Depth micrometer

- Mitutoyo Mfg. Co., Ltd.
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Description

FIG. 1 is a right front perspective view of a depth micrometer showing my new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a front elevational view thereof;

FIG. 7 is a right side elevational view thereof.

Referenced Cited
U.S. Patent Documents
2520022 August 1950 Vobeda
2717451 September 1955 Gondek
2855686 October 1958 Zelnick
2893130 July 1959 Ierokomos
3018557 January 1962 Nakata
3753295 August 1973 Hecklinger
Patent History
Patent number: D254656
Type: Grant
Filed: Mar 2, 1978
Date of Patent: Apr 8, 1980
Assignee: Mitutoyo Mfg. Co., Ltd. (Tokyo)
Inventor: Hiroaki Suwa (Hiroshima)
Primary Examiner: Nelson C. Holtje
Law Firm: Koda and Androlia
Application Number: 5/883,036
Classifications
Current U.S. Class: Micrometer, Caliper Or Divider Type (D10/73); Linear Or Distance (9) (D10/70)
International Classification: D1004;