Microscope

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Description

FIG. 1 is a front view of a first embodiment thereof;

FIG. 2 is a rear view of the first embodiment thereof;

FIG. 3 is a left side view of the first embodiment thereof;

FIG. 4 is a right side view of the first embodiment thereof;

FIG. 5 is a top view of the first embodiment thereof;

FIG. 6 is a bottom view of the first embodiment thereof;

FIG. 7 is a front left perspective view of the first embodiment thereof;

FIG. 8 is a rear right perspective view of the first embodiment thereof;

FIG. 9 is a front left perspective view of the first embodiment thereof showing light bands illuminated;

FIG. 10 is a rear right perspective view of the first embodiment thereof showing light bands illuminated;

FIG. 11 is a front view of a second embodiment thereof;

FIG. 12 is a rear view of the second embodiment thereof;

FIG. 13 is a left side view of the second embodiment thereof;

FIG. 14 is a right side view of the second embodiment thereof;

FIG. 15 is a top view of the second embodiment thereof;

FIG. 16 is a bottom view of the second embodiment thereof;

FIG. 17 is a front left perspective view of the second embodiment thereof;

FIG. 18 is a rear right perspective view of the second embodiment thereof;

FIG. 19 is a front left perspective view of the second embodiment thereof showing light bands illuminated; and,

FIG. 20 is a rear right perspective view of the second embodiment thereof showing light bands illuminated.

Claims

The ornamental design for a microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D639324 June 7, 2011 Stohr
D736843 August 18, 2015 Hofmann
D737354 August 25, 2015 Hofmann
D743463 November 17, 2015 Hofmann
D748176 January 26, 2016 Hofmann
D754229 April 19, 2016 Aschenbach
D819104 May 29, 2018 Stohr
D947917 April 5, 2022 Matuschek
D967223 October 18, 2022 Schultze
20200218051 July 9, 2020 Goegler
Foreign Patent Documents
319566-001-0001 May 2020 IN
Patent History
Patent number: D1024157
Type: Grant
Filed: Jul 17, 2019
Date of Patent: Apr 23, 2024
Assignee: Carl Zeiss Microscopy GmbH (Jena)
Inventors: Fang Dong (Shanghai), Leander Dietzsch (Jena), Qi Cao (Shanghai), Jochen Ingo Schweizer (Fürstenfeldbruck), Ilka Schlesiger (Jena), Jacquelyn Schmelter (Weimar), Martin Stohr (Jena), Michael Winterot (Jena), Qiong Zhang (Jena)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/698,549
Classifications
Current U.S. Class: Microscope (D16/131)