Measurement instrument

- LeCroy Corporation
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Description

FIG. 1 is a front elevational view of a first embodiment of the measurement instrument showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a rear elevational view thereof; and,

FIG. 6 is a bottom plan view thereof.

The broken line shown in FIG. 3 is for illustrative purposes only and forms no part of the claimed design.

Claims

The ornamental design for the “measurement instrument,” as shown.

Referenced Cited
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Patent History
Patent number: D504341
Type: Grant
Filed: Oct 9, 2003
Date of Patent: Apr 26, 2005
Assignee: LeCroy Corporation (Chestnut Ridge, NY)
Inventors: David Graef (Campbell Hall, NY), Phil Stearns (Colorado Springs, CO), Norio Shimomura (Tokyo), Satoshi Hayasaka (Tokyo)
Primary Examiner: Antoine D. Davis
Attorney: Frommer Lawrence & Haug LLP
Application Number: 29/191,576
Classifications
Current U.S. Class: Oscilloscope Or Oscillograph (D10/76)