Electronic thermometer probe

- Terumo Kabushiki Kaisha
Description

FIG. 1 is a front elevational view of an electronic thermometer probe showing our new design;

FIG. 2 is a top plan view, the bottom plan view being identical;

FIG. 3 is a rear elevational view;

FIG. 4 is a left side elevational view;

FIG. 5 is a right side elevational view; and

FIG. 6 is a cross-sectional view taken along line 6--6 of FIG. 1 thereof.

Referenced Cited
U.S. Patent Documents
D261367 October 20, 1981 Janson
D277267 January 22, 1985 Knute
D287473 December 30, 1986 Ueno
D287829 January 20, 1987 Osaka
D299812 February 14, 1989 Sakaguchi et al.
D300609 April 11, 1989 Leverty
Patent History
Patent number: D311696
Type: Grant
Filed: Feb 5, 1988
Date of Patent: Oct 30, 1990
Assignee: Terumo Kabushiki Kaisha (Tokyo)
Inventors: Tetsuya Ide (Fujinomiya), Kenichi Kida (Tokyo)
Primary Examiner: Nelson C. Holtje
Assistant Examiner: Antoine D. Davis
Law Firm: Oblon, Spivak, McClelland, Maier & Neustadt
Application Number: 7/152,580
Classifications