Integrated circuit test clip

- John Fluke Mfg. Co., Inc.
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Description

FIG. 1 is a perspective view of an integrated circuit test clip, showing our new design;

FIG. 2 is a side elevation view thereof, the opposite side being substantially identical to that shown;

FIG. 3 is a side elevation view thereof, orthogonal to the view shown in FIG. 2, the opposite side being substantially identical to that shown;

FIG. 4 is a top plan view thereof; and

FIG. 5 is a bottom plan view thereof.

The cables have been broken away in FIGS. 1-4 to indicate indeterminate length.

Referenced Cited
U.S. Patent Documents
D284185 June 10, 1986 Anderson
3506949 April 1970 Venaleck et al.
3963986 June 15, 1976 Morton et al.
4055806 October 25, 1977 Patel
4541676 September 17, 1985 Hansen et al.
4671592 June 9, 1987 Ignasiak et al.
Other references
  • Pomona Electronics Co., Inc. Cat. 1972, p. 32, Test Clip A, bottom right side of page, and p. 33, Mini Test Clips 1 and Model 3780, top right and top middle sides of page respectively. E-Z Hook Catalog. Design News, 7/86, p. 211, Test Clips, top middle of page.
Patent History
Patent number: D318456
Type: Grant
Filed: Jul 24, 1987
Date of Patent: Jul 23, 1991
Assignee: John Fluke Mfg. Co., Inc. (Everett, WA)
Inventors: Wayne R. Jones (Aldrewood Manor, WA), Daniel J. Voss (Seattle, WA)
Primary Examiner: James M. Gandy
Assistant Examiner: Lisa Lichtenstein
Attorney: Stephen A. Becker
Application Number: 7/77,778