Electronic thermometer probe

- Terumo Kabushiki Kaisha
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Description

FIG. 1 is a front elevational view of a electronic thermometer probe showing our new design;

FIG. 2 is a left side elevational view;

FIG. 3 is a right side elevational view;

FIG. 4 is a rear elevational view;

FIG. 5 is a top plan view;

FIG. 6 is a bottom plan view; and

FIG. 7 is a cross-sectional view taken along line 7--7 of FIG. 1 thereof.

Referenced Cited
U.S. Patent Documents
D287473 December 30, 1986 Ueno
D287829 January 20, 1987 Osaka
D299700 February 7, 1989 Yubisui et al.
D299812 February 14, 1989 Sakaguchi et al.
D300609 April 11, 1989 Leverty
3597975 August 1971 Kern
Patent History
Patent number: D312047
Type: Grant
Filed: Feb 5, 1988
Date of Patent: Nov 13, 1990
Assignee: Terumo Kabushiki Kaisha (Tokyo)
Inventors: Tetsuya Ide (Fujinomiya), Kenichi Kida (Tokyo)
Primary Examiner: Nelson C. Holtje
Assistant Examiner: Antonie D. Davis
Law Firm: Oblon, Spivak, McClelland, Maier & Neustadt
Application Number: 7/152,582
Classifications
Current U.S. Class: Element Or Attachment (4) (D10/60)