Apparatus for measuring light scattering of a sample

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Description

FIG. 1 is a partial front top perspective view of a first embodiment of an apparatus for measuring light scattering of a sample;

FIG. 2 is a partial top perspective view thereof;

FIG. 3 is a front top perspective view of a second embodiment of an apparatus for measuring light scattering of a sample showing my new design;

FIG. 4 is a partial top perspective view thereof;

FIG. 5 is a partial front top perspective view of a third embodiment of an apparatus for measuring light scattering of a sample; and,

FIG. 6 is a partial top perspective view thereof.

The features of the an apparatus for measuring light scattering of a sample shown in broken lines form no part of the claimed design.

Claims

The ornamental design for an apparatus for measuring light scattering of a sample, as shown and described.

Referenced Cited
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11852584 December 26, 2023 Kuebler
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Foreign Patent Documents
2677970 February 2005 CN
Patent History
Patent number: D1108988
Type: Grant
Filed: Jul 2, 2024
Date of Patent: Jan 13, 2026
Assignee: Wyatt Technology, LLC (Goleta, CA)
Inventors: Sigrid C. Kuebler (Old Orchard Beach, ME), Ross E. Bryant (Cape Elizabeth, ME), Shiladitya Sen (Goleta, CA), Ryan Olson (Goleta, CA), Nicholas Wong (Santa Barbara, CA), Marco Vanella (Santa Barbara, CA), Ryan Thomas (Santa Barbara, CA), Patrick Tufts (Santa Barbara, CA), Jared Naito (Santa Barbara, CA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/950,402