Probing Apparatus
A probe for probing an electrical device under test is provided. The probe comprises a camera positioned adjacent a probing tip of the probe. Visual information captured by the camera is displayed on a display device. The camera may be mounted in multiple locations as desired by a user and additionally, multiple cameras may be used with the probe to allow for more viewing angles.
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The present application is a divisional of U.S. patent application Ser. No. 12/132,726, filed Jun. 4, 2008, the entire contents of which are incorporated herein by reference.
FIELD OF THE INVENTIONThe present invention relates generally to electronic measurement instruments, and more particularly to instrument probes, which are able to physically or electronically connect to one or more nodes of an electrical circuit.
BACKGROUND OF THE INVENTIONProbes are well known devices which form an electrical path connecting one or more inputs of a test and measurement instrument to one or more nodes of a device under test. Probes traditionally consist of a conductive tip and an insulating probe body. The instrument operator will typically manually steady the insulating probe body while positioning the conducting probe tip to physically make contact with the surface of a conducting point on the device under test. When contact is made, the probe and channel termination form a connection to the circuit under test, allowing the test instrument to acquire and record signal information. Commonly, many nodes will be tested, and the operator will manually maneuver the probe tip to make contact with each of the desired nodes. In order to ensure that the probe tip has made contact with the proper node, and has not slipped off of the desired node, shorted two nodes together, or attached itself to another undesired node location, it is necessary for the operator to have accurate visual information about the probe tip's location relative to the desired node under test.
Currently, colored LEDs are available within active probes, for the purpose of probe identification. When connecting multiple probes to a device under test, users have historically been challenged when viewing the device under test, to identify which probe tip corresponds to which scope channel. Autocolor identification of probes has been implemented which illuminates a side panel of the probe with a color that matches a waveform trace color on an oscilloscope or other test and measurement apparatus for the corresponding channel. In this way, for example, if a channel 3 waveform trace in the oscilloscope grid appears blue, then the side panel of the probe acquiring the signals that are sent to the oscilloscope through channel 3 is lit with a blue LED. This prior art is useful for indicating the channel identity of the probe, but is not useful for illuminating or viewing the target node of the device under test. Currently, lighting and/or magnification of the target node of the device under test does not exist in probing technology.
SUMMARY OF THE INVENTIONThe inventors of the present invention have noted that during the past several years, electrical device geometries and probing tip size have both continued to decrease. The ability for an instrument operator to manually position and re-position the probing tip to each desired node on the device under test has become increasingly challenging. Accurate probing is dependent on the operator's ability to visually locate the target node and the probe tip positions, and ensure that the correct contact has been made between the two. The potential for error while probing is a common concern. Specifically, adequate illumination and magnification of the probing contact point are needed.
In accordance with the present invention, a method and apparatus are provided for providing lighting and magnification of the point of interest while probing. The invention particularly removes the need for external sources of lighting and magnification. Rather, the probe functionality includes these necessary enhancements as part of the probe structure. Furthermore, indications of conductivity between a probe and a probed location may be provided.
It is therefore an object of the invention to provide a probe that improves over currently available devices.
Still other objects and advantages of the invention will in part be obvious and will in part be apparent from the specification and the drawings.
The invention accordingly comprises the features of construction, combination of elements, and arrangement of parts which will be exemplified in the construction hereinafter set forth, and the scope of the invention will be indicated in the claims.
For a more complete understanding of the invention, reference is made to the following description and accompanying drawings, in which:
The invention will now be described, making reference to the accompanying drawings.
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While in each of the embodiments the light source, magnification element, LED or camera have been described in a particular manner (i.e. recessed, etc., these components may be fixed to the probe body in any other manner, such as a spotlight, fixed to the side of the probe body, or in a removable manner in which one or more mounting systems may be provided for mounting one or more of the above noted elements.
