Band for wearable electronic device
Latest SAMSUNG ELECTRONICS CO., LTD. Patents:
- METHOD FOR FORMING OVERLAY MARK AND OVERLAY MEASUREMENT METHOD USING THE OVERLAY MARK
- IMAGE SENSOR
- OPERATION METHOD OF HOST CONTROLLING COMPUTING DEVICE, AND OPERATION METHOD OF ARTIFICIAL INTELLIGENCE SYSTEM INCLUDING COMPUTING DEVICE AND HOST
- METHOD OF MANUFACTURING INTEGRATED CIRCUIT DEVICES
- COMPOUND AND PHOTOELECTRIC DEVICE, IMAGE SENSOR, AND ELECTRONIC DEVICE INCLUDING THE SAME
Description
The broken lines depict portions of the band for wearable electronic device that form no part of the claimed design.
Claims
The ornamental design for a band for wearable electronic device, as shown and described.
Referenced Cited
U.S. Patent Documents
D585320 | January 27, 2009 | Nussbaumer |
D798183 | September 26, 2017 | Monachon |
D799361 | October 10, 2017 | Monachon |
D800007 | October 17, 2017 | Tibi |
D814328 | April 3, 2018 | Behling |
D820713 | June 19, 2018 | Oh |
D834439 | November 27, 2018 | Monachon |
D837675 | January 8, 2019 | Tibi |
D864012 | October 22, 2019 | Chen |
D995516 | August 15, 2023 | Lee |
D997014 | August 29, 2023 | Tibi |
D1029827 | June 4, 2024 | Kim |
Patent History
Patent number: D1073520
Type: Grant
Filed: Oct 11, 2023
Date of Patent: May 6, 2025
Assignee: SAMSUNG ELECTRONICS CO., LTD. (Gyeonggi-Do)
Inventor: Juan Lee (Suwon-si)
Primary Examiner: Llorelys Martinez-Rivera
Application Number: 29/904,745
Type: Grant
Filed: Oct 11, 2023
Date of Patent: May 6, 2025
Assignee: SAMSUNG ELECTRONICS CO., LTD. (Gyeonggi-Do)
Inventor: Juan Lee (Suwon-si)
Primary Examiner: Llorelys Martinez-Rivera
Application Number: 29/904,745
Classifications
Current U.S. Class:
Encircling, I.e., Necklace, Bracelet, Etc. (1) (D11/3)