Measurement probe head
The broken lines shown are included for the purpose of illustrating portions of the measurement probe head that form no part of the claim.
Claims
The ornamental design for a measurement probe head, as shown and described.
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Type: Grant
Filed: Sep 7, 2022
Date of Patent: Mar 10, 2026
Assignee: TEKTRONIX, INC. (Beaverton, OR)
Inventor: David Thomas Engquist (Portland, OR)
Primary Examiner: Christian P. Mclean
Assistant Examiner: Sara S Sahneh
Application Number: 29/852,507