It will thus be seen that the objects set forth above, among those made apparent from the preceding description, are efficiently attained and, since certain changes may be made in the above construction(s) without departing from the spirit and scope of the invention, it is intended that all matter contained in the above description or shown in the accompanying drawing(s) shall be interpreted as illustrative and not in a limiting sense.
It is also to be understood that the following claims are intended to cover all of the generic and specific features of the invention herein described and all statements of the scope of the invention which, as a matter of language, might be said to fall therebetween.
Claims
1. A probe for probing an electrical device under test, comprising:
- a selectively positionable door defining a recessed compartment; and
- a light source positioned within the recessed compartment;
- whereby when the door is in a first position, the compartment is closed, and when the door is in a second position, the compartment is opened.
2. The probe of claim 1, further comprising a reflective portion of an internal surface of the door;
- wherein when the door is in the second position, light from the light source is reflected from the reflective portion of the door.
3. The probe of claim 2, wherein the reflected light source illuminates an area about the tip of the probe.
4. The probe of claim 2, wherein the light source is activated upon the positioning of the door in the second position.
5. The probe of claim 1, wherein the light source is an LED.
6. The probe of claim 6, wherein a color of the LED indicates a state of the probe.
7. The probe of claim 7, wherein at least one LED color indicates electrical contact with a device under test.
8. A probe for probing an electrical device under test, comprising:
- a selectively positionable door; and
- a magnifying element positioned within the door.
9. The probe of claim 8, wherein when the door is in the second position, light from the vicinity of a tip of the probe is magnified for a probe operator.
10. The probe of claim 9, wherein a light source is activated upon the positioning of the door in the second position.
11. The probe of claim 10, wherein the light source comprises an LED positioned adjacent a tip of the probe.
12. The probe of claim 10, wherein the light source is positioned within a recessed compartment defined by the door.
13. A probe for probing an electrical device under test, comprising:
- a light source positioned adjacent a probing tip of the probe.
14. The probe of claim 13, wherein the light source is an LED.
15. The probe of claim 14, wherein a color of the LED indicates a state of the probe.
16. The probe of claim 15, wherein at least one LED color indicates electrical contact with a device under test.
17. A probe for probing an electrical device under test, comprising:
- a camera positioned adjacent a probing tip of the probe.
18. The probe of claim 17, wherein visual information captured by the camera is displayed on a display device.
19. The probe of claim 18, wherein a connection between the camera and the display device is provided wirelessly.
20. The probe of claim 18, wherein the wireless connection is a bluetooth connection.
21. The probe of claim 18, wherein a connection between the camera and the display device is provided by a cable.
22. The probe of claim 18, wherein the visual information is displayed in a magnified view.
23. The probe of claim 17, wherein the camera comprises a miniaturized fiber optic camera lens.
24. A probe for probing an electrical device under test, comprising:
- a first camera positioned adjacent a probing tip of the probe;
- a second camera positioned adjacent a probe body of the probe;
- wherein visual information captured by the first and second cameras is displayed on a display device.
25. The probe of claim 24, wherein visual information captured by each of the first and second cameras show alternative views of the probe tip.
26. The probe of claim 24, wherein the visual information captured by each of the first and second cameras show different viewing angles of a probe tip connection.
27. The probe of claim 24, wherein at least one of the first and second cameras is removable.
28. A probe for probing an electrical device under test, comprising:
- a camera mounted to a probe body of the probe, the camera capturing visual information of the probe tip connection between the probe tip and a device under test
29. The probe of claim 28, wherein the camera is mounted adjacent a probe tip of the probe.
30. The probe of claim 28, wherein the camera is mounted to a probe body of the probe.
31. The probe of claim 30, wherein the prober is removably mounted.
Type: Application
Filed: Sep 3, 2009
Publication Date: Feb 18, 2010
Applicant: LeCroy Corporation (Chestnut Ridge, NY)
Inventors: Michael Hertz (Washington Township, MI), Frederic Antonin (Pearl River, NY)
Application Number: 12/553,316
International Classification: G01R 1/06 (20060101);