Analysis system

- CEPHEID
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Description

FIG. 1 is a front perspective view of an analysis system showing our new design;

FIG. 2 is a rear perspective view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a left side elevational view thereof; and,

FIG. 8 is a right side elevational view thereof.

The portions shown in broken lines form no part of the claimed design.

Claims

The ornamental design for an analysis system, as shown and described.

Referenced Cited
U.S. Patent Documents
D356967 April 4, 1995 Takekoshi et al.
D380273 June 24, 1997 Emerson et al.
D503479 March 29, 2005 Ina et al.
D599688 September 8, 2009 Ito
D654184 February 14, 2012 Oonuma et al.
D657067 April 3, 2012 Shibata
D657068 April 3, 2012 Shibata
Patent History
Patent number: D684270
Type: Grant
Filed: Feb 3, 2012
Date of Patent: Jun 11, 2013
Assignee: CEPHEID (Sunnyvale, CA)
Inventors: Ron Chang (Sunnyvale, CA), Steven M. Montgomery (Sunnyvale, CA), Gregory E. Mote (Sunnyvale, CA)
Primary Examiner: Anhdao Doan
Application Number: 29/412,453
Classifications