Marker for radiography specimens

- Beekley Corporation
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Description

FIG. 1 is a front view of a marker showing our new design;

FIG. 2 is a left side view of the marker of FIG. 1;

FIG. 3 is a top view of the marker of FIG. 1;

FIG. 4 is a right side view of the marker of FIG. 1;

FIG. 5 is a bottom view of the marker of FIG. 1; and,

FIG. 6 is a rear view of the marker of FIG. 1.

The broken lines in the drawing views are included for the purpose of illustrating portions of the marker for radiography specimens that form no part of the claimed design.

Claims

The ornamental design for a marker for radiography specimens, as shown and described.

Referenced Cited
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Patent History
Patent number: D631547
Type: Grant
Filed: Jan 10, 2005
Date of Patent: Jan 25, 2011
Assignee: Beekley Corporation (Bristol, CT)
Inventors: James Sayre (Farmington, CT), Stewart Bober (West Hartford, CT)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Anhdao Doan
Attorney: McCarter & English, LLP
Application Number: 29/221,025
Classifications