MEMS DEVICE
A MEMS device includes a fixed electrode and a movable electrode arranged isolated and spaced from the fixed electrode by a distance. The movable electrode is suspended against the fixed electrode by one or more spacers including an insulating material, wherein the movable electrode is laterally affixed to the one or more spacers.
This application is a continuation of U.S. application Ser. No. 14/091,492 filed on Nov. 27, 2013, the contents of which are incorporated by reference in its entirety.
FIELDEmbodiments of the present disclosure refer to a MEMS device, a MEMS device used as an acceleration sensor, a humidity sensor, a bolometer and a pressure sensor as well as to a method for manufacturing a MEMS device.
BACKGROUNDA MEMS device, also referred to as microelectromechanical system, is often used as sensor like acceleration sensors, pressure sensors or acoustic wave sensors (microphone). All of these MEMS devices have a movable element, for example a membrane or a cantilever, wherein the motion of the movable element, e.g. caused by a pressure change or an acceleration, may be detected capacitively. Thus, a common variant of a MEMS device comprises a movable electrode as a movable element and a fixed electrode facing the movable electrode so that a distance change between the two electrodes (due to the motion of the movable element) may lead to a capacitive change.
Typically, MEMS devices have an impressed capacitance which is mainly defined by the two electrodes and a parasitic capacitance of the MEMS device. The capacitance change indicative for the motion of the movable element is often relatively small when compared to the entire capacitance of the MEMS device. In order to compensate manufacturing related deviations, especially in connection with the parasitic capacitance, means for offsetting are provided. Thus, there is the need for an improved approach which enables to reduce the parasitic capacitance.
SUMMARYAn embodiment of the disclosure provides a MEMS device comprising a fixed electrode and a movable electrode. The movable electrode is arranged isolated and spaced from the fixed electrode by a distance. The movable electrode is suspended against the fixed electrode by one or more spacers comprising an insulating material, wherein the movable electrode is laterally affixed to the one or more spacers.
A further embodiment provides a MEMS device comprising a substrate and a movable electrode. The substrate comprises a fixed electrode. The movable electrode is arranged isolated and spaced from the fixed electrode by a distance that has a square shape. The movable electrode is suspended against the fixed electrode by one or more spacers comprising an isolating oxide at its corners, wherein the movable electrode is laterally fixed to the one or more spacers. The distance between the fixed electrode and the movable electrode is variable, wherein a variation of the distance leads to a variation of a capacitance.
According to a further embodiment, a MEMS device comprises a fixed electrode and a movable electrode arranged isolated and spaced from the fixed electrode by a distance. The movable electrode is suspended against the fixed electrode by one or more spacers comprising an insulating material, wherein the movable electrode is laterally fixed to the one or more spacers. Here, a footprint of the one or more spacers is at least twenty times smaller when compared to a footprint of the movable electrode.
A further embodiment provides a method for manufacturing a MEMS device. The method comprises providing a sacrificial layer to a fixed electrode, providing a movable electrode to the sacrificial layer such that a layer stack, comprising the sacrificial layer and the movable electrode, is formed. Furthermore, the method comprises providing one or more spacers comprising an insulating material adjacent to the layer stack such that the movable electrode is laterally affixed to the one or more spacers and removing the sacrificial layer at least in a portion aligned with a portion of the movable electrode such that the movable electrode is spaced from the fixed electrode by a distance. As a result, the movable electrode is suspended against the fixed electrode by the one or more spacers.
Embodiments of the present disclosure will subsequently be discussed referring to the enclosed drawings, wherein
Different embodiments of the teachings disclosed herein will subsequently be discussed referring to
The fixed electrode 14 is fixed, so same may, for example, be arranged at a substrate (not shown). Vice versa, the movable electrode 14 is movable at least along a first direction (illustrated by the arrow 16). In order to realize the motion, the movable electrode 14 forms or has a deformation area. The deformation area may alternatively be formed at the connection or the borderline between the movable electrode 14 and the spacer 18 or by the spacer 18 itself. In general, this means with respect to the one or more spacers 18 that the purpose of the one or more spacers 18 is to provide a suspension for the movable electrode 14 against the fixed electrode 12.
The two electrodes 12 and 14 form a capacitance, so the two electrodes 12 and 14 are isolated from each other. Therefore, these spacers 18 comprise an insulating material like an oxide or a nitride. Alternatively, the spacer 18 may comprise a different insulating material, for example mono-silicon, wherein doping is selected such that the mono-silicon is insulating.
