Measurement surveying device
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FIG. 1 is a front elevational view of the measurement surveying device;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a right side elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a top plan view thereof;
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a partially-enlarged view of the rear elevational view;
FIG. 8 is a partially-enlarged view of the right side elevational view;
FIG. 9 is a partially-enlarged view of the left side elevational view;
FIG. 10 is a partially-enlarged view of the top plan view;
FIG. 11 is a perspective view of the measurement surveying device; and,
FIG. 12 is another perspective view of the measurement surveying device.
Claims
The ornamental design for a measurement surveying device, as shown and described.
943897 | October 1995 | JP |
943897-2 | April 1997 | JP |
943897-3 | May 1997 | JP |
943897-4 | May 1998 | JP |
943897-5 | June 1998 | JP |
943897-6 | February 1999 | JP |
943897-7 | February 1999 | JP |
943897-8 | February 1999 | JP |
1081383 | May 2000 | JP |
Type: Grant
Filed: Oct 19, 2000
Date of Patent: Aug 28, 2001
Assignee: Asahi Seimitsu Kabushiki Kaisha (Tokyo)
Inventors: Homu Takayama (Tokyo), Kenji Kaneko (Tokyo), Masayuki Ueno (Tokyo)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Sughrue, Mion, Zinn, Macpeak & Seas, PLLC
Application Number: 29/131,305