Testing device
The broken lines depict portions of the testing device that form no part of the claimed design. The dot-dash broken lines indicating an enlargement portion of the design form no part of the claimed design.
Claims
The ornamental design for a testing device, as shown and described.
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- “TTS Series Products Newly Unveiled: Making Development and Testing Easier!”, [site visited May 27, 2025]. Available from Internet. URL: https://www.tosunai.com/en/tts-series-products-newly-unveiled/ published Jul. 2, 2024 (Year: 2024).
Type: Grant
Filed: May 27, 2024
Date of Patent: Aug 5, 2025
Assignee: SHANGHAI TOSUN TECHNOLOGY LTD. (Shanghai)
Inventors: Mang Mo (Shanghai), Yueyin Xie (Shanghai), Chu Liu (Shanghai)
Primary Examiner: T Chase Nelson
Assistant Examiner: Kelly L Gross
Application Number: 29/944,171