Electron emitter

- Denka Company Limited
Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a front view of an electron emitter of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a perspective view thereof;

FIG. 8 is an enlarged partial perspective view thereof defined by line 8-8 in FIG. 1;

FIG. 9 is an enlarged cross-sectional view thereof defined by line 9-9 in FIG. 3;

FIG. 10 is a top plane view of FIG. 8 thereof; and,

FIG. 11 is an enlarged cross-sectional view defined by line 11-11 of FIG. 1.

The broken lines show portions of the electron emitter that form no part of the claimed design. The broken lines around the electron emitter in FIG. 10 and the long-dash-short dash lines depict boundary lines that form no part of the claimed design.

The alternate long and short dash lines are merely the boundary lines between the claimed parts and the non-claimed parts.

Claims

The ornamental design for an electron emitter as shown and described.

Referenced Cited
U.S. Patent Documents
2464396 March 1949 Hillier
4055780 October 25, 1977 Kawai
4143292 March 6, 1979 Hosoki
4427886 January 24, 1984 Martin
5616926 April 1, 1997 Shinada
5838096 November 17, 1998 Shinada
5962961 October 5, 1999 Sakai
6903499 June 7, 2005 Terui
D618636 June 29, 2010 Hsieh
7888654 February 15, 2011 Tessner, II
D730962 June 2, 2015 Ominami
D731570 June 9, 2015 Ominami
9847208 December 19, 2017 Adamec
D869662 December 10, 2019 Sargent
11322329 May 3, 2022 Kusunoki
11508544 November 22, 2022 Matsunaga
11749492 September 5, 2023 Liu
12125663 October 22, 2024 Ishikawa
20040026629 February 12, 2004 Fujieda
20060124958 June 15, 2006 Cox
20080174225 July 24, 2008 Tessner
20080315096 December 25, 2008 Kim
20100038557 February 18, 2010 Zach
20140197725 July 17, 2014 Katagiri
20150047079 February 12, 2015 Kozakai
20190237289 August 1, 2019 Kasuya
20200234907 July 23, 2020 Asulin
20220037107 February 3, 2022 Matsunaga
20220293387 September 15, 2022 Liu
20240153730 May 9, 2024 Ishikawa
20240347306 October 17, 2024 Chatani
Foreign Patent Documents
300827958 September 2008 CN
Other references
  • Scanning Electron Microscope, Date May 21, 2010 [online], [retrieved Jun. 20, 2025], Retrieved online, https://yunus.hacettepe.edu.tr/~selis/teaching/WEBkmu396/ppt/Presentations2010/SEM.pdf (Year: 2010).
  • Micro to Nano, Date Jun. 16, 2015 [online], [retrieved Jun. 20, 2025], Retrieved online, https://www.nanotech-now.com/news.cgi?story_id=51697(Year: 2015).
  • Tegara Co, Date Oct. 3, 2019 [online], [retrieved Jun. 20, 2025], Retrieved online, https://www.tegakari.net/en/2019/10/kimball_physics_cathodes/ (Year: 2019).
Patent History
Patent number: D1142263
Type: Grant
Filed: Nov 29, 2022
Date of Patent: Aug 18, 2026
Assignee: Denka Company Limited (Tokyo)
Inventor: Daisuke Ishikawa (Tokyo)
Primary Examiner: Christian P. Mclean
Application Number: 29/861,313