Electronic thermometer probe
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Description
FIG. 1 is a front elevational view of a electronic thermometer probe showing our new design;
FIG. 2 is a left side elevational view;
FIG. 3 is a right side elevational view;
FIG. 4 is a rear elevational view;
FIG. 5 is a top plan view;
FIG. 6 is a bottom plan view; and
FIG. 7 is a cross-sectional view taken along line 7--7 of FIG. 1 thereof.
Referenced Cited
Patent History
Patent number: D312047
Type: Grant
Filed: Feb 5, 1988
Date of Patent: Nov 13, 1990
Assignee: Terumo Kabushiki Kaisha (Tokyo)
Inventors: Tetsuya Ide (Fujinomiya), Kenichi Kida (Tokyo)
Primary Examiner: Nelson C. Holtje
Assistant Examiner: Antonie D. Davis
Law Firm: Oblon, Spivak, McClelland, Maier & Neustadt
Application Number: 7/152,582
Type: Grant
Filed: Feb 5, 1988
Date of Patent: Nov 13, 1990
Assignee: Terumo Kabushiki Kaisha (Tokyo)
Inventors: Tetsuya Ide (Fujinomiya), Kenichi Kida (Tokyo)
Primary Examiner: Nelson C. Holtje
Assistant Examiner: Antonie D. Davis
Law Firm: Oblon, Spivak, McClelland, Maier & Neustadt
Application Number: 7/152,582
Classifications
Current U.S. Class:
Element Or Attachment (4) (D10/60)