Housing for test and measurement instrument
Latest LeCroy Corporation Patents:
- Compensating resistance probing tip optimized adapters for use with specific electrical test probes
- METHOD FOR PRINTED CIRCUIT BOARD TRACE CHARACTERIZATION
- Multiple Channel Distributed System and Method
- METHOD FOR DE-EMBEDDING IN NETWORK ANALYSIS
- METHOD AND APPARATUS FOR MULTIPLE TRIGGER PATH TRIGGERING
Description
Claims
The ornamental design for the “housing for test and measurement instrument,” including a second display as shown and described.
Referenced Cited
U.S. Patent Documents
3687325 | August 1972 | Simons |
4634970 | January 6, 1987 | Payne et al. |
4972138 | November 20, 1990 | Bush |
D335093 | April 27, 1993 | Holmen et al. |
D413823 | September 14, 1999 | Dobyns et al. |
D472171 | March 25, 2003 | Wrisley et al. |
D504341 | April 26, 2005 | Graef et al. |
D514004 | January 31, 2006 | Wrisley |
D556066 | November 27, 2007 | Hoang et al. |
Patent History
Patent number: D581821
Type: Grant
Filed: Feb 4, 2008
Date of Patent: Dec 2, 2008
Assignee: LeCroy Corporation (Chestnut Ridge, NY)
Inventors: Jeremy Ems (Tuxedo, NY), Sun Y. Kim (River Vale, NJ), Tyler Cox (Westtown, NY), James Annichiarico (Hasbrouck Heights, NJ)
Primary Examiner: Antoine D Davis
Attorney: Gordon Kessler
Application Number: 29/303,234
Type: Grant
Filed: Feb 4, 2008
Date of Patent: Dec 2, 2008
Assignee: LeCroy Corporation (Chestnut Ridge, NY)
Inventors: Jeremy Ems (Tuxedo, NY), Sun Y. Kim (River Vale, NJ), Tyler Cox (Westtown, NY), James Annichiarico (Hasbrouck Heights, NJ)
Primary Examiner: Antoine D Davis
Attorney: Gordon Kessler
Application Number: 29/303,234
Classifications