
As shown in
As shown in
As shown in
When the gate length of the second gate electrode 62 is so long that a reverse thin-line effect cannot be obtained, the thickness of the nickel film required for full-siliciding the second gate electrode 62 is about 0.55 times of the thickness of the polysilicon of the second gate electrode 62. More specifically, the thickness of the nickel film may be smaller than almost half of the thickness of the polysilicon of the second gate electrode 62. Therefore, in this embodiment, the thickness of the nickel film may be about 12 nm.
Lamp annealing is executed at 450° for 60 seconds. At this time, as shown in
In the annealing step, nickel is rapidly diffused in an interface between the first gate electrode 61 and the side wall 30. For this reason, the first gate electrode 61 is fully silicided to its bottom. This phenomenon is called a “reverse thin-line effect”.
In the first embodiment, on the semiconductor substrate 5, a plurality of gate electrodes having different gate lengths can be fully silicided in the same steps.
Second Embodiment
The semiconductor region 90 consists of, e.g., silicon single crystal. The thickness of the semiconductor region 90 may be equal to a difference between the thickness of the first gate electrode 11 and the thickness of the second gate electrode 12. For example, if the thickness of the first gate electrode 11 and the thickness of the second gate electrode 12 are 100 nm and 40 nm, respectively, the thickness of the semiconductor region 90 is 60 nm.
The level of the upper surface of the second gate electrode 12 and the level of the upper surface of the first gate electrode 11 are made equal to each other to make it possible to easily execute CMP (Chemical-Mechanical Polishing) in manufacturing of the semiconductor device 200.
FIGS. 7 to 10 are sectional flow diagrams showing a flow of a manufacturing method of the semiconductor device 200 according to the second embodiment. The manufacturing method of the semiconductor device 200 will be described below with reference to FIGS. 7 to 10.
By using a photolithography technique and a selective epitaxial growing method for silicon single crystal, as shown in
The STI 20 is formed in the same manner as that of the first embodiment. The silicon thermal oxide films 51 and 52 and a polysilicon film 60 are continuously formed. Subsequently, the surface of the polysilicon film 60 is planarized by using CMP. In this manner, the levels of the upper surfaces of the first and second gate electrodes 61 and 62 can be made equal to each other.
As shown in
As shown in
An insulating interlayer 92 is deposited on the entire surface of the semiconductor substrate 5. The insulating interlayer 92 consists of, for example, BPSG. Subsequently, the insulating interlayer 92 is planarized by using CMP to expose the upper surfaces of the first and second gate electrode.
A nickel film 80 is deposited on the entire surface of the semiconductor substrate 5. As described above, since the upper portions of the first and second gate electrodes 61 and 62 are silicided to some extent, the thickness of the nickel film 80 may be smaller than the nickel film in the first embodiment. Therefore, the thickness of the nickel film may be about 20 nm, for example. Subsequently, lamp annealing is executed at 450° C. for 60 seconds. At this time, as shown in
In the second embodiment, the upper surfaces of the first and second gate electrodes 61 and 62 can be exposed while covering the source-drain layer 40 with the insulating interlayer 92. Therefore, the silicidation step of the source-drain silicide layer 10 and the silicidation step of the first and second gate electrodes 11 and 12 can be executed as different steps.
In the second embodiment, the position of the bottom surface of the second gate electrode 12 is raised by the semiconductor region 90. In this manner, the levels of the upper surfaces of the first and second gate electrodes 11 and 12 are made equal to each other. Alternatively, the semiconductor substrate 5 of the first surface region R1 may be etched to lower the position of the bottom surface of the first gate electrode 11. By using this method, the levels of the upper surfaces of the first and second gate electrodes 11 and 12 can be made equal to each other.
Furthermore, these methods are combined to each other to raise the bottom surface of the second gate electrode 12 by the semiconductor region 90 and to lower the position of the level of the first gate electrode 11.
Third Embodiment
The gate length of the first gate electrode 11 is 20 nm, for example. The gate length of the second gate electrode 12 is 120 nm, for example. The width of the sub-gate electrode 301 is 20 nm, for example. The width of the inter-electrode insulation film 302 is 5 nm, for example. In the third embodiment, the five sub-gate electrodes 301 are arranged, and the four inter-electrode insulation films 302 are arranged between these sub-gate electrodes 301. The heights of the first gate electrode 11 and the second gate electrode 12 are, for example, 50 nm each.
The other configuration in the third embodiment may be the same as that in the first embodiment.