The motion dimension is arranged such that the distance 16 is variable. A variation of the distance 16 causes a variation of the capacitance. Consequently, a distance change or a motion of the movable electrode 14 is detectable due to the capacitance change. Due to the lateral connection between the movable electrode 14 and the spacers 18 via the end faces 14f it can be avoided that large portions of the electrodes 12 and 14 are facing each other with an oxide in between. Note that these areas typically cause parasitic capacitances. The background thereof is that the parasitic capacitance is mainly caused in areas of the oxide or, in general terms, of the dielectric due to the increased dielectric constant εspacer (e.g. for an oxide 3.9) when compared to the dielectric constant εcavity of the cavity (for here 1.0, c.f. area marked by 16). Thus, the structure of the MEMS device 10 enables reducing the areas mainly causing the parasitic capacitance. Expressed in other words, this embodiment has the advantage that the capacitance is mainly defined by the overlap area of the two electrodes 12 and 14 and the distance 16 between the two electrodes 12 and 14. Thus, in contrast to state of the art MEMS devices, the MEMS device 10 has a reduced parasitic capacitance due to the way of suspending the movable electrode 14. This leads to improved electrical characteristics. A main effect is that the circuit for evaluating the motion of the movable electrode 14 does not need means for offsetting the signal of the device 10.
With respect to
As can be seen especially in the top view 2b, an added footprint of the plurality of spacers 18a, 18b, 18c and 18d is significantly smaller when compared to the footprint of the movable electrode 14. For example, a proportion between the two footprints may be 1:10 or 1:20 or even 1:100. Starting from an exemplary size of the movable electrode 14 of 35 μm×35 μm (up to 200 μm×200 μm) a footprint of a respective spacer 18a, 18b, 18c or 18d is smaller than 70 μm or smaller than 20 μm2 (smaller than 5% or 1% of the footprint of the movable electrode 14). The footprint size relates to the sum of all spacers 18a, 18b, 18c and 18d. Thus, a respective footprint of a single spacer 18a, 18b, 18c or 18d may be smaller than 2.5% or even smaller than 0.25% of a footprint of the movable electrode 14 (dependent on the number of spacers 18a, 18b, 18c and 18d). This leads to the above discussed advantage of the improved electric characteristic.
According to a further embodiment, a conductor 26 may be arranged at one of the spacers 18a, 18b, 18c or 18d in order to electrically connect the movable electrode 14. This conductor 26 is arranged as a layer formed along the surface of the spacer 18a such that same extends from the substrate 20 onto the movable electrode 14. In order to isolate the conductor from the electrode 12, the substrate 20 may comprise an isolator 28 arranged between the conductor 26 and the electrode 12 according to a further embodiment. According to this further embodiment, the conductor 26 may comprise a portion 26a extending through the isolator 28 into the substrate 20.
With respect to
In detail,
The next act, illustrated by
The spacers 18 may be provided in a structured manner, e.g. by using a mask, such that the footprint is as low as possible in order to reduce the parasitic capacitance as explained above. The providing of the spacers 18 in a structured manner simultaneously enables one to provide same such that the openings (cf.
As illustrated by
It should be noted that the shown method for manufacturing may optionally comprise further acts like polishing or planarization.
From the manufacturing point of view, it should be noted that the spacers 36a, 36b, 36c and 36d are formed on the substrate 20 or on the fixed electrode 14 after the sacrificial layer (cf.
Although in the above discussed embodiments the spacers have been discussed in the context of a spacer arrangement according to which the spacers are arranged around the movable electrode 14, it should be noted that the one or more spacers may also be arranged within the electrode area 14. Such an arrangement will be discussed below.
Alternatively, the shown MEMS device 10″″ may also comprise a plurality of spacers 18″″ embedded into the movable electrode 14″″. According to a further embodiment the conductor for electrically connecting the movable electrode 14″″ may be arranged within the spacers 18″″ (not shown).
The manufacturing of the MEMS device 10″″ is substantially similar to the manufacturing of the above discussed MEMS devices. Here, a hole for the spacer 18″″ (through which the spacer 18″″ should extend) is provided into the movable electrode 14″″ and the sacrificial layer 32 during the act of defining the shape of the movable electrode 14″″ (cf.
With respect to
According to further embodiments, the MEMS device 10′ forms a bolometer. Here, it is advantageous that the material of the spacers 18a, 18b, 18c and/or 18d may be selected dependent on a desired, e.g. a reduced, thermal conductivity.
Although the membrane 14 has been discussed in context of a membrane having a square shape, it should be noted that the shape of the membrane 14 may be different, for example round.
Referring to
In general, the above described embodiments are merely illustrative for the principle of the present disclosure. It is understood that modifications and variations of the arrangements and the details described herein will be apparent to others skilled in the art. It is the intent therefore to be limited only by the scope of the appended patent claims and not by the specific details presented by way of description and explanation of the embodiments herein.
Claims
1. A MEMS device, comprising:
- a fixed electrode; and
- a movable electrode arranged isolated and spaced from the fixed electrode by a distance;
- wherein the movable electrode is suspended against the fixed electrode by one or more spacers comprising an insulating material, wherein the movable electrode is laterally affixed to the one or more spacers.
