Inside micrometer

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Description

FIG. 1 is a front elevational view of an inside micrometer showing my new design;

FIG. 2 is a right side elevational view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a top plan view thereof; and

FIG. 6 is a bottom view thereof.

Referenced Cited
U.S. Patent Documents
D57932 May 1921 Scott
D192384 March 1962 Wiegel
2535881 December 1950 Vangor
2584602 February 1952 McKee
2826820 March 1958 Zelnick
2883758 April 1959 Zelnick
Patent History
Patent number: D249127
Type: Grant
Filed: Oct 18, 1976
Date of Patent: Aug 29, 1978
Assignee: Mitutoyo Manufacturing Company, Ltd. (Tokyo)
Inventor: Takeshi Yamamoto (Kawasaki)
Primary Examiner: Nelson C. Holtje
Attorney: Frank J. Jordan
Application Number: 5/733,481
Classifications
Current U.S. Class: Micrometer, Caliper Or Divider Type (D10/73)
International Classification: D1004;