In the third embodiment, reverse thin-line effects occur in both the first and second gate electrodes 11 and 12, respectively. Therefore, even though the thickness of the second gate electrode 12 is equal to the thickness of the first gate electrode 11, both the first and second gate electrodes 11 and 12 can be fully silicided.
FIGS. 12 to 15 are sectional flow diagrams showing a flow of a manufacturing method of the semiconductor device 300 according to the third embodiment. The manufacturing method of the semiconductor device 300 will be described below with reference to FIGS. 12 to 15.
As shown in
As shown in
An insulating material 31 is deposited on the entire surface of the semiconductor substrate 5. The insulating material 31 is a silicon oxide film, for example. The insulating material 31 is etched by using the RIE method. At this time, as shown in
The source-drain layer 40 is formed in the same manner as in the first embodiment. As shown in
Subsequently, lamp annealing is executed 450° C. for 60 seconds. At this time, as shown in
As described above, in the third embodiment, the first and second gate electrodes 11 and 12 are fully silicided by the reverse thin-line effect. In this manner, the thicknesses of the first and second gate electrodes 11 and 12 can be made equal to each other. As a result, the first and second gate electrodes 11 and 12 can be formed by using a common process.
The plurality of sub-gate electrodes 301 are electrically connected by pads or the like. Since an interval between the adjacent sub-gate electrodes 301 is very small, i.e., about 5 nm, a channel is not disconnected in an operation of the MIS transistor 102.
Fourth Embodiment
In the fourth embodiment, the silicide layer 401 is uniformly formed near a second gate insulation film 52. In this manner, controllability of the work function of the second gate electrode 12 is improved. In addition, the fourth embodiment has the same effect as that of the third embodiment.
A first manufacturing method according to the fourth embodiment may be almost the same as the manufacturing method of the third embodiment. In
FIGS. 17 to 20 are sectional flow diagrams showing a flow of a second manufacturing method of the semiconductor device 400. The second manufacturing method of the semiconductor device 400 will be described below with reference to FIGS. 17 to 20.
As shown in
As shown in
For example, by using a photolithography technique, the second surface region R2 is masked, the first surface region R1 is exposed. RIE is executed by using the first gate insulation film 51 as an end point to etch the polysilicon film 60 in the first surface region R1. In this manner, the first gate electrode 61 is formed. The first surface region R1 is masked, and the second surface region R2 is exposed by using the photolithography technique. Then, RIE is executed by using the silicide layer 401 as an end point to etch the polysilicon film 60 in the second surface region R2. Therefore, the sub-gate electrodes 351 are formed.
The insulating material 31 is deposited on the entire surface of the semiconductor substrate 5. The insulating material 31 is a silicon oxide film, for example. The insulating material 31 is etched by using the RIE method. At this time, as shown in
The source-drain layer 40 is formed as in the first embodiment. Furthermore, the nickel film 80 is deposited on the entire surface of the semiconductor substrate 5. The thickness of the nickel film 80 may be about 12 nm.
Subsequently, a lamp annealing is executed at 450° C. for 60 seconds. At this time, as shown in
In this manner, in the third embodiment, both the first and second gate electrodes 11 and 12 are fully silicided by the reverse thin-line effect. Furthermore, the plurality of sub-gate electrodes 301 are electrically connected by the silicide layer 401.
According to the second manufacturing method, the plurality of sub-gate electrodes 301 in the second gate electrode 12 can be reliably electrically connected on the second gate insulation film 52. In this manner, controllability of the work function of the second gate electrode 12 is improved.
Fifth Embodiment
In a bottom portion of the second gate electrode 12, a silicide layer 501 is formed on a second gate insulation film 52. Sub-gate electrodes 301 and inter-electrode insulation films 302 are formed on the upper portion of the second gate electrode 12. Since the sub-gate electrodes 301 is formed on the silicide layer 501, in order to make the levels of the upper surfaces of the sub-gate electrodes 301 and the first gate electrode 11 equal to each other, the semiconductor region 502 is formed on the semiconductor substrate 5 in a first surface region R1.
The thickness of the semiconductor region 502 is almost equal to the thickness of the silicide layer 501. For this reason, the thickness of the first gate electrode 11 can be made equal to the thickness of the sub-gate electrode 301. As a result, the first gate electrode 11 and the sub-gate electrodes 301 can be simultaneously formed in the same process.
The other configuration in the fifth embodiment may be the same as that in the fourth embodiment. The fifth embodiment has the same effect as that in the fourth embodiment.
FIGS. 22 to 25 are sectional flow diagrams showing a flow of a manufacturing method of the semiconductor device 500. The manufacturing method of the semiconductor device 500 will be described below with reference to FIGS. 22 to 25.
