Console for measurement scanner for semi-conductor

- Hitachi, Ltd.
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Description

FIG. 1 is a front, top and right side perspective view of a console for measurement scanner for semi-conductor showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a right side view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D342909 January 4, 1994 Marchais
D344719 March 1, 1994 Wang et al.
D352911 November 29, 1994 Yamamoto et al.
Patent History
Patent number: D360598
Type: Grant
Filed: Jul 26, 1994
Date of Patent: Jul 25, 1995
Assignee: Hitachi, Ltd. (Tokyo)
Inventors: Toshihiko Wada (Murashimurayama), Osamu Yamada (Katsuta), Shinobu Otsuka (Katsuta)
Primary Examiner: Antoine Duval Davis
Law Firm: Antonelli, Terry, Stout & Kraus
Application Number: 0/25,208
Classifications
Current U.S. Class: Electrical Property (D10/75)