Portable electronic thickness measuring instrument

Description

FIG. 1 is a front elevational view of a portable electronic thickness measuring instrument showing my new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a right side elevational view;

FIG. 4 is a left side elevational view;

FIG. 5 is a bottom plan view; and,

FIG. 6 is a rear elevational view thereof.

Referenced Cited
U.S. Patent Documents
D254778 April 22, 1980 Kitada et al.
4164707 August 14, 1979 Nix
4400665 August 23, 1983 Nix
4425546 January 10, 1984 Taylor
4459550 July 10, 1984 Nix
4904939 February 27, 1990 Mian
Other references
  • PosiTest.TM., Das Schichtdicken-Bessgerat, daskaum zu *schlagen ist, Der Messkopf ist mit einer Hartmetall-Kugel bestuckt. PosiTector.RTM. 2000, 3000, 300, Automation Ko, Dr. Nix GmbH, Robert-Perthel Strass 2, 500 Koln 60. Mono-Check, Schichtdickenmessung auf Eisen, Lixt-Magnetik, Dipl.-lng. Heinrich List GmbH., Max-Lang-Strasse 56, D-7033 Leinfelden-Echterdingen. Permascope.RTM. MPO, Helmut Fischer GmbH & Company, Institute fur Elektronik und Messtechnik, Postfach 4, D-7032 Sindelfingen 6.
Patent History
Patent number: D335463
Type: Grant
Filed: Jan 2, 1991
Date of Patent: May 11, 1993
Inventor: Norbert Nix (5000 Koln 60)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Law Firm: Nikaido, Marmelstein, Murray & Oram
Application Number: 7/636,974
Classifications