DNA detector
Latest Hitachi, Ltd. Patents:
Description
FIG. 1 is a front, top and left side perspective view of an DNA detector showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof; and,
FIG. 8 is a front, top and left side perspective view thereof, with the drawer shown shown in open position.
Referenced Cited
Patent History
Patent number: D430304
Type: Grant
Filed: Feb 3, 1999
Date of Patent: Aug 29, 2000
Assignee: Hitachi, Ltd. (Tokyo)
Inventors: Mitsuru Oonuma (Tokyo), Seiji Kamimura (Kokubunji), Atsushi Ninomiya (Oome), Isamu Takekoshi (Tokyo), Kazumichi Imai (Hitachinaka)
Primary Examiner: Ian Simmons
Law Firm: Antonelli, Terry, Stout & Kraus, LLP
Application Number: 0/100,091
Type: Grant
Filed: Feb 3, 1999
Date of Patent: Aug 29, 2000
Assignee: Hitachi, Ltd. (Tokyo)
Inventors: Mitsuru Oonuma (Tokyo), Seiji Kamimura (Kokubunji), Atsushi Ninomiya (Oome), Isamu Takekoshi (Tokyo), Kazumichi Imai (Hitachinaka)
Primary Examiner: Ian Simmons
Law Firm: Antonelli, Terry, Stout & Kraus, LLP
Application Number: 0/100,091
Classifications
Current U.S. Class:
Electrophoresis (D24/233);
Laboratory Equipment Not Elsewhere Specified (D24/232)
International Classification: 2402;
International Classification: 2402;