Measurement surveying device

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Description

FIG. 1 is a front elevational view of the measurement surveying device;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a partially-enlarged view of the rear elevational view;

FIG. 8 is a partially-enlarged view of the right side elevational view;

FIG. 9 is a partially-enlarged view of the left side elevational view;

FIG. 10 is a partially-enlarged view of the top plan view;

FIG. 11 is a perspective view of the measurement surveying device; and,

FIG. 12 is another perspective view of the measurement surveying device.

Claims

The ornamental design for a measurement surveying device, as shown and described.

Referenced Cited
U.S. Patent Documents
D409507 May 11, 1999 Ishii
D427087 June 27, 2000 Kaneko et al.
6182372 February 6, 2001 Lamm
Foreign Patent Documents
943897 October 1995 JP
943897-2 April 1997 JP
943897-3 May 1997 JP
943897-4 May 1998 JP
943897-5 June 1998 JP
943897-6 February 1999 JP
943897-7 February 1999 JP
943897-8 February 1999 JP
1081383 May 2000 JP
Patent History
Patent number: D447066
Type: Grant
Filed: Oct 19, 2000
Date of Patent: Aug 28, 2001
Assignee: Asahi Seimitsu Kabushiki Kaisha (Tokyo)
Inventors: Homu Takayama (Tokyo), Kenji Kaneko (Tokyo), Masayuki Ueno (Tokyo)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Sughrue, Mion, Zinn, Macpeak & Seas, PLLC
Application Number: 29/131,305
Classifications
Current U.S. Class: Transit Or Theodolite (D10/66)
International Classification: 1004;