Ring for probe card
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Description
FIG. 1 is a top plan view of the ring for probe card showing our new design, the bottom view being a mirror image thereof;
FIG. 2 is a left side elevational view, the right side elevational view being a mirror image thereof;
FIG. 3 is a front elevational view, the rear elevational view being a mirror image thereof; and,
FIG. 4 is a cross-sectional view, taken on line A--A of FIG. 1.
Referenced Cited
U.S. Patent Documents
D305887 | February 6, 1990 | Nishimura |
D328599 | August 11, 1992 | Gloton |
D331922 | December 22, 1992 | Gloton |
D335663 | May 18, 1993 | Gloton |
D344502 | February 22, 1994 | Gloton |
D353136 | December 6, 1994 | Gloton |
D365092 | December 12, 1995 | Mundigl et al. |
D374870 | October 22, 1996 | Gaumet |
D388066 | December 23, 1997 | Ishihara |
D393458 | April 14, 1998 | Merlin et al. |
D405078 | February 2, 1999 | Ross |
Patent History
Patent number: D424539
Type: Grant
Filed: Oct 13, 1998
Date of Patent: May 9, 2000
Assignee: Nihon Denshizairyo Kabushiki Kaisha (Amagasaki)
Inventor: Hiroyuki Shiroki (Nishinomiya)
Primary Examiner: M. H. Tung
Law Firm: Armstrong, Westerman. Hattori, McLeland & Naughton
Application Number: 0/94,909
Type: Grant
Filed: Oct 13, 1998
Date of Patent: May 9, 2000
Assignee: Nihon Denshizairyo Kabushiki Kaisha (Amagasaki)
Inventor: Hiroyuki Shiroki (Nishinomiya)
Primary Examiner: M. H. Tung
Law Firm: Armstrong, Westerman. Hattori, McLeland & Naughton
Application Number: 0/94,909
Classifications
Current U.S. Class:
D14/114
International Classification: 1402;
International Classification: 1402;