X-ray production apparatus for inspection tour
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The portions of the X-ray production apparatus for inspection tour in broken lines in
Claims
The ornamental design for an X-ray production apparatus for inspection tour, as shown and described.
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Type: Grant
Filed: Jun 18, 2008
Date of Patent: Jun 15, 2010
Assignee: Shimadzu Corporation (Kyoto)
Inventors: Tadahiko Nakahara (Kyoto), Hiroshi Miyata (Kyoto), Toshiaki Nakamura (Kyoto), Hiroshi Muraoka (Kyoto)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Anhdao Doan
Attorney: J.C. Patents
Application Number: 29/320,020