Front bezel for a computer enclosure
Latest Hon Hai Precision Industry Co., Ltd. Patents:
- Method for measuring growth height of plant, electronic device, and storage medium
- Manufacturing method of semiconductor structure
- Microbolometer and method of manufacturing the same
- Image processing method and computing device
- Chip pin connection status display method, computer device and storage medium
Description
Broken lines shown in the drawings illustrate features of the front bezel that form no part of the claimed design.
Claims
The ornamental design for front bezel for a computer enclosure, as shown and described.
Referenced Cited
Patent History
Patent number: D618247
Type: Grant
Filed: Nov 2, 2009
Date of Patent: Jun 22, 2010
Assignee: Hon Hai Precision Industry Co., Ltd. (Tu-Cheng, Taipei Hsien)
Inventor: Yi-Han Dai (Shenzhen)
Primary Examiner: Freda S Nunn
Attorney: Frank R. Niranjan
Application Number: 29/346,488
Type: Grant
Filed: Nov 2, 2009
Date of Patent: Jun 22, 2010
Assignee: Hon Hai Precision Industry Co., Ltd. (Tu-Cheng, Taipei Hsien)
Inventor: Yi-Han Dai (Shenzhen)
Primary Examiner: Freda S Nunn
Attorney: Frank R. Niranjan
Application Number: 29/346,488
Classifications
Current U.S. Class:
Including Surface Texture (D14/444)