Measurement probe head

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Description

FIG. 1 is a front-side isometric view of a measurement probe head according to a first embodiment of the disclosed design.

FIG. 2 is a rear-side isometric view of the measurement probe head of FIG. 1.

FIG. 3 is a right-side view of the measurement probe head of FIG. 1.

FIG. 4 is a top view of the measurement probe head of FIG. 1.

FIG. 5 is a left-side view of the measurement probe head of FIG. 1.

FIG. 6 is a bottom view of the measurement probe head of FIG. 1.

FIG. 7 is a front-side view of the measurement probe head of FIG. 1.

FIG. 8 is a rear-side view of the measurement probe head of FIG. 1.

FIG. 9 is a front-side isometric view of measurement probe head according to a second embodiment of the disclosed design.

FIG. 10 is a rear-side isometric view of the measurement probe head of FIG. 9.

FIG. 11 is a right-side view of the measurement probe head of FIG. 9.

FIG. 12 is a top view of the measurement probe head of FIG. 9.

FIG. 13 is a left-side view of the measurement probe head of FIG. 9.

FIG. 14 is a bottom view of the measurement probe head of FIG. 9.

FIG. 15 is a front-side view of the measurement probe head of FIG. 9; and,

FIG. 16 is a rear-side view of the measurement probe head of FIG. 9.

The broken lines shown are included for the purpose of illustrating portions of the measurement probe head that form no part of the claim.

Claims

The ornamental design for a measurement probe head, as shown and described.

Referenced Cited
U.S. Patent Documents
5986446 November 16, 1999 Williamson
6400167 June 4, 2002 Gessford
7017435 March 28, 2006 Pooley
D602384 October 20, 2009 Samborn
D808832 January 30, 2018 Engquist
D935923 November 16, 2021 Liu
D947693 April 5, 2022 Engquist
D983058 April 11, 2023 Sallander
D1068515 April 1, 2025 Simard
20180328962 November 15, 2018 Mende
20210148640 May 20, 2021 Campbell
20240118336 April 11, 2024 Engquist
20240125814 April 18, 2024 Haga
Foreign Patent Documents
202130300844.9 May 2021 CN
308221893 March 2023 CN
309042738 June 2024 CN
Other references
  • Tektronix,IsoVu™ Isolated Current Probes TICP100, TICP050, TICP025 Datasheet,Date first available Apr. 21, 2025, [online] retrieved Oct. 14, 2025,available from file:///C:/Users/ssahneh/Downloads/TICP-Datasheet-51W740633%20(1).pdf (Year: 2025).
  • Tektronix,DPO7OE Series Optical Probes DPO7OE1 and DPO7OE2 ,Date first available Sep. 12, 2018,retrieved Oct. 14, 2025, available from https://download.tek.com/datasheet/DPO7OE1-33GHZ-Optical-to-Electrical-Converter-Probe-Datasheet-55W612813.pdf?_gl=1*17nokhj*_gcl_au*MTI4NTEzNTYyMS4xNzYwNDc1NTI2*_ (Year: 2018).
  • Active Probe, Date first available Jun. 3, 2009, [online]retrieved Oct. 14, 2025,available from https://download.tek.com/datasheet/60W_14871_2.pdf?_gl=1*1y9atxg*_gcl_au*MTI4NTEzNTYyMS4xNzYwNDc1NTI2 *_ga*MTIxMjMzOTMzNi4xNzYwNDc1NTI2*_ga_1HMYS1JH9M*czE3NjA0NzU1MjUkbzEkZ (Year: 2009).
Patent History
Patent number: D1116879
Type: Grant
Filed: Sep 7, 2022
Date of Patent: Mar 10, 2026
Assignee: TEKTRONIX, INC. (Beaverton, OR)
Inventor: David Thomas Engquist (Portland, OR)
Primary Examiner: Christian P. Mclean
Assistant Examiner: Sara S Sahneh
Application Number: 29/852,507