Contactor for semiconductor IC testers

- Advantest Corporation
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Description

FIG. 1 is a perspective view of a contactor for semiconductor IC testers;

FIG. 2 is a top plan view in a reduced scale of FIG. 1;

FIG. 3 is a bottom plan in a reduced scale of FIG. 1;

FIG. 4 is a front elevational view in a reduced scale of FIG. 1;

FIG. 5 is a left side elevational view in a reduced scale of FIG. 1, the right side elevational view being a mirror image of the left side elevational view; and,

FIG. 6 is a center horizontal cross-sectional view in an enlarged scale of FIG. 2.

Referenced Cited
U.S. Patent Documents
D239006 March 1976 Kelley
D305224 December 26, 1989 Iwashita
D312816 December 11, 1990 Huang
D404710 January 26, 1999 Lai et al.
Patent History
Patent number: D432504
Type: Grant
Filed: Aug 13, 1999
Date of Patent: Oct 24, 2000
Assignee: Advantest Corporation (Tokyo)
Inventor: Shigeru Matsumura (Tokyo)
Primary Examiner: Brian N. Vinson
Law Firm: Christie, Parker & Hale, LLP
Application Number: 0/109,357
Classifications
Current U.S. Class: Semiconductor, Transistor Or Integrated Circuit (24) (D13/182)
International Classification: 1303;