Testing device for electronic component

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Description

FIG. 1 is a top, front, and right side perspective view of a testing device for electronic component showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left-side, elevational view thereof;

FIG. 5 is a right-side, elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a top, front, and right-side perspective view, showing the article with a display thereof in a released position and a drawer in a drawn-out position.

(Broken line portions are only included to show the intended use environment and do not constitute a part of the claimed design.)

Claims

The ornamental design for a testing device for electronic component, as shown and described.

Referenced Cited
U.S. Patent Documents
D271136 October 25, 1983 Bollinger et al.
D335822 May 25, 1993 Yamamuro et al.
D339586 September 21, 1993 Ito et al.
D362845 October 3, 1995 Ito et al.
D365291 December 19, 1995 Chitty
D383405 September 9, 1997 Horn et al.
20080049351 February 28, 2008 Yamanaka et al.
Patent History
Patent number: D573047
Type: Grant
Filed: Dec 28, 2006
Date of Patent: Jul 15, 2008
Assignee: Hon Hai Precision Industry Co, Ltd. (Tu-Cheng, Taipei Hsien)
Inventors: Chin-Feng Chen (Taipei Hsien), Chiou-Lin Fan (Taipei Hsien), Ying-Chih Huang (Taipei Hsien), Tay-Yang Lin (Taipei Hsien)
Primary Examiner: Antoine D Davis
Attorney: Wei Te Chung
Application Number: 29/275,492
Classifications
Current U.S. Class: Electrical Property (D10/75)