Microscope stand

- Leica Microsystems Inc.
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Description

FIG. 1 is a perspective view of a microscope stand showing our new design;

FIG. 2 is a left side elevational view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a bottom plan view thereof; and,

FIG. 7 is a top plan view thereof.

In the Figures, the broken lines are for illustrative purposes only and form no part of the claimed invention.

Claims

The ornamental design for a microscope stand, as shown and described.

Referenced Cited
U.S. Patent Documents
D260402 August 25, 1981 Hodgson
D345748 April 5, 1994 Hölbl
D389163 January 13, 1998 Hofmann-Igl
D400548 November 3, 1998 Komatsuzaki
D425921 May 30, 2000 Hölbl et al.
D429265 August 8, 2000 Hölbl et al.
Patent History
Patent number: D444159
Type: Grant
Filed: Mar 27, 2000
Date of Patent: Jun 26, 2001
Assignee: Leica Microsystems Inc. (Depew, NY)
Inventors: Werner Hoelbl (Vienna), Scott W. Parks (E. Amherst, NY)
Primary Examiner: Paula A. Mortimer
Attorney, Agent or Law Firm: Simpson, Simpson & Snyder, L.L.P.
Application Number: 29/120,833
Classifications
Current U.S. Class: Microscope (D16/131)
International Classification: 1606;