Housing for test and measurement instrument

- LeCroy Corporation
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Description

FIG. 1 is a perspective view of a first embodiment of the housing for test and measurement instrument showing our design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Claims

The ornamental design for the “housing for test and measurement instrument,” as shown and described.

Referenced Cited
U.S. Patent Documents
3687325 August 1972 Simons
4634970 January 6, 1987 Payne et al.
4972138 November 20, 1990 Bush
D335093 April 27, 1993 Holmen et al.
D413823 September 14, 1999 Dobyns et al.
D472171 March 25, 2003 Wrisley et al.
D504341 April 26, 2005 Graef et al.
D514004 January 31, 2006 Wrisley
D556066 November 27, 2007 Hoang et al.
Patent History
Patent number: D578911
Type: Grant
Filed: Feb 4, 2008
Date of Patent: Oct 21, 2008
Assignee: LeCroy Corporation (Chestnut Ridge, NY)
Inventors: Jeremy Ems (Tuxedo, NY), Sun Y. Kim (River Vale, NJ), Tyler Cox (Westtown, NY), James Annichiarico (Hasbrouck Heights, NJ)
Primary Examiner: Antoine D Davis
Attorney: Gordon Kessler
Application Number: 29/303,236