X-ray production apparatus for inspection tour

- Shimadzu Corporation
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Description

FIG. 1 is a perspective view of an X-ray production apparatus for inspection tour showing the new design;

FIG. 2 is a front view of FIG. 1;

FIG. 3 is a rear view of FIG. 1;

FIG. 4 is a left side view of FIG. 1;

FIG. 5 is a right side view of FIG. 1;

FIG. 6 is a top view of FIG. 1;

FIG. 7 is a bottom view of FIG. 1;

FIG. 8 is another perspective reference view of FIG. 1 showing the new design in use;

FIG. 9 is a perspective view of an X-ray production apparatus for inspection tour showing another embodiment of the new design;

FIG. 10 is a front view of FIG. 9;

FIG. 11 is a rear view of FIG. 9;

FIG. 12 is a left side view of FIG. 9;

FIG. 13 is a right side view of FIG. 9;

FIG. 14 is a top view of FIG. 9;

FIG. 15 is a bottom view of FIG. 9;

FIG. 16 is another perspective reference view of FIG. 9 showing the new design in use; and,

FIG. 17 is a partially enlarged view of FIG. 16.

The portions of the X-ray production apparatus for inspection tour in broken lines in FIGS. 6, 7, 14 and 15 form no part of the claimed design.

Claims

The ornamental design for an X-ray production apparatus for inspection tour, as shown and described.

Referenced Cited
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Patent History
Patent number: D617906
Type: Grant
Filed: Jun 18, 2008
Date of Patent: Jun 15, 2010
Assignee: Shimadzu Corporation (Kyoto)
Inventors: Tadahiko Nakahara (Kyoto), Hiroshi Miyata (Kyoto), Toshiaki Nakamura (Kyoto), Hiroshi Muraoka (Kyoto)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Anhdao Doan
Attorney: J.C. Patents
Application Number: 29/320,020
Classifications