Housing for test and measurement instruments
The ornamental design disclosed in this application is for a housing for test and measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like. The housing has a substantially rectangular front face with a substantially rectangular opening disposed in a portion thereof, side surfaces having a curved top edges, and a top surface having curved surfaces adjacent to the curved top edges of the side surfaces that transition to a substantially flat surface extending from the front face to the rear surface having a recess formed therein for receiving a recessed handle.
FIG. 1 is a perspective view of a housing for test and measurement instruments;
FIG. 2 is a front elevation view of the housing for test and measurement instruments;
FIG. 3 is a left side elevation view of the housing for test and measurement instruments;
FIG. 4 is a right side elevation view of the housing for test and measurement instruments;
FIG. 5 is a top plan view of the housing for test and measurement instruments;
FIG. 6 is a bottom plan view of the housing for test and measurement instruments; and,
FIG. 7 is a rear elevation view of the housing for test and measurement instruments.
Claims
The ornamental design of a housing for test and measurement instruments, as shown and described.
Type: Grant
Filed: Apr 30, 2004
Date of Patent: Jan 11, 2005
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventors: Jerry L. Wrisley (Beaverton, OR), Takashi Sugiura (Kanagawa)
Primary Examiner: Antoine D. Davis
Attorney: William K. Bucher
Application Number: 29/204,635