2. The MEMS device according to claim 1, wherein the fixed electrode is formed by or attached to a substrate.
3. The MEMS device according to claim 1, wherein the movable electrode has a square shape and wherein the movable electrode is suspended at one or more corners of the movable electrode via the one or more spacers, respectively.
4. The MEMS device according to claim 1, wherein the one or more spacers are embedded in the movable electrode.
5. The MEMS device according to claim 1, wherein the one or more spacers comprise an oxide or nitride.
6. The MEMS device according to claim 1, wherein the one or more spacers have a different material or a different grid structure when compared to a material or a grid structure of the movable electrode.
7. The MEMS device according to claim 1, wherein a footprint of the one or more spacers is at least 10 times smaller when compared to a footprint of the movable electrode.
8. The MEMS device according to claim 1, wherein the distance between the fixed electrode and the movable electrode is variable and wherein a variation of the distance leads to a variation of a capacitance.
9. The MEMS device according to claim 1, wherein the movable electrode is electrically contacted via a conductor arranged at one of the one or more spacers.
10. The MEMS device according to claim 1, wherein the one or more spacers are separated from each other by an opening extending along the movable electrode.
11. The MEMS device according to claim 1, wherein the movable electrode is formed as a cantilever.
12. The MEMS device according to claim 11, wherein the MEMS device forms an acceleration sensor or a humidity sensor.
13. The MEMS device according to claim 2, wherein the one or more spacers have a material having a reduced thermal conductivity when compared to a material of the movable electrode or of the substrate.
14. The MEMS device according to claim 13, wherein the MEMS device forms a bolometer.
15. The MEMS device according to claim 10, wherein a further spacer is arranged in an area of the opening in order to hermetically close a cavity below a membrane formed by the movable electrode.
16. The MEMS device according to claim 15, wherein the MEMS device forms a pressure sensor.
17. A MEMS device, comprising:
- a substrate comprising a fixed electrode; and
- a movable electrode arranged isolated and spaced from the fixed electrode by a distance, the movable electrode having a square shape;
- wherein the movable electrode is suspended from the fixed electrode by one or more spacers comprising an insulating oxide at its corners, wherein the movable electrode is laterally affixed to the one or more spacers;
- wherein the distance between the fixed electrode and the movable electrode is variable and wherein a variation of the distance leads to a variation of a capacitance.
18. A MEMS device, comprising:
- a fixed electrode; and
- a movable electrode arranged isolated and spaced from the fixed electrode by a distance;
- wherein the movable electrode is suspended from the fixed electrode by one or more spacers comprising an insulating material, wherein the movable electrode is laterally affixed to the one or more spacers,
- wherein a footprint of the one or more spacers is at least 20 times smaller than a footprint of the movable electrode.
19. A method for manufacturing a MEMS device, comprising:
- providing a sacrificial layer over a fixed electrode;
- providing a movable electrode over the sacrificial layer such that a layer stack comprising the sacrificial layer and the movable electrode is formed;
- providing one or more spacers comprising an insulating material adjacent to the layer stack such that the movable electrode is laterally affixed to the one or more spacers; and
- removing the sacrificial layer at least in a portion aligned with a portion of the movable electrode such that the movable electrode is spaced from the fixed electrode by a distance that is related to a thickness of the sacrificial layer;
- wherein the movable electrode is suspended from the fixed electrode by the one or more spacers.
20. The method according to claim 19, wherein providing the one or more spacers is performed such that an opening is formed in between.
21. The method according to claim 19, wherein providing the one or more spacers comprises anisotropic etching and/or using lithography in order to limit a footprint of the one or more spacers.
22. The method according to claim 21, wherein the anisotropic etching and/or using lithography is performed such that the footprint of the one or more spacers is at least 10 times smaller than a footprint of the movable electrode.
23. The method according to claim 20, wherein removing the sacrificial layer comprises etching or isotropic etching through the opening.
24. The method according to claim 20, further comprising closing the opening by a further spacer after removing the sacrificial layer.
25. The method according to claim 19, further comprising defining the area of the layer stack by using lithography and/or anisotropic etching before providing the one or more spacers.
26. The method according to claim 25, wherein defining the area of the layer stack comprises forming at least one hole in the layer stack for the one or more spacers, and
- wherein the one or more spacers are embedded in the movable electrode.
27. The method according to claim 19, wherein removing the sacrificial layer is performed in a portion where the fixed electrode is aligned with the entire movable electrode.
28. The method according to claim 19, wherein an etch rate of the sacrificial layer differs from an etch rate of the membrane and/or of the spacer.
Type: Application
Filed: Oct 16, 2015
Publication Date: Feb 25, 2016
Inventors: Stefan Kolb (Unterschleissheim), Andreas Meiser (Sauerlach), Till Schloesser (Muenchen), Wolfgang Werner (Muenchen)
Application Number: 14/885,255