Frequency measuring device for a crystal resonator

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Description

FIG. 1 is a perspective view of a frequency measuring device for a crystal resonator of a new design;

FIG. 2 is a perspective view thereof wherein a cover is open;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a front elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a left side elevational view thereof;

FIG. 8 is a bottom plan view thereof;

FIG. 10 is a rear elevational view thereof where the cover is open;

FIG. 11 is a front elevational view thereof where the cover is open;

FIG. 12 is a right side view thereof where the cover is open;

FIG. 13 is a left side elevational view thereof where the cover is open;

FIG. 14 is a bottom plan view thereof when the cover is open.

Claims

The ornamental design for a frequency measuring device for a crystal resonator, as shown and described.

Referenced Cited
U.S. Patent Documents
3872411 March 1975 Watanabe et al.
3931388 January 6, 1976 Hafner et al.
4124809 November 7, 1978 Engdahl et al.
5436523 July 25, 1995 Staudte
6295861 October 2, 2001 Tom et al.
6525549 February 25, 2003 Poellmann
6798222 September 28, 2004 Tanaka et al.
6987347 January 17, 2006 Yoshio et al.
Patent History
Patent number: D526584
Type: Grant
Filed: May 23, 2005
Date of Patent: Aug 15, 2006
Assignee: Nihon Dempa Kogyo Co., Ltd. (Tokyo)
Inventors: Shunichi Wakamatsu (Hokkaido), Tsuyoshi Shiobara (Hokkaido), Tsukasa Kobata (Hokkaido), Naoki Onishi (Hokkaido)
Primary Examiner: Antoine D. Davis
Attorney: Edwards Angell Palmer & Dodge LLP
Application Number: 29/230,488