As shown in
As shown in
The insulating material 31 is deposited on the entire surface of the semiconductor substrate 5. The insulating material 31 is a silicon oxide film, for example. The insulating material 31 is etched by using an RIE method. At this time, as shown in
The source-drain layer 40 is formed in the same manner as in the first embodiment. Furthermore, the nickel film 80 is deposited on the entire surface of the semiconductor substrate 5.
Subsequently, a lamp annealing is executed at 450° C. for 60 seconds. At this time, as shown in
In the fifth embodiment, the first gate electrode 61 and the sub-gate electrodes 351 can be simultaneously formed, and the plurality of sub-gate electrodes 301 in the second gate electrode 12 can be reliably electrically connected on the second gate insulation film 52. In this manner, the controllability of the work function of the second gate electrode 12 is improved.
Sixth Embodiment
If the gate length of the second gate electrode 12 is 100 nm, and when the thickness of the second gate electrode 12 is 50 nm, the diameters of the insulating particles 601 are 5 nm to 10 nm. The insulating particles 601 consist of a silicon oxide, for example.
The insulating particles 601 are arranged in the second gate electrode 12 to decrease the substantial volume of the second gate electrode 12. Therefore, a reverse thin-line effect is accelerated in the second gate electrode 12. As a result, the first and second gate electrodes 11 and 12 can be simultaneously fully silicided. Furthermore, the thickness of the second gate electrode 12 is equal to the thickness of the first gate electrode 11 and relatively large, so that resistance against to a short-circuit phenomenon between the gate and the source/drain can be higher.
FIGS. 27 to 30 are sectional flow diagrams showing a flow of a manufacturing method of the semiconductor device 600. The manufacturing method of the semiconductor device 600 will be described below with reference to FIGS. 27 to 30.
As shown in
After the photoresist 120 is removed, the polysilicon film 60 is etched by using an RIE method. In this manner, as shown in
As shown in
The density of the second gate electrode 12 is almost a half the density of the first gate electrode 11 because the second gate electrode 12 includes the cavities 701. The density of the first gate electrode 11 is equal to that of a bulk of nickel suicide, for example, 4.55×1020 cm−3.
As shown in
After the photoresist 120 is removed, the polysilicon film 60 is etched by using an RIE method. In this manner, as shown in
Thereafter, as in the sixth embodiment, the side wall 30 and the source-drain layer 40 are formed. Furthermore, the nickel film 80 is deposited on the entire surface of the semiconductor substrate 5 to execute a lamp annealing. Since the second gate electrode 62 includes the cavities 701, the substantial volume of the second gate electrode 62 decreases. Therefore, not only the first gate electrode 61, but also the second gate electrode 62 are simultaneously fully silicided by a reverse thin-line effect. As a result, as shown in
In general, when polysilicon is silicided, the polysilicon expands. Therefore, the cavities 701 in the second gate electrode 12 after silicided are smaller than the cavities 701 in the second gate electrode 62 which is not silicided. The seventh embodiment has the same effect as that in the sixth embodiment.
Eighth Embodiment
In the eighth embodiment, the first embodiment is applied to an n-type Schottky MIS transistor. In the n-type Schottky MIS transistor, the metal source/drain layer 45 consists of a rare earth metal typified by erbium (Er) or silicide containing such a metal. This is because the rare earth metal typified by erbium (Er) has a high Schottky barrier to electrons. In this manner, a source-drain resistance decreases.
In a p-type Schottky MIS transistor, the metal source/drain layer 45 consists of, for example, a noble metal typified by platinum (Pt) or silicide containing such a metal. This is because the noble metal silicide has a low Schottky barrier with reference to holes.
The first and second gate electrodes 11 and 12 consist of suicide containing the same rare earth metal as that in the metal source/drain layer 45. In this manner, the work functions of the first and second gate electrodes 11 and 12 are almost equal to the work function of n-type polysilicon which is popularly applied as a gate electrode at the present. As a result, a current circuit design need not be largely changed.
Ninth Embodiment
In order to form the metal source/drain layer 45, impurity is shallowly implanted by ion implantation or the like in advance, and a metal is sputtered, and then silicidation is performed. In this manner, an impurity which is present in a portion of the metal source/drain layer 45 is segregated around the metal source/drain layer 45 during the silicidation. For example, the segregation of the impurity can form the high-concentration layer 47.
The eighth and ninth embodiments can be applied to any one of the first to seventh embodiments.
