Anode shaft
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In the drawings, the broken lines immediately adjacent the solid lines represent the boundaries of the claim; all other broken lines depict environmental subject matter only. None of the broken lines form any part of the claimed design.
Claims
The ornamental design for an anode shaft, as shown.
| 1794942 | March 1931 | Boyle |
| D216286 | December 1969 | Valeska |
| 3627670 | December 1971 | Duclaux |
| 3739456 | June 1973 | Scherer et al. |
| 4035903 | July 19, 1977 | Taggart |
| 4118291 | October 3, 1978 | Juckniess et al. |
| 4544464 | October 1, 1985 | Bianchi et al. |
| D337495 | July 20, 1993 | Alexander |
| D382472 | August 19, 1997 | Davies et al. |
| 6077412 | June 20, 2000 | Ting et al. |
| 6274024 | August 14, 2001 | Kaufman et al. |
| 6299751 | October 9, 2001 | Kaufman et al. |
| 6365020 | April 2, 2002 | Yoshioka et al. |
| 6716332 | April 6, 2004 | Yoshioka et al. |
| 6977031 | December 20, 2005 | Jakovac et al. |
| 20030010643 | January 16, 2003 | Gramarossa et al. |
Type: Grant
Filed: Jul 13, 2006
Date of Patent: Jul 8, 2008
Assignee: Ebara Corporation (Tokyo)
Inventors: Fumio Kuriyama (Tokyo), Masaaki Kimura (Tokyo)
Primary Examiner: Robert M. Spear
Assistant Examiner: Ania K Dworzecka
Attorney: Wenderoth, Lind & Ponack, L.L.P.
Application Number: 29/262,882