Testing device for electronic component
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Description
(Broken line portions are only included to show the intended use environment and do not constitute a part of the claimed design.)
Claims
The ornamental design for a testing device for electronic component, substantially as shown and described.
Referenced Cited
Patent History
Patent number: D573495
Type: Grant
Filed: Dec 28, 2006
Date of Patent: Jul 22, 2008
Assignee: Hon Hai Precision Industry Co., Ltd. (Tu-Cheng, Taipei Hsien)
Inventors: Chin-Feng Chen (Taipei Hsien), Chiou-Lin Fan (Taipei Hsien), Ying-Chih Huang (Taipei Hsien), Tay-Yang Lin (Taipei Hsien)
Primary Examiner: Antoine D Davis
Attorney: Wei Te Chung
Application Number: 29/275,494
Type: Grant
Filed: Dec 28, 2006
Date of Patent: Jul 22, 2008
Assignee: Hon Hai Precision Industry Co., Ltd. (Tu-Cheng, Taipei Hsien)
Inventors: Chin-Feng Chen (Taipei Hsien), Chiou-Lin Fan (Taipei Hsien), Ying-Chih Huang (Taipei Hsien), Tay-Yang Lin (Taipei Hsien)
Primary Examiner: Antoine D Davis
Attorney: Wei Te Chung
Application Number: 29/275,494
Classifications
Current U.S. Class:
Electrical Property (D10/75)