The above embodiments can be applied to a complete-depletion type transistor using SOI or a three-dimensional device typified by an FiNFET. In particular, in the three-dimensional device such as an FiNFET, since a gate electrode structure is further complicated, the embodiments are effective.
Tenth Embodiment
When the second gate electrode 12 having a large gate length is fully silicided, the first gate electrode 11 having a small gate length is changed into Ni2Si by a reverse thin-line effect.
The work function increases as a nickel content increases. Therefore, in the silicidation step, the thickness of the nickel film is controlled to make it possible to control the work function. For example, a nickel film 80 having a thickness of 50 nm or more is deposited on first and second gate electrodes 61 and 62 each having a thickness of 50 nm. The thickness of the nickel film 80 is preferably equal to or larger than the thicknesses (heights) of the first and second gate electrodes 61 and 62. This is because the second gate electrode 62 can be changed into NiSi2 and the first gate electrode 61 can be changed into NiSi or Ni2Si.
Eleventh Embodiment
In the eleventh embodiment, germanium is added to only the first gate electrode 11. The germanium may be added by using polycrystalline SiGe in place of a polysilicon layer 31 or by implanting germanium ions into the polysilicon layer.
According to the eleventh embodiment, in a silicide forming step, germanium is concentrated toward a first gate insulation film 51 in the first gate electrode 11. Therefore, the Ni(SiGe) layer 16 is formed on the first gate insulation film 51. For this reason, a reverse thin-line effect can be suppressed.
Furthermore, if a germanium content of the Ni(SiGe) layer 16 near the first gate insulation film 51 is 60% or more, the work function continuously changes from NiSi (4.7 ev) to NiGe (5.2 eV). Therefore, the work function of the gate electrode can be controlled by controlling the germanium content.
In the above embodiments, although silicon is used in a channel region, a material such as SiGe, Ge, or strain Si which has a carrier mobility higher than that of silicon may be used.
Additional advantages and modifications will readily occur to those skilled in the art. Therefore, the invention in its broader aspects is not limited to the specific details and representative embodiments shown and described herein. Accordingly, various modifications may be made without departing from the spirit or scope of the general inventive concept as defined by the appended claims and their equivalents.
Claims
1. A semiconductor device comprising:
- a semiconductor substrate;
- a first gate insulation film formed on the semiconductor substrate;
- a second gate insulation film formed on the semiconductor substrate;
- a first gate electrode formed on the first gate insulation film and fully silicided; and
- a second gate electrode formed on the second gate insulation film and fully silicided, a gate length or a gate width of the second gate electrode being larger than that of the first gate electrode, and a thickness of the second gate electrode being smaller than that of the first gate electrode.
2. The semiconductor device according to claim 1, wherein
- the bottom surface of the second gate electrode is disposed at a higher level from the surface of the semiconductor substrate than the bottom surface of the first gate electrode.
3. The semiconductor device according to claim 2, wherein
- the upper surface of the second gate electrode is disposed at a same level as the upper surface of the first gate electrode.
4. The semiconductor device according to claim 1, wherein
- the thickness from the bottom surface to the upper surface of the second gate electrode is less than a half of the thickness from the bottom surface to the upper surface of the first gate electrode.
5. The semiconductor device according to claim 1, wherein
- the gate length or the gate width of the first gate electrode is less than 50 nm,
- the gate length or the gate width of the second gate electrode is more than 50 nm.
6. The semiconductor device according to claim 2 further comprising:
- a metal layer functioning as a source layer or a drain layer.
7. The semiconductor device according to claim 6 further comprising:
- a high-concentration layer provided around the metal layer and having an impurity concentration higher than the impurity concentration of a well diffusion layer formed on the semiconductor substrate or the impurity concentration of the semiconductor substrate.
8. A semiconductor device comprising:
- a semiconductor substrate;
- a first gate insulation film formed on the semiconductor substrate;
- a second gate insulation film formed on the semiconductor substrate;
- a first gate electrode formed on the first gate insulation film and fully silicided; and
- a second gate electrode including a plurality of sub-gate electrodes formed on the second gate insulation film, the second gate electrode having a gate length or a gate width larger than that of the first gate electrode, wherein
- the plurality of sub-gate electrodes are fully silicided.
9. The semiconductor device according to claim 8, wherein
- the thickness from the bottom surface to the upper surface of the first gate electrode is same as the thickness from the bottom surface to the upper surface of the sub-gate electrodes.
10. The semiconductor device according to claim 8, wherein
- the gate length or the gate width of the first gate electrode is same as the gate length or the gate width of the sub-gate electrode.
