Handheld current sensor
Elements shown in broken lines are for illustrative purposes only and form no part of the claimed design.
Claims
The ornamental design for a handheld current sensor as shown and described.
| D351562 | October 18, 1994 | Moffatt |
| D383988 | September 23, 1997 | Luebke |
| 5877618 | March 2, 1999 | Luebke |
| D410203 | May 25, 1999 | Beha |
| D461424 | August 13, 2002 | Luebke et al. |
| D500799 | January 11, 2005 | Olson |
| D501415 | February 1, 2005 | Seymour |
| D514963 | February 14, 2006 | Shionoiri et al. |
| D571240 | June 17, 2008 | Chun |
| D583266 | December 23, 2008 | Wong |
| D625211 | October 12, 2010 | Chun |
| D642943 | August 9, 2011 | Laurino |
| D661605 | June 12, 2012 | Laurino |
| D684876 | June 25, 2013 | Laurino et al. |
| D738241 | September 8, 2015 | Payne |
| D739278 | September 22, 2015 | Payne |
| D769139 | October 18, 2016 | Thrasher et al. |
| 10559173 | February 11, 2020 | Hickman |
| D931128 | September 21, 2021 | Li |
| D947694 | April 5, 2022 | Moutzouris |
| 11320462 | May 3, 2022 | Constable et al. |
| D1064874 | March 4, 2025 | Woo |
| D1067073 | March 18, 2025 | Li |
| D1068515 | April 1, 2025 | Simard |
| 20180328965 | November 15, 2018 | Yuan |
| 20190317138 | October 17, 2019 | Thrasher et al. |
| 3509868 | March 2006 | CN |
| 300979193 | August 2009 | CN |
| 306255026 | December 2020 | CN |
| 306411154 | March 2021 | CN |
| 306529755 | May 2021 | CN |
- Ashwak, 10 Best Voltage Testers in 2022 Reviews & Buying Guide, available from https://www.electronicshub.org/best-voltage-testers/ (Year:2022).
- Southwire Store, NCV Detectors, available from https://www.amazon.com/DP/B01M24N714 ( Year: 2017).
- Fluke Store, Voltage Detectors, available from https://www.amazon.com/DP/B00PR02OHU (Year: 2016).
Type: Grant
Filed: Jun 13, 2024
Date of Patent: Feb 17, 2026
Inventors: Issam Nemeh (Westlake, OH), Fadia Nemeh (Westlake, OH), Wadi Nemeh (Westlake, OH), David Mandel (Alexandria, VA), Paul Gancitano (Washington, DC), Christopher Terella (Stow, MA), Andreas Mershin (Arlington, MA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/947,210