11. The semiconductor device according to claim 8, wherein
- the second gate electrode includes a silicide layer provided on the second gate insulation film between the adjacent sub-gate electrodes.
12. A semiconductor device comprising:
- a semiconductor substrate;
- a first gate insulation film formed on the semiconductor substrate;
- a second gate insulation film formed on the semiconductor substrate;
- a first gate electrode formed on the first gate insulation film and fully silicided; and
- a second gate electrode including particles and provided on the second gate insulation film and fully silicided, the area of the semiconductor substrate occupied by the second gate electrode being larger than that of the first gate electrode.
13. The semiconductor device according to claim 12, wherein
- the particles are made of insulation materials or cavities.
14. The semiconductor device according to claim 12, wherein
- the volume of the silicide in the second gate electrode is equal to the volume of the silicide in the first gate electrode.
15. The semiconductor device according to claim 12, wherein
- the first gate electrode is made of Ni2Si,
- the second gate electrode is made of NiSi.
16. The semiconductor device according to claim 12, wherein
- the first gate electrode has a two-layer structure constituted by an Ni2Si layer and an Ni(SiGe) layer,
- the second gate electrode is made of NiSi.
17. A method of manufacturing a semiconductor device comprising:
- preparing a semiconductor substrate having a first surface region and a second surface region;
- epitaxially growing a semiconductor region on the second surface region;
- forming a first gate insulation film on the first surface region and forming a second gate insulation film on the semiconductor region;
- forming a first gate electrode on the first gate insulation film, and forming a second gate electrode on the second gate insulation film, the second gate electrode having a height equal to that of the first gate electrode and having a width larger than that of the first gate electrode;
- depositing a metal film on the first gate electrode and on the second gate electrode; and
- fully siliciding the first gate electrode and the second gate electrode.
18. A method of manufacturing a semiconductor device comprising:
- preparing a semiconductor substrate having a first surface region and a second surface region;
- etching the semiconductor substrate of the first surface region;
- forming a first gate electrode on the first gate insulation film, and forming a second gate electrode on the second gate insulation film;
- forming a first gate electrode on the first gate insulation film, and forming a second gate electrode on the second gate insulation film, the second gate electrode having a height equal to that of the first gate electrode and having a width larger than that of the first gate electrode;
- covering source and drain diffusion layers or silicide electrodes with an interlayer insulation film, the source and drain diffusion layers or the suicide electrodes being formed on both sides of the first gate electrode and both sides of the second gate electrode;
- polishing the interlayer insulation film to expose the upper surface of the first gate electrode and the upper surface of the second gate electrode;
- depositing a metal film on the first gate electrode and on the second gate electrode; and
- fully siliciding the first gate electrode and the second gate electrode.
19. A method of manufacturing a semiconductor device comprising:
- preparing a semiconductor substrate having a first surface region and a second surface region;
- forming a first gate insulation film on the first surface region and forming a second gate insulation film on the second surface region;
- depositing a gate electrode material on the first and second gate insulation films;
- etching the gate electrode material on the first gate insulation film to form a first gate electrode and etching the gate electrode material on the second gate insulation film to form a second gate electrode which includes a plurality of sub-gate electrodes arranged on the second gate insulation film and which occupies an area larger than an area occupied by the first gate electrode on the semiconductor substrate;
- depositing a metal film on the first gate electrode and the second gate electrode; and
- fully siliciding the first gate electrode and the second gate electrode.
20. A method of manufacturing a semiconductor device comprising:
- preparing a semiconductor substrate having a first surface region and a second surface region;
- forming a first gate insulation film on the first surface region and forming a second gate insulation film on the second surface region;
- depositing a gate electrode material on the first and second gate insulation films;
- implanting oxygen into the gate electrode material on the second gate insulation film;
- annealing the gate electrode material to form particles in the gate electrode material on the second gate insulation film;
- forming a first gate electrode on the first gate insulation film, and forming a second gate electrode on the second gate insulation film, the second gate electrode having a width larger than that of the first gate electrode;
- depositing a metal film on the first gate electrode and the second gate electrode; and
- fully siliciding the first gate electrode and the second gate electrode.
Type: Application
Filed: Aug 26, 2005
Publication Date: Jul 27, 2006
Applicant:
Inventors: Atsuhiro Kinoshita (Kamakura-Shi), Yoshinori Tsuchiya (Yokohama-Shi), Junji Koga (Yokosuka-Shi)
Application Number: 11/211,746
International Classification: H01L 29/76 (20060101);